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Escalab 250xi k alpha

Manufactured by Thermo Fisher Scientific

The ESCALAB 250Xi K-alpha is an X-ray photoelectron spectroscopy (XPS) system manufactured by Thermo Fisher Scientific. It is designed to provide high-resolution surface analysis of a wide range of materials. The system utilizes a monochromated Al Kα X-ray source and a multi-channel detector to produce detailed chemical state information from the surface of a sample.

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4 protocols using escalab 250xi k alpha

1

Comprehensive Characterization of Magnetite Nanocomposites

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The morphology of the prepared samples was observed by scanning electron microscopy (SEM, Quanta FEG 250). The crystal structure of the composites was characterized by powder X-ray diffraction (XRD, X'Pert Pro MPD) using Cu-Kα radiation (λ = 0.15404 nm). The data was collected under a continuous scan mode between 10 and 90° with a step size of 0.02° and a scan rate of 2° min−1. The current and voltage were set at 30 mA and 40 kV, respectively. The Brunauer–Emmett–Teller (BET) specific surface areas of as-prepared samples were measured by N2 adsorption–desorption isotherm with a Quantachrome NOVA touch LX4 apparatus (Quantachrome Autosorb-IQ, USA). The chemical compositions and bonds were studied by X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi K-alpha, Thermo Fisher Scientific) with Al Kα X-ray at 15 kV and 150 W. Fourier transform infrared (FTIR) spectra were measured by using a VERTEX70 spectrometer. Thermogravimetric analysis (TGA; Mettler-Toledo) was performed using a simultaneous differential thermal analysis (DTA). A heating rate of 5 °C min−1 was used from room temperature to 900 °C under atmospheric air. Vibrating sample magnetometer (VSM) (Model: Lake shore 7400, United States) was employed to study the hysteresis loops and the magnetic properties of the magnetite nanocomposites.
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2

Characterization of Polymeric Phase Change Materials

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The morphologies of CSP, SMS-CSP and PEG/SMS-CSP were investigated by scanning electron microscopy (SEM, Quanta FEG-250, FEI, America). Spectroscopic analysis was performed by using Fourier transform infrared spectrometer (FT-IR, Bruker VECTOR22), and the crystalloid phase of the samples was tested by wide-angle X-ray diffraction (XRD, DX-2700, SHL-2, Thermo Scientific).Thermo gravimetric analysis was utilized to test the thermal stability of PEG and PEG/SMS-CSP in N2 atmosphere from 50 to 500 °C with heating rate of 10 °C/min. The specific surface area and pore volumes of the SMS-CSP and CSP was evaluated through Brunauer–Emmett–Teller (BET) method (Nova2000e, Quantum, America).The enthalpy and phase transition temperature of PEG, CSP and PEG/SMS-CSP samples were accurately measured by utilizing differential scanning calorimetry (DSC, Q200, NETZSCH, Germany), which were carried out in the temperature range of 0 °C to 100 °C by using high purity nitrogen as the protective gas, and the heating and cooling rate was 10 °C/min. X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi KAlpha, Thermo Fisher) was used to record the spectra of CSP and SMS-CSP. The transient plane source method (TPS, CTPS-2500, FRD, Tianjin, China) was used to measure the thermal conductivities of PEG and PEG/SMS-CSP.
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3

Characterization of Modified Sponge

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Contact angle measurements were carried out using a JY-82 Contact Angle Apparatus (Chengde Dingsheng Company, Ltd., Hebei) at ambient temperature. The characteristic functional groups of the modified sponge were determined by reflection-mode Fourier transform infrared spectroscopy (ATR-FTIR, Bruker, VERTEX70, Germany). Scanning electron microscopy (SEM, FEG-250, FEI, USA) was used to visualize the morphology of the sponges. The surface chemical compositions of the modified sponge were measured by X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi K-Alpha, Thermo Fisher). The compressive stress–strain tests were performed via (Shimadzu AG–X plus testing system).
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4

Multi-Technique Characterization of NbS2

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Scanning electron microscopy (SEM) images were taken on a field-emission scanning electron microscope (FESEM, FEI Nova 400 Nano-SEM). A high-resolution transmission electron microscope (HRTEM, ThermoFisher Scientific, Talos F200s) was performed to analyze the structures and elemental mapping. X-ray diffraction (XRD) patterns of the as-synthesized NbS2 were recorded on a diffractometer with Cu Kα radiation (Spectris Pte. Ltd, PANalytical X' Pert Powder). Chemical states of the containing elements were analyzed by X-ray photoelectron spectroscopy (XPS, Thermo Scientific ESCALAB 250Xi, K-alpha). Fourier transform infrared (FTIR) spectrometer (ThermoFisher Scientific, Nicolet iS50) was used to analyze the composition of the samples.
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