Jsm 7800f field emission scanning electron microscope

Mounted specimens were removed carefully from slides, hydrated in distilled water, dehydrated in a graded ethanol series, critical point dried, and coated with gold (Green, 1967 ), and observed under a JEOL JSM-7800F Field Emission Scanning Electron Microscope at 5 kV.

SEM images were obtained using a JEOL JSM-7800F field-emission scanning electron microscope at an acceleration voltage of 5 or 10 kV on a tilt stage. Before SEM imaging, the samples were coated with a layer of Pt using an Edwards Sputter Coater to enhance its conductivity. The optical images were collected via a COSSIM CMY-310 optical microscope. Raman spectrums were obtained via an inVia™ confocal Raman microscope system from Renishaw under a 532 nm laser.

Transmission electron microscopy (TEM) images were observed under a JEOL-2010 electron microscope (JEOL, Tokyo, Japan) operating at 200 kV. Scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) was performed on a JSM-7800F field-emission scanning electron microscope (JEOL, Tokyo, Japan) with an X-Max50 energy spectrometer (Oxford Instruments, Oxford, UK). Nanoparticle size and zeta potential were determined using a Malvern Zetasizer 3000HSA instrument (Malvern Instruments, Malvern, UK). Fourier transform infrared spectra (FT-IR) were obtained on a spectrum two infrared spectrometer (Perkinelmer, Walsham, MA, USA) using pressed KBr discs. UV absorption spectra were carried out using a LAMBDA 35 spectrophotometer (Perkinelmer, Walsham, MA, USA). The fluorescent spectra were recorded on a LS-55 fluorescence spectrometer (Perkinelmer, Walsham, MA, USA). Luminescence decay curves were obtained using an FLS-980 fluorescence spectrometer (Edinburgh Instruments, Scotland, UK). The excitation light source for obtaining the fluorescence photos was a ZF1-2 UV analyzer (Shanghai Precision Instrument, Shanghai, China) with UV light (254 nm and 365 nm) and simulated sunlight.