Jsm 6380la sem

For scanning electron microscopy (SEM), 5 seeds from 3 ears were collected from normal-size seeds (without any deformation and damage) and fixed in 2.5% glutaraldehyde in 0.1 M Sorenson buffer, pH 7.2. After having been washed with buffer, the samples dehydrated through ethanol series (30%, 50%, 70%, 96%, 2 × 100%). Then, CO₂ for critical-point-drying (Hitachi HCP-2 critical point dryer) was applied. Dry seed fragments were mounted on a SEM stub with carbon-conductive tabs and coated with gold and palladium using an Eiko IB-3 ion-coater (Eiko, Tokyo, Japan). Samples were observed and photographed under a JSM-6380LA SEM at 20 kV (JEOL, Tokyo, Japan).

The specimens for microstructural investigation were obtained by slicing post-mortem specimens with a slow speed diamond saw. The specimens 50 × 30 × 15 mm were dried at 50 °C for 3 days, and they were vacuum-impregnated with a low-viscosity epoxy. The thin sections were prepared by grinding and polishing the aggregates up to desired thickness. For polishing silicon carbide papers, up to 1200 mesh were used. Final thickness was obtained by polishing with diamond paste 6-3-1-0.25 μm on cloth, to obtain a mirror finish [31 (link)]. The specimens were prepared for examination using a scanning electron microscope (SEM) equipped with an energy-dispersive X-ray spectroscopy (EDX) analyzer. Specifically, each specimen was prepared so that the polished face to be examined was a cut surface from the middle of the bar. The specimens were then coated with carbon to make them conductive, and a strip of conductive tape was attached to each specimen. The SEM-EDX analysis was performed using a JEOL JSM-6380 LA SEM in the backscatter mode with an acceleration voltage of 15 kV. Genesis Spectrum 6.2 by EDAX Inc. (Tokyo, Japan) as EDS analyzer was used.

For scanning electron microscopy (SEM), three seeds from parent (soil generation), space generation, and Earths-lab generation samples were collected from normal size seeds (without any deformation and damage) and fixed in a 2.5% glutaraldehyde in 0.1 M Sorenson buffer, pH 7.2. After wash on buffer, samples dehydrated through ethanol series (30% 30’, 50% 30’, 70% 30’, 96% 30’, 2 × 100% 30’). Then CO₂ for critical-point-dried (Hitachi HCP-2 critical point dryer) was applied. Dry seeds were mounted on a SEM stub with carbon conductive tabs and coated with gold and palladium using an Eiko IB-3 ion-coater (Eiko, Tokyo, Japan). Samples observed under a JSM-6380LA SEM (JEOL, Tokyo, Japan) and a Camscan-S2 SEM (Cambridge Instruments, UK) in the Laboratory of Electron Microscopy (Biological Faculty of Lomonosov Moscow State University).