Tecnai g2 f20 s twin transmission electron microscopy instrument

UV–vis absorption spectra were recorded on a Shimadzu UV-1800 spectrophotometer (Kyoto, Japan). Fluorescence spectra were performed on a Hitachi F-7000 fluorescence spectrometer (Tokyo, Japan). High-resolution transmission electron microscopy (HR-TEM) data were obtained on a FEI Tecnai G2 F20 S-TWIN transmission electron microscopy instrument operating at 200 kV (Hillsboro, OR, USA). Time-resolved luminescence intensity decays were recorded on a Horiba JY Fluorolog-3 molecule fluorometer (Paris, France), and samples were excited by a 395-nm laser light source. Atomic force microscopy (AFM) data were obtained on a Bruker MultiMode8 (Leipzig, Germany).

UV-vis absorption spectra were recorded on a Shimadzu UV-1800 spectrophotometer (Kyoto, Japan). Fluorescence spectra were performed on a Hitachi F-7000 fluorescence spectrometer (Tokyo, Japan). X-ray photoelectron spectroscopy (XPS) measurements were carried out using an ESCALAB 250Xi spectrometer (Thermo Fisher Scientific, Waltham, MA, USA). High-resolution transmission electron microscopy (HR-TEM) and energy-dispersive X-ray spectroscopy (EDX) data were obtained on a FEI Tecnai G2 F20 S-TWIN transmission electron microscopy instrument operating at 200 kV (Hillsboro, OR, USA). Electrospray ionization mass spectrometry (ESI-MS) measurements were conducted on a QSTAR elite liquid chromatography-mass spectrometry (LCMS, SCIEX, Toronto, ON, Canada), equipped with a common ESI source. Time-resolved luminescence intensity decay was recorded on a Horiba JY Fluorolog-3 molecule fluorometer (Paris, France), and samples were excited by a 375 nm laser light source. Inductively coupled plasma-optical emission spectrometry (ICP-OES) data were obtained on VISTA-PRO CCD Simultaneous ICP-OES (Varian, Palo Alto, CA, USA). Dynamic light scattering (DLS) was determined using a Nano-ZS90 (Malvern Instruments, Malvern, UK).