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Spectrum spotlight 400

Manufactured by PerkinElmer
Sourced in United States

The Spectrum Spotlight 400 is a Fourier Transform Infrared (FTIR) imaging microscope. It is designed for the analysis of small samples and features a high-performance infrared detector and a motorized stage for sample positioning.

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4 protocols using spectrum spotlight 400

1

Microplastic Identification via FT-IR

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To determine whether suspected particles were plastic polymers, we identified all the marked particles using a PerkinElmer Spectrum Spotlight 400 micro-FT-IR Imaging System (PerkinElmer Inc., USA) with attenuated total reflection (ATR) attachment consisting of germanium (Ge) crystal. For each measurement, 16 co-scans at a spectral resolution of 8 cm−1 and a spatial resolution of 6.25 μm in the range of 4000 to 750 cm−1 were collected. The resulting spectra were matched with the Sadtler library, and sample spectra were identified successfully if the total overlap of sample and standard spectra was greater than 70% (53 (link)).
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2

MIR Imaging of Histological Samples

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Prior to data acquisition, a chemical deparaffinization step was performed using octane with a purity of ≥ 98.0% (Sigma Aldrich, Buchs, Switzerland) for 4 hours at a temperature of 40°C and dried afterwards as described by Pallua et al [36 (link)]. All MIR images were recorded in transmission mode using a commercially available infrared microscope Spectrum Spotlight 400 (Perkin-Elmer, Massachusetts, USA). Spectral data were recorded using the software “Spectrum IMAGE R1.8.0.0410” with a spectral resolution of 4 cm-1 and a pixel size of 25 μm. Before each measurement, a background spectrum was recorded outside the sample area to calculate a ratio[36 (link)]. Each final spectrum consisted of two co-added scans. The result of the MIR imaging measurement was a hyperspectral cube composed of both a local and a spectral information. The measurement time per sample strongly depends on the size of the sample and the used pixel size on the instrument. The average time for scanning one slide was 30 minutes. Each recorded pixel therefore had an associated MIR spectrum representing the local chemical information. By superimposing the previously gained information from the HE stained histologic slide with the recorded spectra, the development of a multivariate discrimination model could be achieved.
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3

Infrared Spectroscopic Mapping of Ground Stones

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Ground stones were imaged for spectroscopic mapping using a Perkin-Elmer Spectrum Spotlight 400 infrared imaging microscope equipped with a liquid nitrogen-cooled HgCdTe array detector. Low resolution spectroscopic mapping was done using the reflectance imaging mode. High resolution mapping was done using a germanium hemisphere placed in direct contact with the planar surface for attenuated total internal reflection spectroscopy [17 (link)]. The resulting infrared maps contained thousands of spectra and principal component analysis was employed to indicate spectral differences across the mapped surface.
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4

Fourier Transform-Infrared Microscopy for Surface Analysis

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The Fourier transform-Infrared Microscopy (FT-IRM) technique enables detailed observation of the surface through the reflection of the produced radiance, which is directly related to the observed chemical structure of the surfaces. Spectral FT-IR data were obtained using the Spectrum Spotlight 400 device (Perkin-Elmer, Wellesley, USA), equipped with a microscope fitted with both white light and infrared optics and a liquid nitrogen-cooled mercury-cadmium telluride (MCT) detector. Spectra were collected at a 2 cm -1 resolution, in the range of 4000-750 cm -1 from 64 scans by using a reflectance technique with a point mode. The aperture size was 50 × 50 μm, and the spectra were baseline corrected, normalized, and transformed to the absorbance spectra.
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