The morphology of fibers was assessed with Transmission Electron Microscopy (TEM) and Atomic Force Microscopy (AFM) imaging. Bright-field TEM images were collected on a FEI Tecnai G2 F20 S/TEM operated at an accelerating voltage of 200 kV after staining the samples with uranyl-acetate or gold nanoparticles. Tapping mode (TM) AFM was performed on an Asylum MFP-3D AFM (Asylum Research, Santa Barbara, CA, USA) using Veecoprobes Sb-doped Si cantilevers (ρ = 0.01–0.025 Ω-cm, k = 40 N/m, ν~ 300 kHz).
Sb doped si cantilevers
Manufactured by Oxford Instruments
Sourced in United States
Sb-doped Si cantilevers are a type of lab equipment designed for use in various scientific and research applications. They are composed of silicon (Si) material doped with antimony (Sb) to enhance their properties. The core function of these cantilevers is to serve as sensitive measurement devices, capable of detecting small forces, displacements, or other physical phenomena.
Automatically generated - may contain errors
Lab products found in correlation
2 protocols using sb doped si cantilevers
1
Fiber Morphology Analysis by TEM and AFM
2
Fiber Morphology Analysis by TEM and AFM
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!