Fei teneo
The FEI Teneo is a high-performance scanning electron microscope (SEM) designed for advanced materials analysis. It provides high-resolution imaging and analytical capabilities for a wide range of samples.
Lab products found in correlation
9 protocols using fei teneo
Surface Morphology of GSNO-PVC Material
Alginate Hydrogel Bead Surface Analysis
Characterization of 3D-Printed Devices
Characterization of Iodine-Loaded Nanoparticles
Fiber Morphology Analysis via SEM
Microscopic Characterization of Imprinted Polymers
microscope. ImageJ 1.44O (National Institute of Health, Bethesda,
MA) was employed to calculate the average surface coverage of cell
imprints on the polymeric layers. The number of cell imprints per
area unit was determined on the basis of the individual counts of
three different batch samples and three locations on each imprint.
In order to facilitate the visualization of the bacteria, safranin
was employed as staining solution.
Fluorescence microscopy was
performed on an Olympus BX53 microscope. With the aim of visually
confirming the rebinding of the targeted bacteria to the prepared
imprints, E. coli was stained with fluorescent dye
according to the standard protocol. Imprinted films were exposed to
a solution of 1 × 108 stained bacteria mL–1 for 20 min in order to allow recognition of the target. After this
time, the films were rinsed with PBS in order to remove nonbound bacteria
from the surface. The films were then observed under the microscope.
Scanning electron microscopy was carried out at DSM, Geleen, Netherlands
on a Thermo Fisher Scientific FEI Teneo at 2.0 eV, using an iridium
coating. The prepared imprinted polymers were observed in order to
confirm the presence of the cavities on the surface and to analyze
their morphology.
Surface Composition Analysis by SEM-EDS
Visualizing Nucleic Acids in Whole Cells
Scanning Electron Microscopy Protocol
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