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Leo 922 omega eftem

Manufactured by Zeiss
Sourced in Germany

The LEO 922 OMEGA EFTEM is an electron transmission microscope designed for high-resolution imaging and analysis of samples. It is capable of operating in both conventional transmission electron microscopy (TEM) and energy-filtered transmission electron microscopy (EFTEM) modes.

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3 protocols using leo 922 omega eftem

1

Nanoparticle Characterization by TEM and UV-Vis

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UV/vis/NIR spectra were recorded at a Jasco V-670 (US-MD) with
a temperature control unit. Nanoparticle solutions were dissolved
10 times with the respective surfactant to reduce extinction. TEM
images were obtained with a LEO CEM902 operating at an acceleration
voltage of 80 kV and with a LEO 922 OMEGA EFTEM with an acceleration
voltage of 200 kV from Zeiss (Germany). Zero-loss filtered images
were recorded using a bottom mounted Ultrascan 1000 (Gatan) CCD camera
system. Gatan Digital Micrograph 3.9 for GMS 1.4 software was used
for image acquisition. For TEM analysis 1 mL of nanoparticle solutions
were concentrated to 100 μL via centrifugation and washed twice
to adjust the surfactant concentration to 1 mM. 5 μL of the
as-prepared solution was dried on Quantifoil 300 mesh copper grid
with carbon films. Measurements performed for edge sharpening evaluation
(Figure 4) were prepared under a N2 environment. For size evaluation the software ImageJ (version 1.44p,
U.S. National Institutes of Health) was used.
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2

Cryo-TEM Analysis of Polymer Vesicles

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To examine the morphology and membrane thickness of polymer vesicles by transmission electron microscopy (TEM), a drop of the vesicle solution of interest was placed on copper grids with lacey carbon film (200 mesh, Plano, Wetzlar, Germany), blotted with filter paper, vitrified in liquid ethane (Zeiss Cryobox, Zeiss NTS GmbH, Germany) and stored in liquid nitrogen until inserted under nitrogen atmosphere within a cryo transfer holder (CT3500, Gatan, USA) to the TEM column. Specimens were observed at a temperature of approx. −180 °C using a LEO922 OMEGA EFTEM (Zeiss, Oberkochen, Germany) operated at 200 kV.
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3

Electron Microscopy Characterization of Nanoparticles

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Standard transmission electron microscopy measurements were performed with a Zeiss LEO 922 OMEGA EFTEM with an acceleration voltage of 200 kV. For TEM analysis of nanoparticles, 1 mL of nanoparticle solution was concentrated to 100 μL via centrifugation and washed twice to reduce the surfactant concentration below the critical micelle concentration. Subsequently, 4 μL of this solution was dried on 300 mesh copper grid with an approximately 3 nm carbon film.
HAADF-STEM images, electron tomography series, STEM-EDS elemental maps and STEM-EELS plasmon maps were acquired using an aberration-corrected cubed FEI Titan electron microscope operated at 120 kV and equipped with a monochromator, yielding an energy resolution of 0.12 eV. For the acquisition of the tomography series, a Fischione model 2020 single tilt tomography holder was used, and the series were acquired manually within a tilt range from -74°to +70°u sing a tilt increment of 2°. The reconstruction of the series was performed using the simultaneous iterative reconstruction technique (SIRT), implemented in the ASTRA toolbox. 48 For the acquisition of the STEM-EDS elemental maps, a ChemiSTEM system was used, 49 and quantification was performed using ESPIRT software. To analyze the EELS data sets, we used the EELSModel software. 50 The thickness of the C support was approximately 3 nm.
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