XRD was employed to detect the crystal structure of the coatings. The surface morphology of the CaP coatings was manifested using FE-SEM. The surface chemical constituent was determined using the FE-SEM equipped with EDS. The surface wettability was evaluated by DSA100S, and the surface roughness was analyzed by atomic force microscope (AFM, spa-300hv).
Su4800
The SU4800 is a scanning electron microscope (SEM) manufactured by Hitachi. It is designed for high-resolution imaging and analysis of a wide range of materials. The SU4800 features a field emission electron gun, advanced electron optics, and a high-performance detection system.
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Comprehensive Materials Characterization of CaP Coatings
XRD was employed to detect the crystal structure of the coatings. The surface morphology of the CaP coatings was manifested using FE-SEM. The surface chemical constituent was determined using the FE-SEM equipped with EDS. The surface wettability was evaluated by DSA100S, and the surface roughness was analyzed by atomic force microscope (AFM, spa-300hv).
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