Jem 2100f electron microscope
The JEM-2100F is a high-resolution transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-quality imaging and analytical capabilities for materials science, nanotechnology, and life science research. The microscope operates at an accelerating voltage of 200 kV and is equipped with advanced features such as a field emission gun electron source, a high-resolution objective lens, and a variety of detectors for different modes of operation.
Lab products found in correlation
57 protocols using jem 2100f electron microscope
Cryo-EM Single-Particle Analysis
Characterization of TiO2 Nanomaterials
Characterization of Fe5Ce5Ti Catalysts
The Debye–Scherrer formula was used to calculate the crystal size of TiO2 grains of Fe5Ce5Ti catalysts prepared at different calcination temperatures. The formula is as follows:
Comprehensive Analytical Techniques for Material Characterization
Visualizing PGMA and L-PGMA Nanoparticles
Characterization of Nanoparticle Structures
Characterization of PDEA Sponge Morphology
Cryo-EM Sample Vitrification Protocol
Comprehensive Characterization of N-S@MCDs
Characterization of Gd-Au Nanocomposites
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