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Jem 2100f electron microscope

Manufactured by JEOL
Sourced in Japan, United States

The JEM-2100F is a high-resolution transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-quality imaging and analytical capabilities for materials science, nanotechnology, and life science research. The microscope operates at an accelerating voltage of 200 kV and is equipped with advanced features such as a field emission gun electron source, a high-resolution objective lens, and a variety of detectors for different modes of operation.

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57 protocols using jem 2100f electron microscope

1

Cryo-EM Single-Particle Analysis

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Samples (5 µl of each) from fractions 1–6 after GraFix were applied to glow-discharged continuous carbon-coated 400 mesh copper grids. The grids were subsequently blotted with filter paper, washed with two drops of milli-Q water and negatively stained with 2% (w/v) uranyl acetate. Fraction 5 obtained well-defined particles at relatively high concentration (~100 particles/image) and was selected for single-particle analysis. The sample was imaged using a JEM2100F electron microscope (JEOL, Japan) operated at 200 kV. Images were recorded on a DE-20 direct electron detector (Direct Electron, USA) at a magnification of ×30,000 and 0.9–1.7 µm defocus. The selected magnification resulted in a pixel size of 2.08 Å at the specimen level. Images were recorded using a frame rate of 20 frames/s and 2 s exposure time. The accumulated dose for the whole exposure was approximately 20 e2. A total of 40 images were recorded.
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2

Characterization of TiO2 Nanomaterials

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Transmission electron microscopy (TEM) analysis was conducted using a JEM-2100F electron microscope (JEOL, Japan) with an accelerating of 200 kV voltage. X-ray diffraction (XRD) (type HZG41B-PC) was used to characterize the crystalline phase and crystallite size of the TiO2 samples. Brunauer–Emmett–Teller (BET) specific surface area (SBET) of the powders was analyzed via nitrogen adsorption in a Micromeritics ASAP 2020 nitrogen adsorption apparatus (USA). All the as-prepared samples were degassed at 180 °C prior to nitrogen adsorption measurements. The BET surface area was determined by a multipoint BET method using adsorption data in the relative pressure (P/P0) range of 0.05 to 0.3. A desorption isotherm was used to determine the pore size distribution via the Barrett–Joyner–Halenda (BJH) method, assuming a cylindrical pore modal.
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3

Characterization of Fe5Ce5Ti Catalysts

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The Brunauer–Emmett–Teller (BET) method was used to characterize the surface area, pore volume and radius. High-resolution transmission electron microscope (HR-TEM) images were obtained on a JEOL JEM-2100F electron microscope (200 kV accelerating voltage) for morphological characterization of samples. Characterization of the elemental composition of the sample using the X-ray diffraction (XRD) was carried out on a Bruker D8-Advance XRD system using Cu Kα radiation (λ = 0.1543 nm) at 2θ values ranging from 10° to 90°, with a step size of 0.02°. The surface chemical state of the samples was determined using X-ray photoelectron spectroscopy (XPS), Thermo ESCALAB 250 Xi, with an Al Kα source (1486.6 eV photons).
The Debye–Scherrer formula was used to calculate the crystal size of TiO2 grains of Fe5Ce5Ti catalysts prepared at different calcination temperatures. The formula is as follows:Dhkl is the calculated grain size; k is a constant, depending on the shape of the crystal, where k = 0.9; λ is the wavelength of Cu Kα X-ray radiation, λ = 1.5418; β is the half peak width of the diffraction peak of the TiO2 crystal; θ is the diffraction angle corresponding to the diffraction peak.
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4

Comprehensive Analytical Techniques for Material Characterization

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Transmission electron microscopy (TEM) images were captured by JEM-2100F electron microscope (JEOL, Japan). UV-vis absorption spectra, fluorescence spectra and X-ray photoelectron spectroscopy (XPS) was collected by a DU730 UV/vis spectrophotometer (Beckman, Germany), an FS5 fluorescence spectrophotometer (Edinburgh, UK) and an ESCALAB 250Xi (Thermo Scientific, USA), respectively. The size distribution and zeta potential were measured using NanoZS90 Zetasizer (Malvern, UK). GC-MS measurements were performed using a QuickProbe GC-MS instrument (Agilent, USA) to determine chlorpyrifos in the cabbage and apple samples for validation. Ultra-pure water was prepared using a Milli-Q Ultra-Pure System (Millipore, USA).
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5

Visualizing PGMA and L-PGMA Nanoparticles

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Morphology of PGMA and L-PGMA NPs was visualized by TEM using a JEM-2100F electron microscope (JEOL, Ltd., Japan) operated at an accelerating voltage of 200 kV. The samples (10 μL) for TEM were dropped on a carbon-coated copper grid (400-mesh) and air-dried for 5 min. The grid with nanoparticles was negatively stained with 2% (w/v) of phosphotungstic acid (pH 7.4) and air-dried.
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6

Characterization of Nanoparticle Structures

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Transmission electron microscopy (TEM) and high resolution TEM (HRTEM) were performed on the JEOL JEM-2100F electron microscope operating at 200 kV. For the TEM measurements, a drop of the nanoparticle solution was dispensed onto a 3-mm carbon-coated copper grid. Excessive solution was removed by an absorbent paper, and the sample was dried under vacuum at room temperature. An energy dispersive X-ray spectroscopy (EDX) analyzer attached to the TEM was used to analyze the chemical compositions of the synthesized nanoparticles. UV-visible spectra of the core-shell and CBS particle solutions were collected on a Hitachi U-3900 spectrophotometer. X-ray photoelectron spectroscopy (XPS) was conducted on a VG ESCALAB MKII spectrometer. Sample preparation for XPS analysis began with concentrating 5 mL of the toluene solution of the metal nanoparticles to 0.5 mL using flowing N2. 10 mL of methanol was then added to precipitate the metal nanoparticles. The nanoparticles were then recovered by centrifugation and washed with methanol several times to remove non-specifically bound oleylamine. The nanoparticles were then dried at room temperature in vacuum.
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7

Characterization of PDEA Sponge Morphology

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The surface morphology of the synthesized PDEA sponges was studied through scanning electron microscopy (Zeiss EVO 50). Transmission electron microscopy (TEM) micrographs were taken on a JEOL, JEM-2100F electron microscope at an acceleration voltage of 200 kV. Fourier-transform infrared (FTIR) was performed on attenuated total reflection-FTIR (ATR-FTIR) model, Nicolet-5DX F fitted with a temperature control. The samples were characterized in the wavenumber range of 4000–500 cm−1 at a fixed resolution of 4 cm−1. X-ray photoelectron spectroscopy (XPS) absorption measurements were done at BL-14 beamline of Indus 2 synchrotron radiation source, Indore. The rheology was studied by utilizing small-amplitude oscillatory shear experiments using a fixed stress of 1.0 Pa, on an AR 500 Rheometer (TA Instruments, Surrey, England). Atomic force microscope (AFM) image was obtained through a Nanoscope IIIa at IUAC, New Delhi with tapping mode.[3 5 (link)]
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8

Cryo-EM Sample Vitrification Protocol

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Sample vitrification was performed with a Leica EMGP plunger (Leica Microsystems). Briefly, 3 ul of purified sandwich sample was applied to a glow-discharged Quantifoil grid (R1.2/1.3, Electron Microscopy Sciences). The grid was quickly plunged into liquid propane after 3.5 s blotting time at 95% humidity. Specimen was then transferred onto a Gatan cryo-transfer holder (Gatan) and examined under a JEM2100F electron microscope (JEOL USA) with operation voltage at 200 kV. The images were recorded at electron dose <20 e/A2 and collected on a Gatan OneView CCD detector at pixel size of 2.8 Å at specimen space.
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9

Comprehensive Characterization of N-S@MCDs

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The high-resolution X-ray diffraction (XRD) pattern was produced using a Cu Kα radiation source and a PANalytical Empyrean X-ray diffractometer at an accelerating potential of 40 kV, in the 2θ range of 10–60°. Finely powdered solid samples had been acquired for X-rays analysis. Transmission electron microscopy (TEM) and high-resolution transmission electron microscopy were used to assess the surface morphology and particle size of N-S@MCDs (HRTEM). TEM images were obtained on a JEOL JEM-2100F electron microscope with a 200 kV acceleration voltage. The material was drop-cast onto a copper grid that had been coated with carbon, and then the samples were allowed to dry at room temperature. Scanning electron microscope (SEM) with EDAX (Energy-dispersive X-ray) spectroscopy was done from the University of Delhi using JEOL JSM 6610LV using Tungsten electron sources at 10KV with magnification X5 to X 3,00,000 with high vacuum mode using LN2 free EDS detector. 1H and 13C NMR (400 MHz for proton and 100 MHz for carbon) spectra were recorded with a JEOL spectrometer using trimethylsilane as an internal standard.
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10

Characterization of Gd-Au Nanocomposites

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Transmission electron microscopy (TEM) images of Gd-Au NCs were obtained using a JEM-2100F electron microscope (JEOL Ltd., Tokyo, Japan) working at 200 kV. The nanoparticles were dispersed in deionized water (DIW) and dried onto carbon-coated copper grids. Then the air-dried samples were directly observed by electron microscope. The hydrodynamic diameter analyses of the aqueous were performed on a laser light scattering system (JEM Zetasizer Nano-ZS90, Great Malvern, England, UK). UV-vis absorption and fluorescent emission spectra were measured by Cary 50 spectrophotometer (Varian, Palo Alto, CA, USA) and F-182 4500 spectrophotometer (Hitachi, Chiyoda, Tokyo, Japan), respectively. The concentration of Gd/Au was measured with ICP-AES (P-4010, Hitachi, Chiyoda, Tokyo, Japan).
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