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Spm multimode with nanoscope 5 controller

Manufactured by Bruker

The SPM Multimode with Nanoscope V controller is a scanning probe microscope (SPM) system manufactured by Bruker. It is designed to provide high-resolution imaging and analysis of surfaces and nanoscale features. The system consists of the Multimode scanning probe microscope and the Nanoscope V controller, which manages the operation and data acquisition of the instrument.

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2 protocols using spm multimode with nanoscope 5 controller

1

DNA Imaging via Atomic Force Microscopy

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AFM images were obtained using a SPM Multimode with Nanoscope V controller (Bruker). Normally 50 μl of 0.5× TE buffer with 15–20 mM MgCl2 were applied to a freshly cleaved mica surface, and then a 5 μl droplet of a sample (2–10 nM) was added and incubated for ∼2 min. Supplementary 10–20 μl of 10 mM NiCl2 was added to increase the strength of DNA-mica binding (30 (link)). Additional dilution of the sample was possibly performed to achieve the desired sample density. Samples were imaged under liquid ScanAsyst mode with C-type triangular tips (resonant frequency, = 40–75 kHz; spring constant, k = 0.24 N m−1) from the SNL-10 silicon nitride cantilever chip (Bruker).
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2

Atomic Force Microscopy of DNA Samples

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AFM images were obtained using a SPM Multimode with Nanoscope V controller (Bruker). Forty microliters of 0.5 × TE buffer with 10 mM MgCl2 were applied to a freshly cleaved mica surface, and then a 5 μL droplet of purified sample (2–10 nM) was added and incubated for approximately 2 mins. Supplementary 10 μL of 10 mM NiCl2 was added to increase the strength of DNA–mica binding47 (link). Additional dilution of the sample was possibly performed to achieve the desired sample density. Samples were imaged under liquid ScanAsyst mode, with C-type triangular tips (resonant frequency, f0 = 40–75 kHz; spring constant, k = 0.24 N m−1) from the SNL-10 silicon nitride cantilever chip (Bruker). Additional details of measurements based on AFM results can be found in Supplementary Information.
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