The phase of the prepared samples was determined by micro-Raman spectroscopy using a confocal Raman microscope (alpha300 R; WITec) with a 488 nm laser pulse as the excitation source. The surface morphology of pristine and In-doped hematite samples was examined using a field emission scanning electron microscope (FE-SEM, Zeiss Supra 60 VP), operated at an acceleration voltage of 10 kV. The optical absorption of all samples was measured using a Cary 5000 spectrophotometer (Varian). XPS spectra were acquired in a PerkinElmer Phi 5500 setup (base pressure < 10−10 mbar) using AlKα radiation at 1.4866 keV. The XPS spectra were shifted using the Fe(2p3/2) peak, setting it to 710.9 eV. High-resolution transmission electron microscopy (HR-TEM, FEI Titan 80–300) with an energy-dispersive X-ray spectroscopy (EDX) analyzer was employed to observe the crystalline structure and lattice fringes, combined with selected area electron diffraction (SAED) in order to analyze the chemical composition and the element distribution of the samples. Cross sectional specimens of selected thin film samples were prepared by focused ion beam milling (FEI HELIOS 600), from which high angle annular dark-field (HAADF) and EDX mapping images were collected simultaneously, by using a JEOL ARM-200F TEM.
Phi 5500
Manufactured by PerkinElmer
The Phi 5500 is a X-ray photoelectron spectroscopy (XPS) system manufactured by PerkinElmer. It is used for surface analysis and chemical characterization of materials. The Phi 5500 provides high-resolution data on the elemental composition, chemical state, and electronic state of the surface of a sample.
Automatically generated - may contain errors
Lab products found in correlation
Cary 5000 spectrophotometer, by Agilent Technologies (2 mentions)
Helios 600, by Thermo Fisher Scientific (1 mentions)
Arm200f tem, by JEOL (1 mentions)
Supra 60 vp, by Zeiss (1 mentions)
Alpha 300r, by WITec (1 mentions)
Titan 80 300, by Thermo Fisher Scientific (1 mentions)
Phi multipak software, by Physical Electronics (1 mentions)
Supra 60 vp microscope, by Zeiss (1 mentions)
Raman microscope alpha300r, by WITec (1 mentions)
3 protocols using phi 5500
1
Comprehensive Characterization of In-doped Hematite
2
XPS Characterization of Anhydrous RuO2 Aerosols
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The collected solid samples were analyzed using X-ray photoelectron spectroscopy (XPS) to obtain chemical characterization of the aerosols. For the XPS measurements a Perkin Elmer Phi 5500 multi technique system was used. The detailed setup of the machine during measurements was described in a previous work [20 (link)]. Commonly, the C 1s peak originating from the unavoidable atmospheric contamination is used as an internal standard for the binding energies (BEs) during XPS measurements. In the case of ruthenium the Ru 3d5/2 peak and the C 1s peak are overlapping, making this reference unreliable. To avoid this problem the gold foil conductively connected to the measured samples was used as an internal standard during the measurements. The experimental uncertainty of BE of the Ru 3d5/2 peak was determined to be ±0.1 eV. The curve fitting of the obtained spectra was made using PHI Multipak software (Ulvac-Phi, Inc.), assuming Shirley background. The asymmetrical shape of peaks was used due to the conductive nature of anhydrous RuO2 [21 (link)]. XPS analysis was performed using at least two different spots on the samples.
3
Characterization of TiO2-Coated α-Fe2O3 Samples
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The chemical phase of the prepared samples was determined by using a confocal Raman microscope (alpha300 R; WITec) with a 488 nm laser pulse as an excitation source. The surface morphology of the bare and TiO2 coated α-Fe2O3 samples was examined by field emission scanning electron microscope (FE-SEM) using a Zeiss Supra 60 VP microscope operated at an acceleration voltage of 10 kV. The optical absorption of all the samples was measured with the help of a Cary 5000 spectrophotometer (Varian). X-ray photoelectron spectroscopy (XPS) spectra were acquired in a PerkinElmer Phi 5500 setup (base pressure < 10−10 mbar) using AlKα radiation of 1.4866 keV. The XPS spectra were shifted using the Fe(2p3/2) peak corresponding to 710.9 eV as a reference.
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