The largest database of trusted experimental protocols

Rtespa 300 silicon probe

Manufactured by Bruker
Sourced in United States

The RTESPA-300 is a silicon probe designed for atomic force microscopy (AFM) measurements. It features a rectangular cantilever with a nominal length of 300 μm and a spring constant of 26 N/m. The probe is intended for tapping-mode AFM imaging and force spectroscopy applications.

Automatically generated - may contain errors

Lab products found in correlation

2 protocols using rtespa 300 silicon probe

1

Characterization of α-1,3-Glucan Nanoparticles

Check if the same lab product or an alternative is used in the 5 most similar protocols
The suspension of α-1,3-glucan in 30% DMSO or 30% DMSO alone was placed onto a mica disk and dried in a desiccator overnight. Then, the samples were imaged in NanoScope V AFM (Veeco, Plainview, NY, USA) using the PeakForce QNM operation mode and a RTESPA-300 silicon probe with spring constant 20–80 N/m (Bruker Nano Inc., Billerica, USA). Three fields 1 µm × 1 µm were imaged for each sample. The images were analyzed with NanoScope Analysis software ver. 1.40 (Veeco, Plainview, NY, USA). It was found that α-1,3-glucan intended for administration to the larvae by injection was in the form of spherical nanoparticles with a diameter of about 7 nm (±0.5) (Supplementary Materials, Figure S2).
+ Open protocol
+ Expand
2

Nanomechanical Properties of C. albicans under AP2 Treatment

Check if the same lab product or an alternative is used in the 5 most similar protocols
The log-phase C. albicans cells in ten-fold diluted YPD medium (12 µl; OD600 = 0.2) were incubated in the presence of 5 µM AP2 at 37 °C for 1 and 3 h. To the control samples 2 µl of sterile water was added. After washing with pyrogen-free water, the cells were centrifuged (7000× g, 10 min, 4 °C) and finally suspended in 5 µL of pyrogen-free water. The suspensions were applied on mica disks and dried at 28 °C, and the cells were subjected to imaging using a Nanoscope V AFM (Veeco, Plainview, NY, USA; Analytical Laboratory, Faculty of Chemistry, UMCS, Lublin, Poland). The measurements were performed in the PeakForce QNM operation mode using a RTESPA-300 silicon probe with spring constant 20–80N/m (Bruker Nano Inc. Billerica, MA, USA). Three fields (1 µm × 1 µm and 300 nm × 300 nm) were imaged for each sample. The average root-mean square (RMS) roughness values, Young modulus, and adhesion forces were calculated from twenty 200 nm × 200 nm fields measured on each 1 µm × 1 µm image. The nanomechanical properties were analyzed with NanoScope Analysis software ver. 1.40 (Veeco). Three-dimensional (3D) images were obtained using WSxM software (Nanotec, Tres Cantos, Spain).
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!