Rtespa 300 silicon probe
The RTESPA-300 is a silicon probe designed for atomic force microscopy (AFM) measurements. It features a rectangular cantilever with a nominal length of 300 μm and a spring constant of 26 N/m. The probe is intended for tapping-mode AFM imaging and force spectroscopy applications.
Lab products found in correlation
2 protocols using rtespa 300 silicon probe
Characterization of α-1,3-Glucan Nanoparticles
Nanomechanical Properties of C. albicans under AP2 Treatment
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