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Vertex 70v ftir spectrometer

Manufactured by Bruker
Sourced in Germany, United States

The Vertex 70v FTIR spectrometer is a high-performance Fourier Transform Infrared (FTIR) spectrometer designed for a wide range of applications. The core function of the Vertex 70v is to measure and analyze the infrared absorption or emission spectra of various samples, providing detailed information about their molecular composition and structure.

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59 protocols using vertex 70v ftir spectrometer

1

Multimodal Lipid Profiling Protocol

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Scanning electron microscope (SEM) images were performed using a Nova NanoSEM™ scanning electron microscope (FEI Technologies Inc., Oregon, USA). Infrared spectroscopy (IR) spectra were collected using a VERTEX 70v FT-IR Spectrometer (Bruker Daltonics, Bremen, Germany). Mass spectrometry data were collected on a QTRAP 4500 mass spectrometer (SCIEX, Toronto, Canada) which possesses functions of neutral loss scan (NLS) and precursor ion scan (PIS), for direct profiling of different classes of lipids, and a TIMS-TOF mass spectrometer (Bruker Daltonics, Bremen, Germany) for the analysis of accurate mass of lipids extracted from the tissue samples based MS1 scan. LC-MS analyses were conducted on a Shimadzu LC-20AD system (Kyoto, Japan).
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2

Feedstock Characterization via SEM and FTIR

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Feedstock micromorphology was analyzed using scanning electron microscopy (field emission gun SEM, Zeiss Leo 1525, Carl Zeiss Microscopy, Jena, Germany) using backscattered electrons (15 kV source voltages). The compression molded specimens were mechanically ground and polished with the final step using a suspension of 0.1 µm alumina particles.
The Fourier transform infrared (FTIR) is one of the essential measurements to understand the internal interactions between materials. The FTIR tests used a VERTEX 70v FT-IR spectrometer (Bruker Optics GmbH & Co. KG, Ettlingen, Germany) to analyze the interaction between polymers in the binders and the Al fillers.
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3

IR Spectroelectrochemical Analysis Protocol

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IR spectroelectrochemical experiments were performed using an air−tight OTTLE cell (Spectroelectrochemistry Reading, UK) [68 (link)] positioned in the sample compartment of a Bruker Vertex 70v FT−IR spectrometer equipped with a DLaTGS detector. The cell was equipped with Pt minigrid (32 wires per cm) working and auxiliary electrodes, an Ag−microwire pseudo−reference electrode and optically transparent CaF2 windows. The course of each of the spectroelectrochemical experiments was monitored by thin−layer cyclic voltammetry; the potential control was realized with an EmStat3+ potentiostat (PalmSens, The Netherlands) operated with the PSTrace5 software. The concentration of the spectroelectrochemical samples was ca. 2 × 10−3 mol dm−3. Dry 10−1 M TBAPF6 was used as the supporting electrolyte.
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4

Graphene Transistor Transmittance Measurement

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The transmittance measurements were performed by using Bruker Vertex 70 V FTIR spectrometer integrated with silicon photodetector working in visible and near-IR. We worked in the wavelength range between 400 nm to 1100 nm. We biased the graphene based transistors using Keithley 2400 source measure unit during the transmittance measurements. The leakage current is also recorded during the measurement.
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5

FT-IR Spectroscopy Analysis of Bacterial Samples

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A Bruker Vertex 70 V FT-IR spectrometer (Bruker Optics, Germany), equipped with a Hyperion microscope attachment was used. The bacterial coated CaF2 slides were placed under the microscope objective and IR spectra were recorded in transmission mode from 4000 to 850 cm-1 at a spectral resolution of 4 cm-1. Fifteen spectra for each sample were obtained at room temperature. A total of 45 spectra (3 × 15) for each treatment were obtained. Experiments were performed in triplicate. OPUS software version 6 was used to perform data analysis. Spectra were smoothed with a Savitsky-Goly function algorithim with 25 smoothing points, base-line corrected and normalized. Principle component analysis (PCA) was used on raw data to separate and group control and GCE-treated bacterial spectra to illustrate differences between the two data sets.
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6

Transmittance of Biased Graphene ECD

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The transmittance measurements were performed by using Bruker Vertex 70 V FTIR spectrometer integrated with Si photodiode. We worked in the wavelength range between 450–1100 nm. We biased the graphene ECD using Keithley 2400 source measure unit during the transmittance measurements. The charging current is also recorded during the measurement.
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7

Polysaccharide Characterization via FTIR and HPAEC-PAD

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Polysaccharide powders were cast into KBr pellets and analyzed by a VERTEX 70v FTIR spectrometer (Bruker, Germany) [3 (link)]. For the monosaccharide composition analysis, polysaccharides were hydrolyzed with 4 M of trifluoroacetic acid and separated on a CarboPac PA1 column integrated to a Dionex ED50 Detector (HPAEC-PAD) (Dionex, Sunnyvale, CA, USA). A standardized monosaccharide mixture was used as the reference standard [3 (link)].
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8

Polymer Characterization by Advanced Spectroscopy

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Chemical structures and purity of the polymer and monomer were determined by 1H NMR spectroscopy using CDCl3, deuterium or DMSO-d6 as solvents in the Bruker AscendTM 400 MHz Spectrometer. The polymer coating was confirmed by Bruker’s VERTEX 70v FT-IR Spectrometer in range of 4000–500 cm−1 with resolution of 2 cm−1. SEM analysis was done to study the homogeneity of the coating.
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9

FTIR Analysis of Leaf Samples

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Fourier transform infrared spectroscopy was performed on oven-dried (70 °C) leaf samples with a Bruker Vertex 70v FTIR spectrometer (Bruker Optik GmbH, Ettlingen, Germany, DEU) equipped with A225/Q Platinum attenuated total reflectance (ATR) with a single reflection diamond crystal (Bruker Optik GmbH, Rosenheim, Germany, DEU). The spectra were obtained from 4000 to 400 cm−1 wavenumbers with a spectral resolution of 4 cm−1. Two replications were performed for each spectrum, which were collected from an average of 300 scans sample−1 at room temperature (25 °C). All spectra were equally corrected by baseline using OPUS software (Bruker Optik GmbH, Rosenheim, DEU), and the intensity was normalized at 3270 cm−1 (OH stretching band).
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10

Spectroscopic and Thermal Analysis of K1 and K2 Complexes

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UV–VIS absorption spectra were recorded in chloroform, acetone, DMSO, acetonitrile, and methanol (3.323 × 10−6 M) solutions on a Hitachi spectrophotometer. The fluorescence spectra were recorded on a spectrofluorometer Gildenpλotonics 700 (Dublin, Ireland) in the range 900–200 nm (grating 1, bandpass 5 and 8, integration time 100 ms, chloroform, acetone, DMSO, acetonitrile, and methanol solution of compounds the same as in the case of the UV–VIS studies or silicon slides). The elemental analysis was carried out using a Vario EL III Elemental analyzer. The thermal analysis (TG, DTG, DTA) was performed on an SDT 2960 TA analyzer under air, a heating rate of 10 °C min−1, and a heating range of up to 1000 °C and a Jupiter STA 449 F5 thermoanalyzer from Netzsch (Selb, Germany) with an automatic sample feeder coupled to a Vertex 70V FT-IR spectrometer from Bruker Optik (Ettlingen, Germany). After combustion, the residue of the sample was analyzed by an XRD analysis performed with a Philips X’Pert equipped with an X’Celerator Scientific detector. The IR spectra were recorded on the Bruker instrument using the ATR technique in the range of 70–4000 cm−1. Circular dichroism spectra were recorded with a Jasco J-815 spectropolarimeter (Jasco Inc.) in the range of 310–700 nm wavelengths. The solution of K1 and K2 complexes (≈1 × 10−4 M) was prepared by dissolving it in a CHCl3 solution.
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