AFM images were obtained using a SPM Multimode with Nanoscope V controller (Bruker). Normally 50 μl of 0.5× TE buffer with 15–20 mM MgCl2 were applied to a freshly cleaved mica surface, and then a 5 μl droplet of a sample (2–10 nM) was added and incubated for ∼2 min. Supplementary 10–20 μl of 10 mM NiCl2 was added to increase the strength of DNA-mica binding (30 (link)). Additional dilution of the sample was possibly performed to achieve the desired sample density. Samples were imaged under liquid ScanAsyst mode with C-type triangular tips (resonant frequency, = 40–75 kHz; spring constant, k = 0.24 N m−1) from the SNL-10 silicon nitride cantilever chip (Bruker).
Snl 10 silicon nitride cantilever chip
Manufactured by Bruker
The SNL-10 silicon nitride cantilever chip is a high-performance lab equipment product designed for use in atomic force microscopy (AFM) applications. It features a silicon nitride cantilever with a sharp tip, providing high-resolution imaging capabilities. The core function of this product is to serve as a sensitive probe for surface topography measurements at the nanoscale level.
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5 protocols using snl 10 silicon nitride cantilever chip
1
DNA Imaging via Atomic Force Microscopy
2
Atomic Force Microscopy of DNA Samples
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AFM images were obtained using a SPM Multimode with Nanoscope V controller (Bruker). Forty microliters of 0.5 × TE buffer with 10 mM MgCl2 were applied to a freshly cleaved mica surface, and then a 5 μL droplet of purified sample (2–10 nM) was added and incubated for approximately 2 mins. Supplementary 10 μL of 10 mM NiCl2 was added to increase the strength of DNA–mica binding47 (link). Additional dilution of the sample was possibly performed to achieve the desired sample density. Samples were imaged under liquid ScanAsyst mode, with C-type triangular tips (resonant frequency, f0 = 40–75 kHz; spring constant, k = 0.24 N m−1) from the SNL-10 silicon nitride cantilever chip (Bruker). Additional details of measurements based on AFM results can be found in Supplementary Information .
3
AFM Imaging of Nanostructure Assemblies
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AFM images were obtained using an SPM Multimode with Digital Instruments Nanoscope V controller (Vecco) and collected by NANOSCOPE ANALYSIS (Bruker Corp.; version 1.50). A 50 μL drop of solution for structure assembly and a 5 μL droplet of the sample were applied to a freshly cleaved mica surface and left for ~2 min. The images were captured under liquid tapping mode, with C-type triangular tips (resonant frequency, f0 = 40–75 kHz; spring constant, k = 0.24 N m−1) from the SNL-10 silicon nitride cantilever chip (Bruker Corporation). For each structure, the AFM image were independently repeated at least three time.
4
DNA Nanostructure Imaging via AFM
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AFM images were obtained using an SPM Multimode with Nanoscope V controller (Bruker Corp.). A 5-μl droplet (2–10 nM) of purified sample (annealed sample without purification for the infinite-size lattice) and then a 40 μl drop of 0.5× TE buffer (10 mM MgCl2) were applied to a freshly cleaved mica surface and left for ∼2 min. Supplementary 10 μl 10mM NiCl2 was added to increase the strength of DNA–mica binding (62 (link)). NiCl2 supplementation was skipped when imaging 9 × 10 DX lattice without a quality downgrade under AFM. To image the pattern ‘T’, 1 μl streptavidin (0.5 mg/ml in 0.5× TE buffer) was added to the sample droplet on mica for 2 min before imaging. Additional dilution of the sample was performed sometimes to achieve the desired sample density. Samples were imaged under liquid ScanAsyst mode, with C-type triangular tips (resonant frequency, f0 = 40–75 kHz; spring constant, k = 0.24 N m−1) from the SNL-10 silicon nitride cantilever chip (Bruker Corp.).
5
Atomic Force Microscopy of DNA Nanostructures
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The SPM Multimode with Digital Instruments Nanoscope V controller (Vecco) was used to collect AFM images of purified DNA nanostructures, and the NANOSCOPE ANALYSIS (version 1.50; Bruker Corp.) was used to analyze the height of structures. A 50 μL drop of solution for structure assembly and a 2–3 μL droplet of the sample were applied to a freshly cleaved mica surface and left for ~2 min incubation. The images were captured under liquid tapping mode, with C-type triangular tips (resonant frequency, f0 = 40–75 kHz; spring constant, k = 0.24 N m−1) from the SNL-10 silicon nitride cantilever chip (Bruker Corporation). For AFM imaging of each structure, independent triplicated experiments were conducted.
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