Surface morphology examination of the as-synthesized myrrh natural resin, PVP, and PVA/myrrh thin film was conducted using a Zeiss SEM Ultra 60 field-emission scanning electron microscope (FESEM) operated at an acceleration voltage of 5 kV. Elemental mapping was used to estimate the elemental distribution of the synthesized myrrh natural resin, PVA, and PVA/myrrh thin film and was investigated by coupled SEM/EDX (BRUKER, Nano GmbH, D-12489, 410-M, Germany) mapping analysis.
Sem ultra 60
Manufactured by Zeiss
Sourced in Germany, United Kingdom, Japan
The SEM Ultra 60 is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a field emission electron gun and advanced detection systems, providing excellent performance in both secondary electron and backscattered electron imaging modes.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (6 mentions)
2040 spectrophotometer, by Shimadzu (2 mentions)
Ft ir 6300 type a, by Jasco (2 mentions)
Empyrean x ray diffractometer, by Malvern Panalytical (1 mentions)
Ta q500 tga, by TA Instruments (1 mentions)
Spectrum one, by PerkinElmer (1 mentions)
Smartlab x ray diffractometer, by Rigaku (1 mentions)
Nicolet 8700, by Thermo Fisher Scientific (1 mentions)
Jem 1230, by JEOL (1 mentions)
X pert pro mpd x ray diffractometer, by Malvern Panalytical (1 mentions)
11 protocols using sem ultra 60
1
Morphology and Elemental Analysis of Myrrh Resin Films
2
Characterization of TMN Nanoparticles
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The morphology of the TMN NPs was elucidated using field-emission scanning electron microscopy (FESEM, Zeiss SEM Ultra 60, 5 kV), which is coupled with energy dispersive X-ray spectroscopy (EDX; Oxford ISIS 310, England spectroscopy) for the elemental analysis. X-ray diffraction (XRD) patterns were recorded on a Panalytical Empyrean X-ray Diffractometer at 30 mA and 40 kV using Cu Kα radiation (λ = 0.15418 nm). The Raman spectrum was recorded using a dispersive Raman microscope (Pro Raman-L Analyzer) with a laser power of 1 mW and an excitation wavelength of 512 nm. X-ray photoelectron spectroscopy (XPS) was carried out on an ESCALAB 250Xi, Thermo Scientific, USA, with monochromatic X-ray Al K-alpha radiation (1350 eV). Surface area analysis was performed using the Brunauer–Emmett–Teller (BET) isotherm to determine the specific surface area of the material. The vacuum degassing was performed at 80 °C with a heating rate of 5 °C min−1, and then the material was soaked for 6 h. The BET adsorption/desorption measurements were performed in N2 gas at 77.35 K bath temperature.
3
Characterization of Prepared Materials
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The crystal structure of the prepared materials was examined by X-ray diffraction (XRD, XPERT- PRO- Analytical) with Cu Kα radiation (λ = 1.54 °A). The surface morphology was investigated by field-emission scanning electron microscope (FESEM-Zeiss SEM Ultra-60). The morphology of the samples was investigated using high-resolution transmission electron microscope (HRTEM, JOEL JEM-2100) operating at an accelerating voltage of 120 kV. The infrared (IR) spectra were recorded using a JASCO spectrometer (FTIR-6300 type A) in the range 400–4000 cm−1. The UV/Vis spectrophotometric measurements were made using a Shimadzu 2040 spectrophotometer. Raman measurements were performed using a micro-Raman microscope with an excitation laser beam wavelength of 325 nm. The weight loss of the samples was determined using TGA thermal analyzer (TA TGA-Q500) from room temperature to 800 °C at a heating rate of 10 °C/min in nitrogen atmosphere.
4
Characterization of Silk Fibroin by Advanced Analytical Techniques
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The produced silk was characterized using scanning electron microscope (SEM) (FEDEM, Zeiss SEM Ultra 60, 5 kV) the fibers were sputtered with gold at 15 A for 5 minutes before the SEM imaging. The composition of the fibroin was detected using the energy dispersive X-ray analysis (EDX) (JED 2300). The protein signals of the silk fibroin were investigated using a dispersive Raman microscope (Pro Raman-L Analyzer) with an excitation wavelength of 512 nm and Fourier transform infrared spectroscopy (FT-IR) via Perkin Elmer Spectrum One spectrophotometer using KBr pellets. The crystal structure and the change in crystal parameters were investigated using the X-ray powder diffraction (XRD) (Panalytical X’pert PRO MPD X-Diffractometer) with Cu Kα radiation (λ = 0.15418 nm, 40 kV, 30 mA). Thermogravimetric analysis (TGA) was conducted on the natural silk using the device (TGA NETZSCH STA 409 C/CD) at a heating rate of 10 °C/min and a nitrogen flaw rate of 20 ml/min.
5
Characterization of Brass Samples
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The morphology of the brass samples was characterized by Zeiss SEM Ultra 60 field emission scanning electron microscope (FESEM) with 8 kV applied voltage, and the elemental composition was determined using energy dispersive X-ray analysis (EDX) attached to the SEM equipment. Rigaku SmartLab X-ray diffractometer was used to record the grazing incident x-ray diffraction (GIXRD) spectra in the 2θ range of 5°–80° at step rate of 0.007°.
6
Comprehensive Characterization of Prepared Materials
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The crystal structure of the prepared materials was examined by X-ray diffraction (XRD, XPERT-PRO-Analytical) with Cu Kα radiation (λ = 1.54 Å). The surface morphology was investigated by field-emission scanning electron microscope (FESEM-Zeiss SEM Ultra-60). The morphology of the samples was investigated using high-resolution transmission electron microscope (HRTEM, JOEL JEM-2100) operating at an accelerating voltage of 120 kV. The infrared (IR) spectra were recorded using a JASCO spectrometer (FT/IR-6300 type A) in the range 400–4000 cm−1. UV/Vis spectrophotometric measurements were made using a Shimadzu 2040 spectrophotometer. Raman measurements were performed using a micro-Raman microscope with an excitation laser beam wavelength of 325 nm. The weight loss of the samples was collected by TGA thermal analyzer (TA TGA-Q500) from room temperature to 800 °C at a heating rate 10 °C min−1 in nitrogen atmosphere, the time-dependent anodization currents were recorded using a computer controlled Keithley 2000 multimeter and Advantec KM-100 electric muffle furnaces.
7
Characterization of Fabricated Nanofibers
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The elemental and morphological analysis of the fabricated nanofibers were performed using a field emission scanning microscope (FSEM, Zeiss SEM ultra 60) and a transmission electron microscope (TEM, JEM-1230, Jeol, Japan). To confirm the chemical bonding, Fourier Transform Infrared spectroscopy (FT-IR, Thermo Scientific Nicolet 8700, USA) was used to characterize the chemical structure of the uniaxial CS/PVA/PQQ, CS/PVA hollow and CS/PVA/PQQ coaxial nanofibers.
8
Characterization of MoS2 Nanostructures
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The crystal structure and composition
of the MoS2 were investigated using an X-ray powder diffractometer
(Panalytical X’pert PRO MPD X-ray diffractometer) with Cu Kα
radiation (λ = 0.15418 nm, 40 kV, 30 mA), and XPS (ESCALAB 250XI,
Thermo Scientific), respectively. Raman spectroscopy was performed
using a dispersive Raman microscope (Pro Raman-L Analyzer) with an
excitation wavelength of 512 nm and laser power of 1 mW. HR-TEM (JOEL
JEM-2100) was used for imaging and selected area diffraction analysis.
The morphology and nanostructure of the studied samples were investigated
using the FESEM (Zeiss SEM Ultra 60, 5 kV). The accelerated surface
area and porosimetry were used for measuring the adsorption/desorption
of the nitrogen isotherm at −196 °C; the BET plot with
the nitrogen adsorption isotherm was used to indicate the specific
surface area.
of the MoS2 were investigated using an X-ray powder diffractometer
(Panalytical X’pert PRO MPD X-ray diffractometer) with Cu Kα
radiation (λ = 0.15418 nm, 40 kV, 30 mA), and XPS (ESCALAB 250XI,
Thermo Scientific), respectively. Raman spectroscopy was performed
using a dispersive Raman microscope (Pro Raman-L Analyzer) with an
excitation wavelength of 512 nm and laser power of 1 mW. HR-TEM (JOEL
JEM-2100) was used for imaging and selected area diffraction analysis.
The morphology and nanostructure of the studied samples were investigated
using the FESEM (Zeiss SEM Ultra 60, 5 kV). The accelerated surface
area and porosimetry were used for measuring the adsorption/desorption
of the nitrogen isotherm at −196 °C; the BET plot with
the nitrogen adsorption isotherm was used to indicate the specific
surface area.
9
Graphene Monolayer Morphology Analysis
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The morphology of the graphene monolayer was examined and studied using field-emission scanning electron microscopy (FE-SEM, Zeiss SEM Ultra 60) after each irradiation process, using magnifications that ranged between X250 to X1500, with an electron high-tension value of 4 kV and a working distance of 4.9 mm.
10
Electrochemical Characterization of Boron Carbon Nitride-Copper Composite
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All the electrochemical measurements were conducted in 0.5 M H2SO4 electrolyte in a three-electrode system. For the working electrode, a very thin layer of boron carbon nitride-copper composite was deposited on graphite sheet. Hg/HgSO4 was used as the reference electrode while Pt foil, gold coil, glassy carbon rod, and titanium mesh were used as the counter electrode (CE). All voltage values were converted into the reversible hydrogen electrode (RHE), where ERHE = EHg/HgSO4 + 0.64 V + 0.059 pH. The morphology of the fabricated nanofibers was characterized with Zeiss SEM Ultra 60 field emission scanning electron microscope (FESEM). Energy Dispersive X-ray (EDX; Oxford ISIS 310, England) spectroscopy attached to the FESEM microscope was used for the elemental analysis and mapping of the fabricated electrodes, and the crystal structure using X-ray photoelectron spectroscopy (XPS, Thermo-Scientific) measurements were conducted in UHV chamber equipped with hemispherical energy analyzer (SPHERA U7) with Al Kα monochromator X-ray source (1486.6 eV), operated at Constant Analyzer Energy (CAE 50) mode.
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