Helios 600

Manufactured by Thermo Fisher Scientific

Sourced in United States

The Helios 600 is a high-resolution scanning electron microscope (SEM) designed for advanced materials analysis. It features a field emission electron source, high-resolution imaging, and a range of analytical capabilities.

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Lab products found in correlation

Quanta 250 feg, by Thermo Fisher Scientific (2 mentions) Phi 5500, by PerkinElmer (1 mentions) Arm200f tem, by JEOL (1 mentions) Supra 60 vp, by Zeiss (1 mentions) Cary 5000 spectrophotometer, by Agilent Technologies (1 mentions) Alpha 300r, by WITec (1 mentions) Titan 80 300, by Thermo Fisher Scientific (1 mentions) Tecnai osiris, by Thermo Fisher Scientific (1 mentions) Stemi 2000 c optical microscope, by Zeiss (1 mentions) D8 advance, by Brucker (1 mentions) Cm200, by Philips (1 mentions) Labram hr, by Horiba (1 mentions) Sem inspect f50, by Thermo Fisher Scientific (1 mentions) D max rb, by Rigaku (1 mentions) Supra 55, by Zeiss (1 mentions) Leap 5000 xr, by Cameca (1 mentions) Ivas 3, by Cameca (1 mentions) Leap 3000x hr, by Cameca (1 mentions) Zetasizer nano s90, by Malvern Panalytical (1 mentions) Gum arabic, by Merck Group (1 mentions)

14 protocols using helios 600

Comprehensive Nanofiber Characterization Protocol

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Nanofiber images were obtained by scanning electron microscopy (SEM) on a FEI Quanta 250 FEG and FEI Helios 600. Transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM) images and EDX elemental mapping were obtained on a FEI Tecnai Osiris equipped with Super-X EDX detection system (FEI) based on Silicon Drift Detector (SDD) technology and high angle annular dark field (HAADF) detector. The high sensitivity system allows for the detection of all elements down to and including boron; high output count rates and maximum collection efficiency provide quick time-to-data even for low intensity EDX signals. For electron microscopy studies, nanofiber samples were dispersed in acetone using an ultrasonic bath for 5–30 min to obtain single nanofibers. The resulting suspensions were dropped onto Cu lacey carbon grids. To visualize structure details, low voltage immersion mode (FEI Helios 600) and environmental mode (FEI Quanta 250 FEG) were applied for obtaining SEM images.
See ESI† for additional information on cyclic voltammetry (CV), electrochemical impedance spectroscopy (EIS), and BET specific surface area data.

Ponomarev I.I., Skupov K.M., Naumkin A.V., Basu V.G., Zhigalina O.M., Razorenov D.Y., Ponomarev I.I, & Volkova Y.A. (2019). Probing of complex carbon nanofiber paper as gas-diffusion electrode for high temperature polymer electrolyte membrane fuel cell. RSC Advances, 9(1), 257-267.

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Comprehensive Characterization of In-doped Hematite

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The phase of the prepared samples was determined by micro-Raman spectroscopy using a confocal Raman microscope (alpha300 R; WITec) with a 488 nm laser pulse as the excitation source. The surface morphology of pristine and In-doped hematite samples was examined using a field emission scanning electron microscope (FE-SEM, Zeiss Supra 60 VP), operated at an acceleration voltage of 10 kV. The optical absorption of all samples was measured using a Cary 5000 spectrophotometer (Varian). XPS spectra were acquired in a PerkinElmer Phi 5500 setup (base pressure < 10⁻¹⁰ mbar) using AlK_α radiation at 1.4866 keV. The XPS spectra were shifted using the Fe(2p_3/2) peak, setting it to 710.9 eV. High-resolution transmission electron microscopy (HR-TEM, FEI Titan 80–300) with an energy-dispersive X-ray spectroscopy (EDX) analyzer was employed to observe the crystalline structure and lattice fringes, combined with selected area electron diffraction (SAED) in order to analyze the chemical composition and the element distribution of the samples. Cross sectional specimens of selected thin film samples were prepared by focused ion beam milling (FEI HELIOS 600), from which high angle annular dark-field (HAADF) and EDX mapping images were collected simultaneously, by using a JEOL ARM-200F TEM.

Singh A.P., Tossi C., Tittonen I., Hellman A, & Wickman B. (2020). Synergies of co-doping in ultra-thin hematite photoanodes for solar water oxidation: In and Ti as representative case. RSC Advances, 10(55), 33307-33316.

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Cobalt Pillar Growth via Focused Ion Beam

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The growth was
performed in an FEI Helios 600 dual beam system equipped with a 30
kV FEG and a Ga+ liquid metal source in the same chamber. In this
work, the substrate was a Cu rod of 1 mm in diameter ending in a nanotip,
on which the cobalt pillar was grown. The end of the tip was cut and
sharpened using focused ion milling (Figure S1) to ensure that the pillar rested on the salient point of the substrate.
The parameters used during the growth and more information on the
growth process can be found in the Supporting
Information and in refs (38 (link) and 39 (link)).

Wolf D., Rodriguez L.A., Béché A., Javon E., Serrano L., Magen C., Gatel C., Lubk A., Lichte H., Bals S., Van Tendeloo G., Fernández-Pacheco A., De Teresa J.M, & Snoeck E. (2015). 3D Magnetic Induction Maps of Nanoscale Materials Revealed by Electron Holographic Tomography. Chemistry of Materials, 27(19), 6771-6778.

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Spray-Printed Pt-Based Catalyst Layers

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Catalyst layers were prepared by employing a common spray printing method. The slurry consisting of porous Pt (or Pt black) (81.5 mg), ethanol (1764 µL), 5% Nafion^® dispersion solution (919 µL), and MilliQ water (196 µL) was thoroughly stirred by an ultrasonic homogenizer. In this condition, the ratio of ionomer and catalyst was fixed to 0.33. This slurry was spray-printed on Nafion^® 117 by a spray printing system (Nordson, Westlake, OH, USA). Catalyst layers were made into a 1 cm × 1 cm square. Pt-loading was fixed to 0.50 mgPt cm⁻². The cross section of catalyst layers was observed using FIB-SEM (Helios 600, FEI Company, Hillsboro, OR, USA). FIB processing was carried out at an accelerating voltage of 30 kV and a beam current of 0.4 nA.

Muto M., Nagayama M., Sasaki K, & Hayashi A. (2020). Development of Porous Pt Electrocatalysts for Oxygen Reduction and Evolution Reactions. Molecules, 25(10), 2398.

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Characterization of Surface Topography

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Characterisation of the surface topography as well as the modification of the microstructure was conducted by means of confocal laser scanning microscopy (CLSM) utilising a LEXT OLS4100 3D Measuring Laser Microscope by Olympus as well as scanning electron microscopy (SEM) (Helios 600 by FEI). The CLSM measurements were done using the 50× lens in digitally doubled magnification mode at a laser wavelength of 405 nm. For SEM imaging, secondary electron (SE) contrast was used in addition to a sample tilt of 52° degree, which allows for an improved visualization of topographical features. The acceleration voltage was set to either 10 kV or 5 kV at a current of 0.86 pA.

Müller D.W., Fox T., Grützmacher P.G., Suarez S, & Mücklich F. (2020). Applying Ultrashort Pulsed Direct Laser Interference Patterning for Functional Surfaces. Scientific Reports, 10, 3647.

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Correlative Serial Volume Imaging

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Serial view imaging was performed on processed IFM samples as previously described (Weiner et al., 2011 (link)). In brief, resin blocks were mounted on stubs and placed into a dual beam system (Helios 600; FEI). Serial views of freshly exposed surfaces were acquired using the Auto Slice and View G2 software (FEI). An ion beam current of 0.92 NA at 30 kV was used for milling slices at a step size of 10 nm. ImageJ software (National Institutes of Health) was used to align images using the stackreg plugin as previously described (Schindelin et al., 2012 (link)). Amira (Visage Imaging) was used for segmentation (using the paint brush tool), rendering, and visualization of the data.

Dhanyasi N., Segal D., Shimoni E., Shinder V., Shilo B.Z., VijayRaghavan K, & Schejter E.D. (2015). Surface apposition and multiple cell contacts promote myoblast fusion in Drosophila flight muscles. The Journal of Cell Biology, 211(1), 191-203.

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Microstructural Analysis of Adiabatic Shear Bands

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Ruptured specimens were cut in half along the compression, mounted into resin and finally prepared into metallographic specimens. The microstructure of the ASB was observed using a Zeiss Stemi2000c optical microscope. FEI Helios 600 focused ion beam (FIB) SEM was used to machine the TEM specimen from the ASB. The dimension of the rectangle TEM foil was approximate 10 μm in width and 20 μm in length, and the normal of the TEM foil was parallel to the shearing direction. An FEI Themis Z probe-corrected TEM was used to investigate the microstructure of the ASB.

Qin D., Lu S, & Li Y. (2022). Influence of Loading Directions on Dynamic Compressive Properties of Mill-Annealed Ti-6Al-4V Thick Plate. Materials, 15(20), 7047.

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Comprehensive Structural and Electrical Characterization of Composite Thin Films

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X-ray diffraction (XRD, Brucker D8 Advance with CuK_α1 radiation (λ = 0.15406 nm) in Bragg Brentano configuration) and micro-Raman spectrometry (Horiba LabRAM HR using a 532 nm laser) were employed together to identify the phase structures. Transmission electron microscopy (TEM) investigations were performed by a JEOL ARM 200-Cold FEG (point resolution 0.19 nm) fitted with a GIF Quantum ER. For this purpose, the TEM cross-section and top-view specimens of composite thin films deposited on silicon substrates were prepared in a focused ion beam (FIB)-scanning electron microscope (SEM) dual beam system (FEI Helios 600) using the ‘in situ’ lift-out technique. Final thinning was done with low voltage milling (5 kV) to reduce any possible preparation artifacts. The convergent beam electron diffraction (CBED) analyses were done by another TEM (Philips CM200). Besides, the top-view microstructure was also studied by TEM specimens prepared by diamond tip cleave. Electrical resistivity measurements were performed at room temperature using the four-point probe method.

Wang Y., Ghanbaja J., Bruyère S., Soldera F., Horwat D., Mücklich F, & Pierson J.F. (2017). Room temperature self-assembled growth of vertically aligned columnar copper oxide nanocomposite thin films on unmatched substrates. Scientific Reports, 7, 11122.

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Single-cell analysis of nanomaterial uptake

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Electron imaging was performed with a scanning electron microscope (SEM INSPECT F50.FEI company) and dual-beam (FIB/SEM. Helios 600.FEI company). SEM images were taken at 5 and 30 kV with a FEG column and a combined Ga-based 30 kV (10 pA) ion beam was used to cross-section single cells. The investigations were completed by energy-dispersive X-ray spectroscopy (EDX) for chemical analysis. For this, PC12 cells were seeded on glass coverslips (previously coated with poly-L-lysine) at a density of 5 × 10⁵ cells/ml. After cell adhesion, the growth media was removed and replaced with the reduced media containing the functionalized NPs (10 μg/ml) or media with corresponding NGF concentration. After 72 h of incubation, cells were washed with PBS, fixed, dehydrated, dried, and sputtered with 30 nm of gold for electron imaging.

Pinkernelle J., Raffa V., Calatayud M.P., Goya G.F., Riggio C, & Keilhoff G. (2015). Growth factor choice is critical for successful functionalization of nanoparticles. Frontiers in Neuroscience, 9, 305.

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Microstructural Characterization of Materials

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Microstructure and morphology were characterized by a Zeiss Supra-55 field emission scanning electron microscopy equipped with an energy dispersive X-ray spectrometer (EDS). Transmission electronic microscopy (TEM) experiment was carried out with a Tecnai-F30 S-TWIN microscopy. The TEM specimens were first mechanically ground to 50 μm thickness and then twin-jet electro-polished with an electrolyte of 8% perchloric acid + 92% methanol. The amorphous nature was examined by X-ray diffraction using Cu Kα radiation (Rigaku D_max-RB).
Atom probe tomography and 3D elemental distribution analyses were carried out in CAMECA Instruments LEAP 5000XR local electrode atom probe system. The specimens were analyzed in laser mode, with a specimen temperature of 50 K, a pulse repetition rate of 200 kHz, a pulse energy of 40 pJ, and a detection rate of 0.4% ions per field evaporation pulse. Imago Visualization and Analysis Software (IVAS) version 3.8.0 was used for 3D reconstructions, composition analysis and the creation of iso-concentration surfaces. The sharp tip specimens required for 3D-APT were fabricated by focused ion beam milling on a dual-beam FEI Helios 600.

Wu Y., Cao D., Yao Y., Zhang G., Wang J., Liu L., Li F., Fan H., Liu X., Wang H., Wang X., Zhu H., Jiang S., Kontis P., Raabe D., Gault B, & Lu Z. (2021). Substantially enhanced plasticity of bulk metallic glasses by densifying local atomic packing. Nature Communications, 12, 6582.

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