The crystal structures of the neat and the salt-confined nylon 6,6 fibres are investigated using an X-ray polycrystal diffractometer (XRD)—D/max-2550 PC, manufactured by Rigaku (Tokyo, Japan).
D max 2550 pc xrd
Manufactured by Rigaku
Sourced in Japan
The D/max-2550 PC XRD is a X-ray diffractometer designed for powder and thin-film analysis. It utilizes a copper X-ray source and a proportional counter detector to measure the diffraction patterns of crystalline materials. The instrument is controlled by a PC and provides data collection and analysis capabilities.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (4 mentions)
S 4800, by Hitachi (2 mentions)
Invia reflex, by Renishaw (2 mentions)
Jem 2100, by JEOL (1 mentions)
Jem 2100f, by Hitachi (1 mentions)
Nicolet almega xr, by Thermo Fisher Scientific (1 mentions)
Hf 3300, by Hitachi (1 mentions)
Ds 11, by DeNovix (1 mentions)
Su8020, by Hitachi (1 mentions)
6 protocols using d max 2550 pc xrd
1
X-ray Diffraction Analysis of Nylon 6,6 Fibers
2
Crystallinity Analysis of Polyester Fabrics
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
An XRD D/Max-2550 PC (RIGAKU Co., Ltd., Tokyo, Japan) was used to measure the degree of crystallinity of fabrics, which describes the molecular structure of the polyester filaments. Damage to these molecular structures would alter the mechanical characteristics of the fabric.
3
Characterizing Zinc Oxide-Zinc Sulfide Core-Shell Nanoparticles
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
A field-emission scanning electron microscope (FE-SEM, Quanta 200 FEG) was used to evaluate the morphology and size of the CSNPs. An aqueous dispersion of Uf-gel-ZnO-ZnS CSNPs was poured on a silicon substrate and dried at 37°C to eliminate moisture. Then, the samples were evaluated using FE-SEM operating at a 5 kV accelerated voltage. For high-resolution transmission electron microscopy (HR-TEM, JEOL JEM-2100), a diluted suspension of 5 μL Uf-gel-ZnO-ZnS CSNP was deposited on a carbon-coated copper grid and dried at 37°C. Then, the samples were analyzed with an accelerating voltage of 200 kV. The crystallinity of the formed ZnO-ZnS CSNPs was examined using the XRD technique (D/max-2550 PC XRD, Rigaku, Japan). The Uf-gel-ZnO-ZnS CSNPs are blended with the powder form of KBr and formed as a pellet for the acquisition of the FTIR spectrum (Nicolet 6700), scanned in transmission mode at 4000-400 cm−1 range.
4
Multimodal Characterization of Samples
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The morphology of as‐prepared samples were investigated by SEM (Hitachi, S‐4800) and TEM (JEM‐2100F). XRD were conducted by a D/max‐2550 PC XRD (Rigaku, CuKα radiation). In situ TEM experiments were performed in TEM with the TEM‐STM holder of Nanofactory (Gothenburg, Sweden). XPS data were obtained using XPS (ESCALAB 250Xi, Thermo Scientific, USA). The Raman spectra were measured by InVia Reflex (Renishaw).
5
Characterization of Carboxymethyl Cellulose Nanoflowers
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
A high-resolution transmission electron microscope (HR-TEM, Hitachi/HF-3300) was utilized to determine the morphology and composition of NFs. The surface morphology and structure of CMC NFs were assessed using a high-resolution field-emission SEM (HR-FE-SEM, Hitachi/SU8020). Then, the absorption spectrum of FA–CMC NFs was acquired with a nanodrop (DS-11+, DeNovix, USA) spectrophotometer, in which the absorbance of the surface-modified NFs was studied as a function of wavelength. The X-ray diffraction (XRD, D/max-2550 PC XRD, Rigaku) technique was used to determine the crystallinity of CMC NFs at 2θ values of 10–80°. The purity and surface oxidation were demonstrated using an X-ray photoelectron spectrometer (XPS) in the fabricated CMC NFs (Thermo Scientific/ESCALAB 250Xi). The Raman spectrum of the nanoflower was obtained using a inVia-Reflex micro-Raman spectroscopy (Thermo Scientific/Nicolet Almega XR) system using a laser with a wavelength of 532 nm.
6
Comprehensive Material Characterization Protocol
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The morphology of as-prepared samples was investigated by scanning electron microscopy (SEM, Hitachi S-4800) and transmission electron microscopy (TEM, JEM-2100F). X-ray diffraction (XRD) patterns were collected by a D/max-2550 PC XRD (Rigaku, CuKα radiation). X-ray photoelectron spectroscopy (XPS) spectra were obtained using Escalab 250Xi. The nitrogen adsorption/desorption isotherms were measured by ASAP 2020 instrument and the specific area was calculated by the BET method. Thermogravimetric analysis (TGA) was conducted in N2 using Discovery TGA Q5000IR from 50 to 500 °C at a heating rate of 5 °C min−1. The Raman spectra were measured by InVia Reflex (Renishaw) with a 532 nm laser.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!