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Nova nanosem 2300

Manufactured by Thermo Fisher Scientific
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The Nova NanoSEM 2300 is a high-resolution scanning electron microscope designed for advanced materials characterization. It features a state-of-the-art electron optical column, high-performance detectors, and a user-friendly software interface.

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Lab products found in correlation

Dimension 3000, by Bruker (1 mentions) Senterra raman spectrometer, by Bruker (1 mentions)

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Nova NanoSEM (113 citations) Nova 2300 (5 citations)

2 protocols using nova nanosem 2300

1

Characterization of Nanomaterial Properties

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SEM images were collected using FEI Nova NanoSEM 2300. AFM image was collected from Dimension 3000 (Bruker). Raman spectrum was collected from Renishaw inVia confocal Raman microscope. XPS spectrum was collected from VersaProbe II Scanning ESCA Microprobe. Electrical conductivity measurement is perform using the four-point probe station.35 (link)
Liu K.K., Jiang Q., Kacica C., Derami H.G., Biswas P, & Singamaneni S. (2018). Flexible solid-state supercapacitor based on tin oxide/reduced graphene oxide/bacterial nanocellulose. RSC Advances, 8(55), 31296-31302.
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2

Materials Characterization Techniques

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The transmission electron microscopy (TEM) images were taken with a JEM-2100Fmicroscope operated at an acceleration voltage of 200 kV. The scanning electron microscopic (SEM) images were obtained with a FEI Nova NanoSEM 2300. The Raman spectra were obtained by using a Senterra Raman spectrometer (Bruker AG). XPS measurements were conducted on a Kratos Axis Ultra DLD spectrometer using a monochromated Al Kα radiation. The atomic force microscope (AFM) images were taken on a Multimode-NanoscopeIIIa microscope (Digital Instrument).
Fu W., Du F.H., Su J., Li X.H., Wei X., Ye T.N., Wang K.X, & Chen J.S. (2014). In situ catalytic growth of large-area multilayered graphene/MoS2 heterostructures. Scientific Reports, 4, 4673.
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