Sirion microscope

Manufactured by Thermo Fisher Scientific

The SIRION microscope is a scanning electron microscope (SEM) designed for high-resolution imaging of a wide range of samples. It provides stable, high-resolution imaging capabilities to support various research and industrial applications.

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Lab products found in correlation

Tecnai g2 t20, by Thermo Fisher Scientific (1 mentions) Chi 660e electrochemical system, by CH Instruments (1 mentions) K alpha esca system, by Thermo Fisher Scientific (1 mentions) Labram hr800, by Horiba (1 mentions) Dimension icon, by Bruker (1 mentions) Tecnai f20, by Thermo Fisher Scientific (1 mentions) Nova 600 nanolab fib, by Thermo Fisher Scientific (1 mentions) M 2000ui, by J.A. Woollam Co. (1 mentions)

Spelling variants of this product

Sirion 200 scanning electron microscope (7 citations) XL30 Sirion scanning electron microscope (4 citations) Sirion 200 microscope (4 citations)

2 protocols using sirion microscope

Comprehensive Characterization of Modified Electrode

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Transmission electron microscopy (TEM) images, scanning transmission electron microscopy (STEM) images, and energy dispersive spectroscopy (EDS) line profiles were obtained using a FEI Tecnai G2T20. X-ray photoelectron spectroscopy (XPS) analysis was carried out using a K-Alpha ESCA system (Thermo Scientific). Scanning electron microscopy (SEM) was used to study the morphology of the modified electrode on an FEI SIRION microscope. Raman spectra were used to analyze graphitic ordering by a LabRAM HR800 from JY Horiba. CHI660E electrochemical system (CH Instrument, Shanghai, China) was used for all the electrochemical measurement. A conventional three-electrode system was used for all electrochemical experiments. Platinum wire (1 cm²) and Ag/AgCl were selected as the counter electrode and reference electrode, respectively. A bare or modified glassy carbon electrode (GCE) (5 mm diameter) was used as working electrode.

Cao Y., Sun Y., Wang H., Li X., Wang Q., Si W., Lan W., Wang F, & Han N. (2024). Fundamental understanding of nitrogen in biomass electrocatalysts for oxygen reduction and zinc-air batteries. iScience, 27(2), 108913.

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Nanostructure Characterization by SEM, AFM, and TEM

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High resolution scanning electron microscope (HR-SEM) images were captured by using a FEI Sirion microscope at a 5 kV acceleration voltage and a spot size of 3. The surface topography of structures was measured by using an atomicforce microscopy (Dimension Icon, Bruker Corp.) in contact mode in air. The thickness of the sputtered Pt layers and the SiO 2 layers was measured by using an ellipsometer system (M-2000UI, J A Woollam Co.) at an angle of 75°. Sample for transmission electron microscopy (TEM) was prepared by using a focused ion beam (FIB) system (FEI Nova 600 NanoLab FIB). The TEM specimen was measured by using a TEM system (FEI Tecnai F20) at a 200 kV acceleration voltage.

Le-The H., Tregouet C., Kappl M., Müller M., Kirchhoff K., Lohse D., van den Berg A., Odijk M, & Eijkel J.C.T. (2019). Engulfment control of platinum nanoparticles into oxidized silicon substrates for fabrication of dense solid-state nanopore arrays. Nanotechnology, 30(6).

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