Concentrations of Fe and Cr in parts per million in triketones 1 and 4 , chemically recycled using strong acid from mixed-material waste containing stainless steel, were quantified by ICP-OES 720ES (Varian) equipped with an axial argon torch. For each determination, ~10 mg of triketone was oxidatively digested at ambient temperature in concentrated HNO3 (~200 μl) for 24 hours and subsequently diluted with MilliQ water to 10 ml in a precision volumetric flask before analysis and comparison to a calibration curve for each element.
Icp oes 720es
Manufactured by Agilent Technologies
Sourced in United States
The Agilent ICP-OES 720ES is an inductively coupled plasma optical emission spectrometer. It is designed for the analysis of trace elements in a variety of sample types.
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4 protocols using icp oes 720es
1
Quantifying Fe and Cr in Triketones
2
Membrane Analysis of Ions and Lactic Acid
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The permeate and feed samples from the RO membrane experiments and samples from the ED diluate tank (collected every 10–15 min) were analyzed using inductively coupled plasma optical emission spectroscopy (ICP-OES 720ES, Varian, Palo Alto, CA, USA) to measure the concentration of sodium (Na) and potassium (K). High-performance liquid chromatography (HPLC, Shimadzu, Kyoto, Japan) was used to measure lactic acid concentrations in the collected samples. All samples were filtered and diluted according to the equipment detection limits. Information on the operating parameters of the ICP-OES and HPLC can be found elsewhere [4 (link)].
3
Characterization of AuPt Nanoalloy
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The morphology of AuPt nanoalloy was characterized by transmission electron microscope JEM-2100F (JEOL, Japan). X-Ray diffraction of AuPt nanoalloy was analyzed by X-ray powder diffractometer XD-3 (PERSEE, China). Inductively coupled plasma optical emission spectrometry (ICP-OES) analysis was performed at ICP-OES 720ES (Agilent, American). Pictures were captured by camera 1000D EOS (Canon, Japan). Strips were produced by dispensing platform XYZ3010 and programmable strip cutter CM3010 (Jiening, China).
4
Comprehensive Structural Characterization of Material
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The crystalline structure and composition were performed by X-ray diffraction analysis (XRD, Rigaku RINT-2000, Cu Kα radiation at 40 kV and 40 mA) and X-ray photoelectron spectroscopy (XPS, ESCALAB 250xi, Thermo Fisher Scientific). The elemental contents were tested by inductively coupled plasma optical emission spectroscopy (ICP-OES-720ES, Agilent, USA). The morphology was observed using field emission scanning electron microscopy (FE-SEM, Supra 55, Zeiss, Germany) and transmission electron microscopy (TEM, JEM-2100F, JEOL, Japan) systems. The cross-sectional SEM image was taken by argon-ion milling machine (GATAN, ILION693) with a voltage of 5 kV, following with SEM observation. The aberration-corrected high-angle annular dark-field scanning transmission electron microscopy was performed using JEM-ARM200F. UV-visible diffuse reflectance spectra were implemented on a UV-2600 (Shimadzu) spectrometer using BaSO4 as the reference. Photoluminescence (PL) spectra were performed on a HORIBA Fluoromax-4 (HORIBA JY, HORIBA Fluoromax-4, USA) under laser excitation at 350 nm. The electron paramagnetic resonance (EPR) measurements were recorded using a JES-FA200 spectrometer at low temperature (−150 °C).
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