840a microscope
The JEOL 840A microscope is a versatile scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a state-of-the-art electron optical column and advanced detection systems to provide clear, detailed images of samples at the micro- and nano-scale. The 840A is a reliable and efficient tool for research, development, and quality control applications across various industries and scientific disciplines.
Lab products found in correlation
2 protocols using 840a microscope
Characterization of Nanostructured Materials
Characterization of Nanostructured Materials
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