Scanning electronic microscope (SEM, JSM 7800F), transmission electron microscope (TEM) and high resolution transmission electron microscope (HRTEM, JEM-2100F) images were obtained to characterize the morphological features of samples. X-ray diffraction (XRD) was carried out using a Bruker D8 Advance X-ray diffractometer with Cu-Kα radiation over a scan rate of 10° min−1 in the 2θ range from 5° to 80°. A Tensor 27 Fourier-transform infrared spectroscopy (FTIR) spectrometer (Nicolet 6700) was used to record the FTIR spectra of catalyst. X-ray photoelectron spectroscopy (XPS) analysis (PerkinElmer PHI 5000C, AlKα) of TiO2–Fe3O4 nanocomposites was also performed.
Phi 5000c
Manufactured by PerkinElmer
Sourced in United States
The PHI 5000C is a high-performance X-ray photoelectron spectroscopy (XPS) system designed for advanced surface and materials analysis. It provides detailed information about the chemical composition and electronic structure of a sample's surface.
Automatically generated - may contain errors
Lab products found in correlation
S 4800, by Hitachi (2 mentions)
Phi5300, by PerkinElmer (1 mentions)
Nova nanosem 450, by Thermo Fisher Scientific (1 mentions)
D8 advance, by Bruker (1 mentions)
Jsm 7001f, by JEOL (1 mentions)
X pert pro mpd, by Malvern Panalytical (1 mentions)
Spi 3800n, by Hitachi (1 mentions)
Chi660c electrochemical workstation, by Chenhua (1 mentions)
Verios 460, by Thermo Fisher Scientific (1 mentions)
Nicolet is10, by Thermo Fisher Scientific (1 mentions)
Raman spectrometer, by Renishaw (1 mentions)
X pert pro, by Philips (1 mentions)
Dxr spectrometer, by Thermo Fisher Scientific (1 mentions)
8 protocols using phi 5000c
1
Characterization of TiO2-Fe3O4 Nanocomposites
2
Hierarchical Porous Carbon Characterization
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Scanning electron microscopy (SEM; FEI Nova Nano SEM 450, The Netherlands) and transmission electron microscopy (TEM; JEM 2011, Japan) were used to examine morphologies and microstructures of the as-obtained digested sludge-derived carbon materials. Nitrogen adsorption–desorption isotherm measurements (Quadrasorb evo, Quantachrome Co., USA) were carried out at 77 K to analyse the pore structure. The Brunauer–Emmett–Teller (BET) method and Barrett–Joyner–Halenda model were used to evaluate the specific surface area and pore diameter distribution of carbon materials, respectively. The X-ray diffraction (XRD) patterns (D8 Advance, Bruker Co., Germany) were measured to analyse the crystal structure of carbon materials. Fourier transform infrared spectra (FTIR; Nicolet5700, Thermo Nicolet Co., USA) were used to determine the functional groups of the as-obtained hierarchical porous carbon materials. Raman spectra (Horiba Jobin Yvon Co., France) were measured to analyse the defects in the carbon materials. X-ray photoelectron spectroscopy (XPS) (PHI5000C and PHI5300, Perkin-Elmer Co., USA) was used to investigate the electronic environment of the materials.
3
Comprehensive Materials Characterization by Advanced Techniques
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The X-ray diffraction (XRD, X'Pert MPD Pro, Panalytical) with Cu Kα radiation (λ = 1.5408 Å) was applied to analyze the phase characteristics of samples. Field-emission scanning electron microscope (FESEM, JSM-7001F, JEOL) equipped with an energy-dispersive X-ray spectroscopy (EDS) detector (INCA X-Max) and high resolution transmission electron microscope (HRTEM, F20, Tecnai) were employed to identify the particle morphologies and microstructures. The coating contents of TiO2 were calculated from the Ti element amounts, which were measured by inductively coupled plasma optical emission spectrometry (ICP-OES, 5110, Agilent Technologies). The existing state of Ti element in the TiO2 coating layer was analyzed by X-ray photoelectron spectroscope (XPS, PHI-5000C, PerkinElmer) with Mg Kα radiation source (h = 1253.6 eV). XPSPEAK4.1 software provided by Raymond W. M. Kwok (The Chinese University of Hongkong, China) was applied to analyze the XPS data.
4
Characterization of Electrochemical Interfaces
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Morphological characterization of stainless-steel substrate, Au modified electrode, and β-CD-Au electrode were recorded using a field-emission scanning electron microscopy (FESEM, Hitachi S-4800, Japan) and atomic force microscope (AFM, SPI-3800N, Japan). The elemental content was obtained by X-ray photoelectron spectroscopy (XPS, PHI 5000c, PerkinElmer Instruments, Waltham, MA, USA). A three-electrode system was used in the experiment, including a working electrode, Ag/AgCl reference electrode, and Pt counter electrode. The applied potentials in all the measurements were vs. the Ag/AgCl reference electrode. The electrochemical impedance spectroscopy (EIS) was carried out with CHI660C electrochemical workstation (Chenhua, China) at 0.24 V, and its AC disturbance voltage was in the frequency range between 0.1 and 105 Hz.
5
Synthesis and Characterization of (N5)6(H3O)3(NH4)4Cl
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All reagents and solvents used were of analytical grade. (N5)6(H3O)3(NH4)4Cl was produced according to the methods described in the literature1 (link). Fourier-transforminfrared spectra were recorded on a Thermo Nicolet IS10 instrument. Raman spectra were measured with a Renishaw (inVia) Raman spectrometer (785 nm excitation). TG-DSC-mass spectrometry (MS) measurements were performed on a Netzsch STA 409 PC/PG thermal analyzer at a heating rate of 5 K/min under argon atmosphere. X-ray photoelectron spectra (XPS) were carried out on a RBD upgraded PHI-5000C electron spectroscopy for chemical analysis (ESCA) system (Perkin Elmer) with Mg Kα radiation (hν = 1486.6 eV). The crystalline structure was characterized by X-ray powder diffraction (XRD) with a X-ray diffractometer (D8 advance), using a monochromatized Cu target radiation source. The SEM mapping was observed under SEM (FEI verios 460).
6
Characterization of CT/GO Membrane Morphology
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The pore size distribution of CT nanoparticles was evaluated using
the BJH method. A field-emission scanning electron microscopy (FESEM,
Hitachi S-4800) instrument equipped with an X-ray energy-dispersive
spectroscopy (EDS) system was applied to observe the morphologies
of the CT nanoparticles and as-prepared CT/GO membranes. Transmission
electron microscopy (TEM, JEM-2010) was involved to characterize the
CT/GO mixture. Atomic force microscopy (AFM, Bruker-Dimension Edge)
was utilized to analyze the surface roughness of the as-prepared membranes.
The ζ potential of CT/GO suspensions with different CT contents
was tested by dynamic light scattering analysis (zeta sizer 3000HSA)
at room temperature. The CT/GO membranes were examined by X-ray photoelectron
spectroscopy (XPS, PerkinElmer PHI 5000C) using Al Kα as the
X-ray source. X-ray diffraction (XRD) patterns of the produced membranes
were measured by an XRD analyzer with Cu Kα radiation (Rigacu
Dmax-3C). The pure water contact angles (WCAs) of the surfaces of
CT/GO membranes with varied CT loadings were investigated by a sessile
drop analysis system (CAM200, KSV). The reported WCA for each sample
in this study was the average value from three random locations on
each sample.
the BJH method. A field-emission scanning electron microscopy (FESEM,
Hitachi S-4800) instrument equipped with an X-ray energy-dispersive
spectroscopy (EDS) system was applied to observe the morphologies
of the CT nanoparticles and as-prepared CT/GO membranes. Transmission
electron microscopy (TEM, JEM-2010) was involved to characterize the
CT/GO mixture. Atomic force microscopy (AFM, Bruker-Dimension Edge)
was utilized to analyze the surface roughness of the as-prepared membranes.
The ζ potential of CT/GO suspensions with different CT contents
was tested by dynamic light scattering analysis (zeta sizer 3000HSA)
at room temperature. The CT/GO membranes were examined by X-ray photoelectron
spectroscopy (XPS, PerkinElmer PHI 5000C) using Al Kα as the
X-ray source. X-ray diffraction (XRD) patterns of the produced membranes
were measured by an XRD analyzer with Cu Kα radiation (Rigacu
Dmax-3C). The pure water contact angles (WCAs) of the surfaces of
CT/GO membranes with varied CT loadings were investigated by a sessile
drop analysis system (CAM200, KSV). The reported WCA for each sample
in this study was the average value from three random locations on
each sample.
7
Comprehensive Characterization of Sewage Sludge-Derived Nanomaterials
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Scanning electron microscopy (SEM; EDAX XL30, The Netherlands) was carried out to image the morphology of the as-synthesized sewage sludge-derived nanomaterials. Nitrogen sorption/desorption measurements were taken with an AUTOSORB-IQ instrument (Quantachrome Co., USA) to analyze the Brunauer-Emmett-Teller (BET) surface area and the pore size distribution of the nanomaterials. X-ray diffraction (XRD) patterns were measured (X’Pert PRO, Philips Co., The Netherlands) to determine the crystal structure of the nanomaterials. The Raman spectra were determined by a laser Raman spectrometer (SPEX/403, JY., France), with a 532 nm laser excitation. The surface electronic environment of the nanomaterials was investigated by X-ray photoelectron spectroscopy (XPS, PHI-5000C, Perkin-Elmer Co., USA). The composition of the as-synthesized carbon nanomaterials was measured via an energy-dispersive X-ray spectroscopy (EDX) system directly and an inductively coupled plasma spectrometry (ICP, Agilent 720ES, USA) after total digestion in a microwave using a mixture of HNO3 + HCl + HF. The contents of C, N, and O were also determined by an Elemental Analyzer system (vario EL III, GmbH, Germany).
8
Comprehensive Materials Characterization Protocol
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X-ray diffraction (XRD) was measured using Cu Kα radiation with the 2θ range from 5 to 80° at a scan rate of 5° min−1 on D/MAX2500PC. Raman spectra were recorded by Thermo Scientific™ DXR spectrometer operating at 532 nm. X-ray photoelectron spectroscopy (XPS) was evaluated by Perkin-Elmer PHI 5000C. The field-emission scanning electron microscopy (FE-SEM) was performed on JSM-7001F. The Ultraviolet-visible diffuse reflectance spectrophotometer (UV-vis DRS) on UV2450 from 200 to 800 nm with BaSO4 as reference standard. Photoluminescence (PL) emission measurements were carried out by a QuantaMaster™ 40 with an excitation wavelength of 420 nm. The electron spin resonance (ESR) measurements were recorded on a JES FA200 Spectrometer using the 5, 5-dimethyl-1-pyrroline-N-oxide (DMPO) as the radical capture reagent.
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