Transmission electron microscopy (TEM) (JEM 1400 plus, JEOL Ltd., Japan) and scanning electron microscopy (SEM) (JCM 5700, JEOL Ltd., Japan) was employed to determine the size, shape and morphology of ZnONPs. The study was conducted at the Departmental Laboratory of Applied Chemistry and Biochemistry, Kumamoto University, Japan.
Jcm 5700
Manufactured by JEOL
Sourced in Japan, United States
The JCM-5700 is a scanning electron microscope (SEM) developed by JEOL. It is designed for high-resolution imaging and analysis of a wide range of materials and samples. The JCM-5700 utilizes a tungsten filament electron source and offers a range of electron beam accelerating voltages up to 30 kV. It is equipped with secondary electron and backscattered electron detectors for surface topography and compositional imaging, respectively.
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Lab products found in correlation
E 1010, by Hitachi (2 mentions)
Jem 1400plus, by JEOL (1 mentions)
Jem 1400, by JEOL (1 mentions)
Jem 2100hr, by JEOL (1 mentions)
Usb4000, by OceanOptics (1 mentions)
X pert pro mpd pw3040 60 xrd, by Malvern Panalytical (1 mentions)
Fois 1, by OceanOptics (1 mentions)
K550x sputter coater, by Emitech (1 mentions)
Tissue tek oct compound, by Sakura Finetek (1 mentions)
Bz x700, by Keyence (1 mentions)
Glutaraldehyde, by Fujifilm (1 mentions)
Osmium tetroxide, by Fujifilm (1 mentions)
2800 ultrasonic cleaner, by Emerson (1 mentions)
Desk 5, by Denton (1 mentions)
Malvern zetasizer nano z, by Malvern Panalytical (1 mentions)
Glutaraldehyde solution, by Fujifilm (1 mentions)
Duh 211, by Shimadzu (1 mentions)
Ols3000, by Olympus (1 mentions)
Jed 2300, by JEOL (1 mentions)
Su 70, by Hitachi (1 mentions)
20 protocols using jcm 5700
1
Characterizing ZnONPs via TEM and SEM
2
Nanomaterial Surface Morphology Analysis
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The surface morphologies of nanomaterials were analyzed using SEM and transmission electron microscopy (TEM). Prior to the preparation of AVNP suspensions, the morphology of nanomaterials was observed using SEM (JEOL JCM-5700, Tokyo, Japan). All SEM samples were dried under vacuum and coated with 2–3 nm of gold using an Emitech SC7620 Sputter (Quorum Technologies, Laughton, UK) prior to the image acquisitions. All images were collected and processed using an in-built software within the instrument. TEM images of CuNP, AVNP2, CuONP, and ZnONP samples were acquired using a JEOL JEM-1400 instrument (Tokyo, Japan) operating at 200 kV (Supplementary Figures S6–S11 ). For this study, nanopowders were sonicated first in 1 mL of ethanol, and then two drops of the suspension were placed on 200 mesh copper grids with Formvar and carbon supports (Agar Scientific Ltd., Essex, UK). Each sample’s excess solvent was removed under reduced pressure (10 mmHg) prior to TEM image acquisition.
3
Characterizing Metal Nanoparticle Morphology
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The morphology of intermetallic copper-silver and copper-zinc nanoparticles was assessed using scanning electron microscopy (SEM). Nanopowder (2 mg) was secured onto a carbon-based adhesive substrate and positioned on a specimen stage; both samples were subjected to alternate vacuum-argon environment prior to sputter-coating with 20-nm nanogold using an Emitech SC7620 coater (Quorum Technologies, Ltd., East Sussex, UK). All SEM analyses were acquired using a JEOL JCM-5700 (JEOL Ltd., Welwyn Garden City, UK) instrument and images were collected using the built-in software with an accelerating voltage of 20 kV. Adobe® Lightroom CC (Adobe Inc., CA, USA) was used to improve contrast and quality of images.
4
Morphological Characterization of Samples
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Morphologies of samples were characterized in a SEM system (JEOL JCM-5700, Tokyo, Japan), and by using an optical microscope (MA 2002, Chongqing Optical & Electrical Instrument Co.). High (atomic)-resolution transmission electron microscopy images were obtained using the transmission electron microscope (JEOL JEM-2100HR, Japan) operating at an acceleration voltage of 200 kV. AFM image and height profile was obtained with the AFM (Cypher, Asylum Research, USA) in a.c. mode.
5
Surface Characterization of Compounds
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The surface characteristics of ATC, GluN, NIC, as well as the cocrystals and their respective physical mixtures were studied by SEM (Jeol JCM-5700, Japan). Powder samples were mounted onto stubs using double sided carbon adhesive tape and sputter coated with a thin layer of gold. The specimens were scanned with an electron beam of acceleration potential of 10 kV with a working distance (12-14 mm).
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The surface characteristics of ATC, GluN, NIC, as well as the cocrystals and their respective physical mixtures were studied by SEM (Jeol JCM-5700, Japan). Powder samples were mounted onto stubs using double sided carbon adhesive tape and sputter coated with a thin layer of gold. The specimens were scanned with an electron beam of acceleration potential of 10 kV with a working distance (12-14 mm).
6
Comprehensive Material Characterization of Solar Cells
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The morphologies of samples were characterized by a commercial SEM system (JEOL JCM-5700, Tokyo, Japan). We used an X-ray diffraction system (PANanalytical, X`Pert-Pro MPD PW 3040/60 XRD with Cu-Kα1 radiation, the Netherlands) to do material analysis. The dark and illuminated I-V measurements of the solar cells were done with the solar simulator (Oriel Newport, USA). Both evaporations were done in thermal vacuum evaporations system (SKY Vacuum Technology Company, China). The reflectance was measured by employing the fiber optic spectrometer (Ocean Optics, USB 4000) and the integration sphere (Ocean Optics, FOIS-1). Silver NP area coverage was calculated by analyzing the SEM images via Photoshop CS5 software.
7
Imaging Nanoparticle Distribution via SEM
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A scanning electron microscope (SEM, JCM-5700; JEOL, Tokyo, Japan) was used to observe the distribution of NPs in the sample spot.
8
Particle Size and Morphology Analysis
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Particle size distribution (volume-based) was determined with Horiba Partica LA-950 S2. Particles were dispersed in 99.8% ethanol for UV/VIS spectroscopy and sonicated for 10 min before measurement to break down any temporary aggregates. Mean size and span defined as (D90 − D10)/D50) were calculated to describe the PSD of prepared samples.
Particle surface morphology and shape were examined with a scanning electron microscope (SEM) Jeol JCM-5700 using an accelerating voltage of 5 kV. Before the measurement, samples were attached to aluminium stubs with a conductive carbon double-sided adhesive tape and sputter coated with a gold layer with the Emitech K550X sputter-coater at a current of 25 mA for 3 min.
Particle surface morphology and shape were examined with a scanning electron microscope (SEM) Jeol JCM-5700 using an accelerating voltage of 5 kV. Before the measurement, samples were attached to aluminium stubs with a conductive carbon double-sided adhesive tape and sputter coated with a gold layer with the Emitech K550X sputter-coater at a current of 25 mA for 3 min.
9
Disruption of Melanosomes via Picosecond Laser
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The morphologies of unirradiated melanosomes and melanosomes irradiated with picosecond laser pulses were observed using a SEM (JCM‐5700; JEOL, Tokyo, Japan) to confirm their disruption. Laser irradiation was applied at a pulse width of 550 picoseconds and a fluence of 5.25 J/cm2 because it was inferred that melanosomes could be disrupted and clearly observed under this irradiation condition from Figure 2 . The melanosomes were dried and platinum‐coated to 5 nm using an ion‐sputtering system (E‐1010; Hitachi, Tokyo, Japan) to increase the electrical conductivity. The long axes of the melanosomes in the scanning electron micrographs were measured using an image processing software, ImageJ (National Institute of Health, Bethesda, MD).
10
Observation of Parachlorella Cells
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Parachlorella cells on a solid surface were observed under a scanning electron microscope (SEM) (JCM-5700; JEOL Ltd., Tokyo, Japan). For observation of cross sections, fragments of the solid phase were embedded in Tissue-Tek O.C.T. compound (Sakura Finetek USA Inc., Torrance, California, USA), and then frozen in liquid nitrogen. The solid phase was cut to a thickness of 20 μm with a cryostat microtome (HM500; Microm International, Walldorf, Germany), and the cross sections were immediately observed under a fluorescence microscope (BZ-X700; Keyence, Japan).
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Parachlorella cells on a solid surface were observed under a scanning electron microscope (SEM) (JCM-5700; JEOL Ltd., Tokyo, Japan). For observation of cross sections, fragments of the solid phase were embedded in Tissue-Tek O.C.T. compound (Sakura Finetek USA Inc., Torrance, California, USA), and then frozen in liquid nitrogen. The solid phase was cut to a thickness of 20 μm with a cryostat microtome (HM500; Microm International, Walldorf, Germany), and the cross sections were immediately observed under a fluorescence microscope (BZ-X700; Keyence, Japan).
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