Ntegra prima afm

Atomic force microscopy (NTEGRA PRIMA AFM by NT-MDT Spectrum Instruments, Großhansdorf, Germany) was used to evaluate the size distribution of INU-Cys-TC micelles. Samples (0.1 mg L⁻¹, 20 μL) were deposited on the MICA substrate and dried in vacuum (10 mbar). The analysis was performed in non-contact modality, using a triangular probe (resonance frequency = 1400 kHz, tip radius = 5 nm). AFM images were processed by using Gwyddion Software.

Research of structural and morphological features of the bitumen and MB sample’s surface was carried out on an NtegraPrima AFM (NT-MDT Spectrum Instruments, LLC; Moscow, Russia) in a semicontact mode. AFM topography and phase imaging were obtained at room temperature at a scanning speed of 0.6÷1 Hz. Gold-plated silicon cantilevers were used (rounding radius 10 nm; resonance frequency 150÷240 kHz).

The roughness changes after the treatment were measured using atomic force microscope AFM NTEGRA Prima (NT-MDT, Moscow, Russia) in a semi-contact mode using golden-silicon probes AN-NSG10 (Applied NanoStructures Inc., Mountain View, CA, USA) with a typical force constant of 11.8 N/m and typical resonant frequency of 240 kHz. The Root Mean Square (RMS) and Average roughness were estimated from 100–400 μm² with a resolution of 512 × 512 px² and a scanning frequency of up to 1 Hz.
The morphology changes were observed by scanning electron microscope SEM Mira3 (Tescan, Brno, Czech Republic). The detector of secondary electrons and accelerating voltage of 7–10 kV were used to magnify the surfaces up to 50,000 times. Before measurement, both substrates were coated with 20 nm of the Au/Pd layer by sputter coater Quorum Q150R-ES (Quorum Technologies, Lewes, UK).

Cell images were obtained using an AFM NTEGRA Prima (NT-MDT Spectrum Instruments, Russian Federation) in tapping mode. Cantilevers NSG01 (TipsNano, Estonia) were used with the manufacturer-provided parameters: a tip radius of 10 nm, resonance frequency of 87-230 kHz, and force constant of 5 N/m. The number of scan points was 512 or 1024 in each line of the image. The scanning fields were from 100 × 100 μm² to 10 × 10 μm².

Deposited films were imaged with scanning electron microscope (SEM) MIRA3 (TESCAN, Brno, Czech Republic) with a Schottky field emission electron gun equipped with secondary electron and back-scattered electron detectors as well as a characteristic X-ray detector (EDX) analyzer (Oxford Instruments, High Wycombe, UK). The IR spectra of deposited films were measured by FTIR spectrometer Alpha (Bruker, Billerica, MA, USA) using a single reflection ATR module Platinum. The total surface free energy of the films was determined from measurements of contact angles between testing liquids and the film surfaces using a sessile-drop technique. Acid-base theory was used for the calculation of total surface free energy. Atomic Force Microscope (AFM) Ntegra Prima (NT-MDT, Apeldoorn, The Netherlands) was used to study the surface topography of the POx films. The measurements were performed in semicontact mode on $10\times 10$
$\mathsf{\mu }$ m ${}^2$ and $5\times 5$
$\mathsf{\mu }$ m ${}^2$ areas of each coating with a scanning rate of 0.5 Hz. The 3D roughness parameters of the thin films were evaluated according to the ASME B46 standard using the NovaPx software (NT-MDT). The film thickness was measured using a Dektak XT (Bruker, Tucson, AZ, USA) mechanical profilometer.