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Inspect f microscope

Manufactured by Thermo Fisher Scientific
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The Inspect F microscope is a high-resolution scanning electron microscope (SEM) designed for materials analysis and characterization. It provides detailed images and data on the surface structure and composition of a wide range of samples.

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Quanta Inspect F Scanning Electron Microscope Inspect™ F scanning electron microscope QUANTA INSPECT F electron microscope Inspect F Inspect microscope

2 protocols using inspect f microscope

1

FE-SEM Analysis of Quartz Particles

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FE-SEM with an Inspect F microscope (FEI) was used. Dry quartz particles were deposited on conductive stubs and coated with gold to prevent the electron beam from charging the sample. The operating conditions were: HV 20 kV, WD 10–15 mm.
Pavan C., Santalucia R., Leinardi R., Fabbiani M., Yakoub Y., Uwambayinema F., Ugliengo P., Tomatis M., Martra G., Turci F., Lison D, & Fubini B. (2020). Nearly free surface silanols are the critical molecular moieties that initiate the toxicity of silica particles. Proceedings of the National Academy of Sciences of the United States of America, 117(45), 27836-27846.
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2

Optical Characterization of VO2 Polymorphs

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XRD measurements
were performed using a Bruker-AXS D8 (GADDS) diffractometer. SEM was
carried out using a FEI Inspect F microscope with a field emission
gun. Raman spectroscopy was performed using an inVia confocal Raman
microscope with laser power set to 1% to avoid sample heating. Optical
constants of all materials used were measured using a Semilab SE-2000
spectroscopic ellipsometer (see Supporting Information). The optical constants for VO2(M) and VO2(R) were measured at room temperature and at 90 °C, respectively.
Sol C., Portnoi M., Li T., Gurunatha K.L., Schläfer J., Guldin S., Parkin I.P, & Papakonstantinou I. (2020). High-Performance Planar Thin Film Thermochromic Window via Dynamic Optical Impedance Matching. ACS Applied Materials & Interfaces, 12(7), 8140-8145.
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