Nsc10
The NSC10 is a cantilever probe designed for use in atomic force microscopy (AFM) applications. It features a silicon nitride cantilever with a silicon tip, providing high-resolution imaging capabilities. The probe is suitable for a range of sample materials and scanning modes.
Lab products found in correlation
3 protocols using nsc10
Duodenoscope Surface Biofilm Imaging
Duodenoscope Surface Analysis with AFM
Duodenoscope Polymer Structural Changes
The images collected from the surface of duodenoscope samples and controls were recorded in air, in tapping mode, using NTEGRA Spectra (NT-MDT, Moscow, Russia) instrument with 3.1–37.6 N/m force constant cantilever of a silicon nitride cantilever (NSC10; NT-MDT). The roughness average values for the controls and PAW-treated samples were determined from three AFM images (scanned surface 10 × 10 μm) using free data analysis software Gwyddion (version 2.20,
The surface morphology of the controls and treated samples was investigated using a scanning electron microscope (Quanta200; FEI Company, Hillsboro, OR, USA) at 20 kV with low-vacuum secondary electron (LFD) detector. In order to obtain the elemental information, EDX analysis using a silicon drift detector was performed on both controls and samples.
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