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2011 microscope

Manufactured by JEOL
Sourced in Japan

The JEOL 2011 is a high-performance transmission electron microscope (TEM) designed for analytical and imaging applications. It features a LaB6 electron source and advanced optics, providing high-resolution imaging capabilities. The JEOL 2011 is capable of magnifying specimens up to 1.5 million times and can operate at accelerating voltages up to 200 kV.

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3 protocols using 2011 microscope

1

Characterization and Evaluation of Bevacizumab-Loaded Mesoporous Silica Nanoparticles

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The morphology, particle size, and particle size distribution of MSNs were observed by transmission electron microscopy (200 kV; JEOL 2011 microscope; JEOL, Tokyo, Japan). Zeta potential of nanoparticles was detected in deionized water by the Zetasizer (Malvern Instruments, Malvern, UK). The Brunauer–Emmett–Teller method was used to calculate the specific surface areas using adsorption data in a relative pressure (P/P0) ranging from 0.04 to 0.1. The Barrett–Joyner–Halenda method was used to calculate the pore size distribution and pore volume, which was derived from the adsorption branches of the isotherms. Fourier transform infrared (FTIR) was used to confirm the surface modifications of MSNs by –NH2 and Polyethylene glycol (PEG) groups and drug loading, respectively. FTIR measurements were performed on a Nicolet 6700 spectrometer (Thermo Fisher Scientific, Waltham, MA, USA) using KBr disk at a resolution of 4 cm−1 in the frequency interval of 500–4,000 cm−1.
Encapsulation efficiency and drug loading efficiency were calculated by the following equations. BEV indicates bevacizumab.
Encapsulation efficiency (%)=Amount of BEV encapsulatedTotal BEV added×100
Drug-loading efficiency (%)=Amount of BEV encapsulatedTotal weight of MSNs×100
Amount of BEV encapsulated=Total BEV addedFree BEV in supernatant
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2

Characterization of Fe3O4@PDA@Cu-MOFs

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Transmission electron microscopy (TEM) was applied to characterise the morphology using a JEOL 2011 microscope (JEOL, Japan) at 200 kV. Scanning electronic microscopy (SEM) was performed using a Philips XL30 electron microscope (Netherlands) at 20 kV. Fourier transform infrared (FT-IR) spectra were collected on a Nicolet Fourier spectrophotometer (USA) using KBr pellets. Powder X-ray diffraction (XRD) was used to observe the composition and crystallisation of Fe3O4@PDA@Cu-MOFs using a Bruker D4 X-ray diffractometer with Ni-filtered Cu Kα radiation (40 kV, 40 mA) (Germany). Nitrogen adsorption–desorption isotherms were performed on a Micromeritics Tristar 3000 analyser (USA) at 77 K. The Brunauer–Emmett–Teller (BET) method was applied to calculate the specific surface area of the sample. X-ray photoelectron spectra (XPS) were collected on an RBD 147 upgraded PHI 5000C ESCA system with a dual X-ray source (Shimadzu Corp). A Mg Kα (1253.6 eV) anode and a hemispherical energy analyser were used in the measurement. All the binding energies were referenced to the 1s peak at 284.8 eV of the surface adventitious carbon.
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3

Graphene Foam Synthesis via Phytic Acid

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Graphene foam (GF) was prepared by using phytic acid as the gelator and dopant and Graphene oxide (GO) was employed as the precursor, as reported by Chen et al.24 Briefly, 0.5 mL of PA was added into 15 mL of GO (2 mg/mL, aqueous solution) and sonicated for 40 min at room temperature. Then, the mixture was sealed in a 25-mL Teflon-lined autoclave tube and maintained at 180 °C for 12 h. Subsequently, the solid precipitate formed from the reaction was collected by tweezer after the autoclave tube was naturally cooled to room temperature. The product was washed by ethanol and water, and then freeze-dried for 24 h to obtain the desired final product, GF.
Transmission electron microscopy (TEM) images were directly taken with a JEOL 2011 microscope operated at 200 kV (JEOL, Tokyo, Japan). Samples were suspended in ethanol and spotted on a carbon-coated copper grid. The infrared spectra were obtained by using a FTIR 360 manufactured by Ni-colet (Thermofisher, USA). X-ray photoelectron spectroscopy (XPS) data were collected by an X-ray photoelectron spectrometer (PerkinElmer PHI 5000C ESCA System) equipped with Mg Kα radiation. Raman spectra were taken by a Labram-1B Raman spectrometer from Yobin Yvon with a laser (2 mW) excitation wavelength of 632.8 nm.
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