Branch tips of eight New Zealand hornerid species were examined using SEM (Table 1 ). Cuticle and soft tissues were first removed from colonies using bleach solution (31.5 g L−1 sodium hypochlorite) for 12 or more hours, followed by freshwater rinses and drying. Samples were sputter coated with gold–palladium and scanned with a JEOL 6700F FE‐SEM at the Microscale and Nanoscale Imaging unit (OMNI), Department of Anatomy, University of Otago.
6700f fe sem
Manufactured by JEOL
The 6700F FE‐SEM is a Field Emission Scanning Electron Microscope manufactured by JEOL. It is designed to provide high-resolution imaging of samples by utilizing a field emission electron source. The 6700F FE‐SEM is capable of generating and focusing an electron beam to examine the surface of samples at the nanometer scale.
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Lab products found in correlation
2 protocols using 6700f fe sem
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SEM Analysis of NZ Hornerid Species
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Characterization of Perovskite Photovoltaic Devices
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The UV-Vis absorption and transmission spectra of samples were measured by Princeton Instrument Acton 2150 spectrophotometer with a Xe lamp as a light source. The steady-state PL emission of the perovskite layer was measured using a He-Cd laser with double excitation wavelengths at 325/442 nm. The top-view and cross section SEM images of WO3 nanostructures and perovskite devices were obtained using JEOL 6700F FE-SEM. The surface morphology and roughness were obtained using a Bruker Innova AFM with tapping mode. The XRD patterns of samples were obtained using an X'Pert3 Powder X-ray Diffractometer, PANalytical Inc. with Cu-Kα radiation. The external quantum efficiency (EQE) measurement was conducted using a PV Measurements QEX10 instrument. The current density-voltage (J-V) curves of perovskite devices were performed using a Keithley 2400 digital sourcemeter under the sunlight simulator (Xenon Short Arc Lamp, USHIO UXL-10S) with irradiation intensity of 100 mW/cm2. The perovskite devices were masked with a metal aperture to define the active area of 4 mm2.
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