TEM images were taken on JEM-2100F with an accelerating voltage of 200 kV equipped with an energy-dispersive spectroscopy analyzer. Powder X-ray diffraction (XRD) patterns were recorded on a Rigaku X-ray diffractometer using Cu Kα radiation (λ = 1.5418 Å). UV–vis diffused reflectance spectra of the samples were obtained from UV–vis–NIR spectrophotometer (Shimadzu-3600). XPS was performed on a Thermo ESCA LAB 250 system with MgKα source (1254.6 eV). The binding energies were calibrated using C 1s peak at 284.6 eV as standard. Raman spectra was measured at room temperature equipped with an Ar laser working at wavelengths of 532 nm (LabRAM HR Evolution, Horiba). The PL measurement was carried out on the FLS920 (Edinburgh Instrument) at room temperature using the excitation wavelength of 390 nm.
Escalab 250 system
Manufactured by Thermo Fisher Scientific
Sourced in United Kingdom
The ESCALAB 250 system is a high-performance X-ray photoelectron spectroscopy (XPS) instrument designed for materials analysis. It provides comprehensive surface characterization capabilities, including element identification, chemical state analysis, and depth profiling. The system features advanced data acquisition and processing capabilities to support a wide range of research and industrial applications.
Automatically generated - may contain errors
Lab products found in correlation
Supra 55, by Zeiss (2 mentions)
Jem 2100, by JEOL (2 mentions)
Labram hr evolution, by Horiba (1 mentions)
X ray diffractometer, by Rigaku (1 mentions)
Invia reflex raman spectrometer, by Renishaw (1 mentions)
Tristar 2 3020, by Micromeritics (1 mentions)
D8 focus diffractometer, by Bruker (1 mentions)
2100f electron microscope, by JEOL (1 mentions)
D8 advance, by Bruker (1 mentions)
Optima 5300 dv, by PerkinElmer (1 mentions)
U 3900, by Hitachi (1 mentions)
X pert system, by Philips (1 mentions)
Tecnai g2 20 microscope, by Philips (1 mentions)
Labram aramis raman spectrometer, by Horiba (1 mentions)
Xrd 6000, by Shimadzu (1 mentions)
Tristar 2 3020 instrument, by Micromeritics (1 mentions)
System 2000, by PerkinElmer (1 mentions)
Supra 40, by Zeiss (1 mentions)
Empyrean diffractometer, by Malvern Panalytical (1 mentions)
Hr4000, by OceanOptics (1 mentions)
14 protocols using escalab 250 system
1
Characterization of Nanomaterials by Advanced Techniques
2
Raman and XPS Analysis of VO2/TiO2 Films
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Raman spectra of VO2/TiO2 films (Sample D) were studied using Renishaw inVia Reflex Raman spectrometer with a spectral resolution better than 1 cm−1. The samples were excited by the light of the Ar+ laser at 514 nm with a power density less than using ×50 long focal distance objective (NA = 0.5). Raman scattering was collected in the backward direction. Crossed polarizers were not used. The incident laser power was minimized to avoid local sample heating.
X-ray photoelectron spectroscopy (XPS) experiments were carried out using Thermo Scientific ESCALAB 250 system with a monochromatic Al-Kα X-ray source. The energy resolution is 0.6 eV, as found from the observation of the Ag 3d5/2 line. The sample was exposed with an X-ray beam 500 microns in diameter. The binding energies were obtained using a calibration line of C 1 s at 285.0 eV.
X-ray photoelectron spectroscopy (XPS) experiments were carried out using Thermo Scientific ESCALAB 250 system with a monochromatic Al-Kα X-ray source. The energy resolution is 0.6 eV, as found from the observation of the Ag 3d5/2 line. The sample was exposed with an X-ray beam 500 microns in diameter. The binding energies were obtained using a calibration line of C 1 s at 285.0 eV.
3
Catalyst Characterization Techniques
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The morphologies
of the catalysts were observed using scanning electron microscopy
(SEM) equipped with a Nova Nano S. Transmission electron microscopy
(TEM) was performed using a JEOL model 2100 LaB6 instrument, operating
at 200 kV. The specimens were dispersed ultrasonically in ethanol
and then deposited dropwise onto 3 mm lacey carbon grids supplied
by Agar.
Powder X-ray diffraction (XRD) data were collected
using a Bruker D8 ADVANCE X-ray diffractometer operating with Cu Kα
radiation and equipped with a VÅNTEC-1 solid-state detector.
Energy dispersive spectrometer (EDS) was utilized to confirm the composition
using a TEAMApollo system. XPS was performed using a Thermo ESCALAB
250 system. The radiation used was monochromatized using Al Kα
radiation with a 650 μm spot size. The XAS data at the Ir LIII-edge of the samples, which were mixed with LiF to reach
50 mg, were recorded at room temperature in transmission mode using
ion chambers using the BL14W1 beam line of the Shanghai Synchrotron
Radiation Facility, China.
of the catalysts were observed using scanning electron microscopy
(SEM) equipped with a Nova Nano S. Transmission electron microscopy
(TEM) was performed using a JEOL model 2100 LaB6 instrument, operating
at 200 kV. The specimens were dispersed ultrasonically in ethanol
and then deposited dropwise onto 3 mm lacey carbon grids supplied
by Agar.
Powder X-ray diffraction (XRD) data were collected
using a Bruker D8 ADVANCE X-ray diffractometer operating with Cu Kα
radiation and equipped with a VÅNTEC-1 solid-state detector.
Energy dispersive spectrometer (EDS) was utilized to confirm the composition
using a TEAMApollo system. XPS was performed using a Thermo ESCALAB
250 system. The radiation used was monochromatized using Al Kα
radiation with a 650 μm spot size. The XAS data at the Ir LIII-edge of the samples, which were mixed with LiF to reach
50 mg, were recorded at room temperature in transmission mode using
ion chambers using the BL14W1 beam line of the Shanghai Synchrotron
Radiation Facility, China.
4
Comprehensive Structural Characterization of Edg-MoS2/C Hybrids
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The crystal structures of the samples were determined using powder X-ray diffractometry (XRD) measurements on a Bruker/D8 Focus diffractometer (Germany). Cu Kα X-rays (λ = 1.5405 Å) were generated at 40.0 kV and 40 mA, and reflections were recorded in the 2θ range of 5°–80° at a scan speed of 6° min−1. N2 adsorption–deposition isotherms were collected with a Micromeritics TriStar II 3020 system mode at 77 K. All the samples were degassed at 100 °C for 15 h under flowing N2 before measurement. Field-emission scanning electron microscopy (FE-SEM) images and transmission electron microscopy (TEM) images were obtained using a Hitachi S4800 electron microscope (Japan) and a JEOL-2100F electron microscope (Japan), respectively. X-ray photoelectron spectroscopy (XPS) measurements were conducted on a Thermo Escalab 250 system. Raman spectra were measured with an excitation laser wavelength of 514.5 nm at room temperature using a LabRAM HR. Thermogravimetric (TG) analyses of the Edg-MoS2/C HMs and the CNT/S composite were performed in a PerkinElmer (TA Instruments) up to 650 °C at a heating rate of 10 °C min−1 in air and N2, respectively.
5
Characterizing Nanostructure Composition and Surface
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The crystal structure was
analyzed using a X-ray diffractometer ( Bruker D-8 ADVANCE) with Cu
Kα operated at 40 kV and 30 mA in the range of 10–70°.
The surface morphologies were analyzed using FE-SEM (Zeiss SUPRA 25)
and FE-TEM (Talos F200X). Surface binding states and elemental compositional
analysis were characterized by XPS using a Thermo Fisher Scientific
(UK) ESCALAB 250 system with monochromatic Al Kα radiation at
1486.6 eV and with an electron take-off angle of 45°. The chamber
pressure was kept at 10–10 Torr during the measurement.
The survey spectrum was scanned in the binding energy (BE) range of
100–1200 eV in scan steps of 1 eV and were calibrated using
a fixed core-level peak of adventitious carbon (C 1s) at 284.6 eV
as a reference. Peak fitting and quantitative analysis were done using
the CasaXPS program (Casa Software Ltd), and the results were justified
using an average matrix relative sensitivity factor with respect to
the peak area and atomic sensitivity factor of the identified components.
We used the lowest possible number of components to fit the data satisfactorily,
and the uncertainty in the BE position was within 0.05 eV for a component.
analyzed using a X-ray diffractometer ( Bruker D-8 ADVANCE) with Cu
Kα operated at 40 kV and 30 mA in the range of 10–70°.
The surface morphologies were analyzed using FE-SEM (Zeiss SUPRA 25)
and FE-TEM (Talos F200X). Surface binding states and elemental compositional
analysis were characterized by XPS using a Thermo Fisher Scientific
(UK) ESCALAB 250 system with monochromatic Al Kα radiation at
1486.6 eV and with an electron take-off angle of 45°. The chamber
pressure was kept at 10–10 Torr during the measurement.
The survey spectrum was scanned in the binding energy (BE) range of
100–1200 eV in scan steps of 1 eV and were calibrated using
a fixed core-level peak of adventitious carbon (C 1s) at 284.6 eV
as a reference. Peak fitting and quantitative analysis were done using
the CasaXPS program (Casa Software Ltd), and the results were justified
using an average matrix relative sensitivity factor with respect to
the peak area and atomic sensitivity factor of the identified components.
We used the lowest possible number of components to fit the data satisfactorily,
and the uncertainty in the BE position was within 0.05 eV for a component.
6
Nanomaterial Characterization Techniques
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SEM images were obtained on an FESEM Hitachi S4800 microscope. TEM imaging was carried out on an FEI Tecnai G2 20 microscope operating at 200 kV. XRD patterns were acquired on Philips X’ Pert system equipped with Cu K α radiation (λ = 1.5419 Å, scanning rate = 1.0°/min). The HRTEM were taken on Tecnai G2 20 S-TWIN operated at 200 kV accelerating voltage. XPS was measured on a Thermo ESCALAB 250 system. The extinction spectra of the Au NCs were acquired on a Hitachi U-3900 with cuvettes with a 0.5-cm optical path length. ICP-AES was conducted by Optima 5300 DV (Perkin Elmer).
7
X-ray Photoelectron Spectroscopy of Surface Chemistry
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XPS spectra were obtained
using a Thermo Electron Co ESCA Lab 250 system in ultra high vacuum.
The chamber pressure was maintained lower than 10–9 mbar during data acquisition. Two sets of samples were irradiated
by a monochromatic Al Kα X-ray beam (1486.7 eV) with a diameter
of about 0.5 mm in two different regions. Survey and detailed scans
were obtained in Large Area XL magnetic lens mode with a pass energy
of 150 and 20 eV, respectively. The spectra were obtained with an
electron take off angle of 90°.
Spectra were analyzed with
the CasaXPS software, and all spectra were corrected by shifting the
C 1s peak to 285.0 eV to compensate for residual charge on the surface.
We note that the binding energies (BE) of uncorrected C 1s peaks were
between 284.95 and 285.13 eV, except for one of the spots on the MUD:OEG
0.1% sample (BE of 285.49 eV).
For quantitative analysis of
the XPS spectra, a 70–30% Gaussian–Lorentzian
peak shape was used. The background was removed using a Shirley function
for both Au 4f and C 1s peaks, while a linear function was used for
the S 2p and O 1s.
using a Thermo Electron Co ESCA Lab 250 system in ultra high vacuum.
The chamber pressure was maintained lower than 10–9 mbar during data acquisition. Two sets of samples were irradiated
by a monochromatic Al Kα X-ray beam (1486.7 eV) with a diameter
of about 0.5 mm in two different regions. Survey and detailed scans
were obtained in Large Area XL magnetic lens mode with a pass energy
of 150 and 20 eV, respectively. The spectra were obtained with an
electron take off angle of 90°.
Spectra were analyzed with
the CasaXPS software, and all spectra were corrected by shifting the
C 1s peak to 285.0 eV to compensate for residual charge on the surface.
We note that the binding energies (BE) of uncorrected C 1s peaks were
between 284.95 and 285.13 eV, except for one of the spots on the MUD:OEG
0.1% sample (BE of 285.49 eV).
For quantitative analysis of
the XPS spectra, a 70–30% Gaussian–Lorentzian
peak shape was used. The background was removed using a Shirley function
for both Au 4f and C 1s peaks, while a linear function was used for
the S 2p and O 1s.
8
Comprehensive Materials Characterization
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The morphologies and structures of materials were examined by using scanning electron microscopy (SEM) (Zeiss SUPRA 55), transmission electron microscopy (TEM) (Hitachi 800), and high-resolution TEM (HRTEM) (JEOL JEM-2100). Chemical compositions were determined by elemental analysis (vario EL cube V2.0.1). An ESCALAB 250 system (Thermo Electron) was used to collect X-ray photoelectron spectroscopy (XPS) data with Al Kα 300 W radiation. Powder X-ray diffraction (XRD) data were collected with a Shimadzu XRD-6000 diffractometer using monochromatic Cu Kα radiation (λ = 0.15418 nm) at 40 kV. Raman spectra were recorded on a Lab RAM ARAMIS Raman Spectrometer (HORIBA Jobin Yvon) and 633 nm laser acted as an excitation source. The N content was determined by Energy Dispersive Spectrometer (EDS). The loading value of Co was measured by using inductively coupled plasma-atom emission spectroscopy (ICP).
9
Advanced Characterization of Novel Material
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SEM (Zeiss SUPRA 55, accelerating voltage at 20 kV) and HRTEM (JEOL JEM-2100, accelerating voltage at 200 kV) were used to characterize structure and morphology of the material. X-ray powder diffraction patterns were recorded using an X-ray diffractometer (XRD, Shimadzu XRD-6000, Cu Kα source, λ = 1.5418 Å). Raman spectra were performed using a HORIBA Jobin Yvon system with a 532 nm excitation laser. BET measurements were conducted on a Micromeritics Tristar II 3020 instrument. XPS spectra were carried out using a Thermo Electron ESCALAB 250 system. The UV-Vis spectroscopy was obtained by using a UV-2600 spectrophotometer from 750 nm to 200 nm with a scan rate of 30 nm min−1. A STA 449 F3 type machine (NETZSCH) was used to carry out thermogravimetric (TG) analysis.
10
Plasma Effects on Treatment Bags
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For the purpose of the effect of the plasma on the treatment bags, two different analysis level have been carried out. First, Fourier Transform Infrared (FTIR) measurements were collected to determine if a chemical reaction of the plasma exposed bags had taken place. Chemical changes produced at the surface after plasma treatment were studied using FTIR with Attenuated Total Reflectance (ATR) accessory. FTIR spectra were recorded with Perkin–Elmer System 2000, in the 4000–500 cm-1 wave-number range with 10 scans at a resolution of 2 cm-1. Second, X-ray Photoelectron Spectrometry (XPS) analysis was utilized to determine the changes of the chemical composition at the internal surfaces of the sealed bag using the ESCALAB 250 system (Thermo-VG Scientific Co., Ltd., England). The X-ray source was Al Kα (15 kV) at an operating power of 150 W and a 500 μm in spot size.
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