100cxii
The JEOL-100CXII is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of materials at the nanoscale. It features a 100 kV electron beam and advanced optical systems for optimized performance. The JEOL-100CXII provides users with the capability to visualize and characterize a wide range of samples with precision and accuracy.
Lab products found in correlation
86 protocols using 100cxii
Scanning Electron Microscopy of Pollen Grains
Ultrastructural Analysis of Earthworm Tissues
Intracellular TEM Analysis of EGFP-H1299 Cells
Characterizing SNP Nanoparticles by TEM
Ultrastructure Visualization of Organelles
Visualization of T6SS in Francisella
TEM Imaging of Transethosomal Vesicles
Exosome Visualization via Negative Staining
Electron Microscopy Sample Preparation
KSHV Infection Kinetics in HMVEC-d Cells
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