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22 protocols using cm200 microscope

1

Characterizing Catalysts by XRD, TEM, and TPD

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XRD patterns of the catalysts were obtained with a XRD-700 X-ray diffractometer in the 2 theta ranges of 0.5–70° (Rigaku Co.) by using Cu Ka radiation combined with a Ni filter. The N2 adsorption-desorption isotherms were measured at −196 °C with a Auto Chemisty 2010 instrument. Transmission electron microscopy (TEM) micrographs were collected on a Philips CM200 microscope. NH3-TPD patterns were recorded on a RC-IR-TP-3030 (Science and Technology Development Co. Ltd., China) to detect surface acidity of the molecular sieves. TPD of NH3 experiments were performed using 100 mg samples. After pretreatment in He environment at 400 °C for 1 h, samples were cooled to room temperature and then saturated with anhydrous NH3 (4% in He) at a flow rate of 30 ml/min for about 30 min. Desorption was carried out by heating the samples in He environment (40 ml/min) from 100 °C to 800 °C with a heating rate of 5 °C/min.
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2

Purification and Characterization of Pseudovirus

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VSVΔG/GFP-G* or VSVΔG/GFP-Gα* pseudovirus was purified through a sucrose cushion as described before. Virus was prepared as described before [39] (link). Briefly, pelleted virus was resuspended in 50 mM Tris-HCl, pH 7.5 with 100 mM NaCl buffer or in 50 mM MOPS, pH 6.6 with 100 mM NaCl buffer. The pH 6.6 dissolved virus was incubated for 15 min at 37°C and subsequently dialyzed at room temperature against 50 mM MOPS, pH 5.5 with 100 mM NaCl buffer for 30 min. The virus preps (pH 7.5 and pH 5.5) were adsorbed onto a discharged carbon film and subjected to negative staining (2% uranyl acetate solution). Probes were analyzed with a Philips CM200 microscope at 100 kV.
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3

TEM Thin Foil Preparation Protocol

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Thin foils for transmission electron microscopy (TEM) metallography were extracted from the crept sample heads. The samples were prepared by mechanical grinding and polishing to a thickness of ~ 110 µm, followed by dual-surface dimpling to a thickness of ~ 30 µm and finally ion-milled to electron transparency using a Gatan© (Gatan Inc., Pleasanton, CA, USA) PIPS working at 8 keV (incident beam angle progressively reducing to 8°, 6°, and 4°). TEM analyses were performed using a Philips™ (Philips It, Milan, Italy) CM-200 microscope working at 200 kV and equipped with a double-tilt LN-cooled specimen holder. Selected area diffraction patterns (SAEDP) were recorded using a converged beam. Converged electron beam diffraction (CBED) was used to measure the thin foil thickness, tTEM, in the surrounding areas of detected phase particles. This was performed by analysing the corresponding diffracted beam intensity variation under dual beam conditions. Thence, linear interpolation of data points in a S2/nfringes2 vs. nfringes−2, where S is the fringes spacing, and nfringes the number of counted fringes, was used to determine tTEM.
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4

Scanning and Transmission Electron Microscopy

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Scanning Electron Microscopy (SEM) observations were carried out by a Zeiss Supra 40 field emission scanning electron microscope (SEM) equipped with a Bruker Z200 EDX microanalysis.
Transmission Electron Microscopy (TEM) analysis was performed by using a Philips CM200 microscope operating at 200 kV and equipped with a LaB6 filament. Samples for TEM observations were prepared by depositing the polycorannulene film on a commercial TEM grid covered with a thin carbon film following the procedures as reported in the ESI.All details concerning other characterization methods used in this work are reported in the ESI.
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5

Structural Analysis of Negative Stain hGINS

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Images of negative stain hGINS were taken on a Philips CM200 microscope at a nominal defocus range of 3 to 1 μm and at a magnification of 50,000×, resulting in a pixel size of 2 Å/pixel. Frames were CTF corrected, binned by a factor of 2 and band-pass filtered. After normalisation, ~20,000 particles were automatically picked, centered and classified based on multivariate statistical analysis (MSA). Good classes were used as references for further cycles of alignment and classification. Various reference-free models were obtained by angular reconstitution and among those in good agreement with each other the one with the lowest Euler error was used for refinement. As eigen-image analysis indicate the presence of two-fold symmetry, the asymmetric map was refined further by applying C2 symmetry. Details are presented in the Supplementary Information.
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6

Negative-Stain EM Protein Sample Preparation

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For grid preparation, a protein stock solution (6 mg/ml) was diluted to 0.25 mg/ml with standard buffer without sucrose. Glutaraldehyde was added to the diluted protein solution to a concentration of 0.1% (v/v). After incubation for 2.5 min at room temperature, the reaction was quenched by the addition of 50 mM l-aspartate (pH 6.5). A continuous carbon foil was floated on the protein solution for 1 min at 4°C. A holey carbon copper grid was used to remove the continuous carbon foil from the protein solution. Excess liquid was removed with a tissue paper. Proteins were stained by floating the grid on a saturated uranyl formate solution for 1 min at 4°C. Remaining staining solution was removed with a tissue, and the grid was dried under ambient conditions. Negative-stain EM images were taken with a Philips CM200 microscope (160 kV). Images were acquired at a magnification of ×66,000. The pixel size corresponds to 3.34 Å per pixel. The TVIPS charge-coupled device camera was used to record the micrographs.
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7

TEM Characterization of Silver Nanoparticles

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TEM measurements were performed in a 200 kV Philips CM-200 microscope (Philips, Amsterdam, Netherlands) with a supertwin objective lens, a LaB6 filament and side-entry specimen holder (point resolution 0.24 nm). To prepare the TEM samples, ~5 µL of solution containing the sample were removed from the bottom of the vial, followed by the removal of ~5 µL of the supernatant into the same pipette tip. Two drops of this suspension were deposited on a carbon-coated copper TEM grid (Ted Pella, Redding, CA, USA). The instrument is equipped with an energy-dispersive X-ray spectroscopy (EDX) detector (EDAX Inc., Tilburg, Netherlands). Signals from the elements Si, Cu and C are originated from carbon-coated copper TEM grid. Taking into consideration that EDX is based on the principle that each element has a unique atomic structure (with a unique set of peaks on its electromagnetic emission spectrum), we can discriminate between silver NPs and the TEM grid. The size histogram was prepared using Image-Pro Plus software (Media Cybernetics, Rockville, MD, USA), based on the measurements obtained from more the 150 nanoparticles.
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8

Cryo-EM Imaging of Carboxysome

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Full-length CthACC was diluted to 0.01 mg ml−1 in 30 mM MOPS pH 7.0, 200 mM ammonium sulfate, 5% glycerol and 10 mM dithiothreitol. Protein sample was adsorbed to a 200-μm copper grid and stained with 2% uranyl acetate. Grids of CthACC were imaged on a CM-200 microscope (Philips) equipped with a TVIPS F416 4k CMOS camera (Tietz Video and Image Processing Systems). The voltage used was 200 kV, and a magnification of × 50,000 results in a pixel size of 2.14 Å. Initial image processing and particle picking was carried out using Xmipp69 (link)70 (link). Overall, 22,309 particles were picked semi-automatically from 236 micrographs with a box size of 300 × 300 pixels. After extraction, particles with a z-score of more than three were discarded and 22,257 particles were aligned and classified into 48 2D class averages using the maximum-likelihood target function in Fourier space (MLF2D). After 72 iterations, 4,226 additional particles were discarded and the remaining 18,031 particles were re-aligned and classified into 36 classes using MLF2D with a high-resolution cutoff of 30 Å. After 44 iterations the alignment converged and class averages were extracted.
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9

Comprehensive Characterization of Fabricated Materials

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The crystal nanostructures of fabricated materials were achieved with recording X-ray diffraction (XRD) scans by filtered Co Kα radiation on a Phillips X'Pert MPD diffractometer. The Fourier transform infrared (FTIR) measurements were carried out on a Nicolet AVATAR 370 spectrometer within the spectral range of 600 and 4000 cm−1. The Raman spectra were achieved using an Almega Thermo Nicolet dispersive Raman spectrometer with a 532 nm laser excitation source. The inductively coupled plasma optical emission spectroscopy (ICP-OES) was performed on a PerkinElmer Optima 8000 instrument. The field emission scanning electron microscopy (FESEM) and energy-dispersive X-ray spectroscopy (EDX) together with the corresponding elemental mapping were conducted on a TESCAN Mira 3-XMU. The transmission electron microscopy (TEM) images were collected on a Phillips model CM200 microscope.
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10

Photocatalytic Degradation of Organic Pollutants

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Silver nitrate (AgNO3, >99%), 3-mercaptopropionic acid (MPA), sodium borohydride (NaBH4), sodium citrate dihydrate (Na3(C6H5O7)·H2O), polyvinylpyrrolidone 10000 (PVP 10000), phenol, 1-ethyl-3-(3-dimethylaminopropyl) carbodiimide hydrochloride (EDC), oxalic acid, 4-aminoantipyrine, potassium persulfate and tetraethyl orthosilicate (TEOS) were purchased from Sigma-Aldrich, and TiO2 P25 Aeroxide® (P25) was purchased from Degussa-Evonik. All chemicals were used without further purification.
A high-pressure 125 W Hg lamp (Philips HPL-N) without the glass bulb was employed as the radiation source. The lamp exhibits Hg emission lines at 690, 579, 576, 548, 491, 435, 407, 404 and 365 nm. The Museum Glass® from True Vue™ was employed as a UV cut-off filter, placed between the lamp and the photodegradation vessel, by attenuating the 365 nm line and higher energy emission by two orders of magnitude. A Shimadzu UV-3101 PC spectrophotometer was used to monitor the photocatalysis and to characterize the photocatalysts through Diffuse Reflectance (DR) spectra by using an integrating sphere. Transmission Electron Microscopy (TEM) and energy dispersive X-ray spectroscopy (EDS) analysis were carried out on a Philips CM 200 Microscope operating at 200 kV.
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