D8 discover lynxeye

The surface morphologies of the films
were determined by SEM using a JEOL JSM-6700 microscope (3 kV). The
roughness measurements were obtained using a Nanosurf easy scan AFM,
equipped with a 10 μm tip in noncontact mode with an oscillating
probe. The scan area was 5 μm × 5 μm with 20 nm scan
intervals. XRD was performed on a Bruker D8 Discover LynxEye diffractometer
using primary monochromated Cu Kα₁ radiation (λ
= 1.5406 Å, 2θ = 5–66°, 0.05° per step).
XRD patterns were compared with Inorganic Crystal Structure Database
(ICSD) reference patterns for monoclinic VO₂ (ICSD 34033).
Optical transmittances were monitored on a Perkin Elmer Lambda 950
UV–vis–NIR spectrophotometer that was equipped with
a homemade heating unit. The thermochromic properties of the films
were measured by recording the transmittance spectra from 2500 to
250 nm as a function of temperature between 20 and 90 °C. The
Scotch tape test^{20 (link)} was used to determine
the adhesion of the films to the substrate. Thin films thicknesses
were determined by the φ SemiLab SE-2000 ellipsometer. XPS was
carried out on thin films using a Thermo Scientific K-α spectrometer
with monochromated Al Kα radiation, a dual beam charge compensation
system, and constant pass energy of 50 eV (spot size, 400 μm).
Spectra were recorded from 0 to1200 eV.

The morphologies of the films
were characterized using a JEOL JSM-6700F field emission SEM. The
EDS analysis result was obtained by a FIB-SEM (Zeiss Crossbeam 540)
equipped with an EDS unit (Oxford Instruments, silicon drift detector—X-Max^N). The acceleration voltage was 15 kV. XPS data were collected
on a Thermo Scientific K-Alpha X-ray photoelectron spectrometer under
ultrahigh vacuum (<5 × 10⁸ Torr) using a monochromatic
Al Kα X-ray source, at an operating ion gun energy of 200 eV,
scanning 10 times for each element. The adventitious carbon 1s peak
was calibrated to 284.5 eV and used as an internal standard to compensate
for any charging effects. Phase identification of the films was achieved
using a Bruker D8 DISCOVER LynxEye thin-film X-ray diffractometer
equipped with Cu Kα1 (using 40 kV and 40 mA, λ = 1.540619
Å) radiation, operated in 2θ scan mode from 15° to
66°, X-ray incident angle at 1°, 0.05° step size, 6
s per step. To confirm α-Fe₂O₃, SnO₂, and TiO₂, reference JCPDS files for α-Fe₂O₃ (JCPDS no. 33-0664), SnO₂ (JCPDS
no. 41-1445), and TiO₂ (JCPDS no. 21-1272) are cited. The
PL spectra were obtained by using Horiba Scientific LabRAM HR Evolution
as the excitation source operated at a wavelength of 325 nm.