The powder X-ray diffraction (XRD) patterns were recorded in the range of 2θ = 5° to 2θ = 90° using a Rigaku X-ray diffractometer. Raman scattering spectra of graphite, GO and N-rGO were collected by using a WITec Raman spectrometer equipped with Nd:YAG laser (λ = 532 nm). The surface morphology of the sample was analyzed by using field-emission scanning electron microscopy (FEI quanta FEG200). Transmission electron microscopy images were taken using transmission electron microscope (JEOL JEM-2010F) operated at 200 keV. X-ray photoelectron spectroscopy was performed to confirm the presence of various elements. Nanolubricants were prepared by using a probe sonicator (Sonics, 500 W).
Feg200
Manufactured by Thermo Fisher Scientific
The FEG200 is a field emission gun scanning electron microscope (SEM) that provides high-resolution imaging capabilities. It utilizes a field emission source to generate a highly focused electron beam for examining samples at the nanoscale level. The FEG200 offers superior spatial resolution and low-energy electron imaging for a wide range of applications.
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4 protocols using feg200
1
Characterization of Graphene-based Nanomaterials
2
Imaging Fungal Spores via SEM
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The SEM (Quanta FEG 200, FEI) images of the fungal spores were obtained from the sophisticated analytical instrumentation facility (SAIF) located at IIT Madras. The central portion of the slide with the fungal spores was cut into a small square using a glasscutter pen. The slide was then sputtered with a thin layer of gold to render the surface conducive for obtaining secondary electron images to investigate the spores’ morphology.
3
Morphological Characterization of CS/HA Scaffolds
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Morphological properties of CS/HA composite scaffolds at different compositions were studied by scanning electron microscopy SEM (Quanta FEG200‐FEI, The Netherlands). To this end, the scaffolds were deposited on aluminum stubs gold‐coated in an automatic sputter‐coater (EMSCsOPE SC500, 20 kV) to a thickness of about 30 nm.
4
High-Resolution Scanning Electron Microscopy of Nanotubes
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High resolution scanning electron microscope (HRSEM, F E I Quanta FEG 200) was used to visualize the surface morphological patterns [Figures 1 and 2 ]. Forty nanometer tubes were categorized as Group B and 80 nm tubes as Group C.
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