Jem 2010
The JEM-2010 is a transmission electron microscope (TEM) designed and manufactured by Ametek. It is a high-performance instrument used for the examination and analysis of materials at the nanoscale level. The JEM-2010 provides high-resolution imaging, diffraction, and analytical capabilities to support a wide range of scientific and industrial applications.
4 protocols using jem 2010
Electron Microscopy Imaging of Bacteriophages
Staphylococcus aureus FtsZ Polymerization Inhibitor
FtsZ Polymerization Visualization Protocol
S. aureus FtsZ (12 µM) was incubated in the absence and in the presence of different concentrations of the test compounds in 50 mM MOPS buffer (pH 6.5) at 25°C. After 10 min, 5 mM MgCl2, 50 mM KCl, and 1 mM GTP were added to the reaction mixtures and incubated at 37°C for 15min. Then, 10 µL of the sample mixtures were placed on a glow-discharged Formvar carbon-coated copper grid (400 mesh) for 10 min. The grids were subsequently subjected to negative staining using 10 µL of 0.5% phosphotungstic acid (PTA) for 30s, air-dried and digital images of the specimen were observed with a transmission electron microscope (JEOL model JEM 2010) operated at 200 kV and equipped with a Gatan MSC 794 CCD camera.
Characterization of Nanoemulsion Formulation
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