like PXRD (powder X-ray diffraction), FT-IR (Fourier transform infrared)
spectroscopy, UV–Vis (ultraviolet–visible) spectroscopy,
and TEM (transmission electron microscopy). FT-IR was recorded on
an FT-IR 8400S spectrophotometer from Shimadzu Corporation, Japan.
The PXRD pattern was obtained on an X-ray diffractometer (D/teX Ultra
250, Rigaku Corporation, Japan) using Cu Kβ radiation (λ
= 1.54439 Å) obtained at 40 kV and 50 mA. A double-beam UV–vis
spectrophotometer (UV-1700 series) with a quartz cell of 1 cm path
length from Shimadzu Corporation, Japan, was used for procuring absorbance
readings wherever required. A Philips CM 10 transmission electron
microscope operating at 100 kV was used for procuring TEM micrographs
of the prepared nanoparticles.