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D tex ultra 250

Manufactured by Rigaku
Sourced in Japan

The D/teX Ultra 250 is a high-performance X-ray detector designed for advanced X-ray diffraction (XRD) analysis. It features a large active area and high detection efficiency, enabling rapid data collection and high-quality results. The detector utilizes a unique design to provide reliable and accurate measurements across a wide range of applications.

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5 protocols using d tex ultra 250

1

Characterization of H. undatus-Synthesized IONPs

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IONPs synthesized using H. undatus were characterized through techniques
like PXRD (powder X-ray diffraction), FT-IR (Fourier transform infrared)
spectroscopy, UV–Vis (ultraviolet–visible) spectroscopy,
and TEM (transmission electron microscopy). FT-IR was recorded on
an FT-IR 8400S spectrophotometer from Shimadzu Corporation, Japan.
The PXRD pattern was obtained on an X-ray diffractometer (D/teX Ultra
250, Rigaku Corporation, Japan) using Cu Kβ radiation (λ
= 1.54439 Å) obtained at 40 kV and 50 mA. A double-beam UV–vis
spectrophotometer (UV-1700 series) with a quartz cell of 1 cm path
length from Shimadzu Corporation, Japan, was used for procuring absorbance
readings wherever required. A Philips CM 10 transmission electron
microscope operating at 100 kV was used for procuring TEM micrographs
of the prepared nanoparticles.
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2

Characterization of Crystalline Phases by XRD

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X-ray diffraction (XRD) with Cu K α radiation ( λ = 1.54183 Å) was carried out to identify the crystalline phases using Rigaku MiniFlex 600 (Rigaku Co., Tokyo, Japan) at room temperature, using a one-dimensional detector (Rigaku D/teX Ultra 250). The X-ray tube was operated at 40 kV and 15 mA. Additional measurements parameters are 2 θ range 3–80 ° , IHS slit = 10 mm, Soller slits = 2.5 ° , DS slit = 1.25 ° , scanning step size 0.01 ° , and exposure time at each point of 1.67 s without sample rotation.
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3

Characterization of Solid Electrolytes

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The crystal structure of the SEs was
characterized by X-ray diffraction (XRD) (Ultima IV, Rigaku Co., Ltd.,
Japan). The samples were sealed in specialized holders equipped with
a Be window (Rigaku Co., Ltd., Japan) in an Ar-filled glovebox to
avoid exposure to humidity. The XRD measurements were partly conducted
using a 1D silicon strip detector (D/teX Ultra 250, Rigaku Co., Ltd.,
Japan) instead of a conventional scintillation counter (SC, Rigaku
Co., Ltd., Japan). Thermogravimetric differential thermal analysis
(TG-DTA) (EVO II, Rigaku Co., Ltd., Japan) was conducted in an Ar-filled
glovebox to avoid exposure to humidity and evaluate the thermal properties
of the SEs.
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4

X-Ray Diffraction Analysis of Thin Films

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XRD patterns were performed using a RIGAKU Multipurpose diffractometer model Smartlab, with Theta-Theta Bragg-Brentano geometry goniometer and coupled to a solid-state detector D/teX Ultra 250 (Rigaku Corporation, Akishima-shi, Japan) for data acquisition. The X-ray beam was generated using a copper tube target (Cu Kalpha λ = 1.5418Å) at 30 kV/10 mA and filtered with Ni. The measure was recorded at room temperature between 5 and 55° 2-theta (degrees) with a step of 0.02° and a scan speed of 1°/min. Optical configurations were adjusted by divergent and receiving slits on both sides, with parallel Soller slits of 5° and 5 mm, respectively. The instrumental resolution was aligned with NIST SRM660c standard (LaB6). While the XRD measurement was carried out, the sample films were positioned on a silicon wafer with an orientation of <100> (about 69°). Subsequently, the patterns obtained were slightly smoothed using the Savitzky–Golay model, and any strange peaks coming from the silicon wafer were mathematically removed. The data obtained were optimized by TOPAS Academic V6 Program by modeling the peak shapes [44 (link)].
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5

Comprehensive Characterization of P/AB Powder

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The P/AB powder was characterized by XRD and Raman spectroscopy. The XRD patterns were obtained using a Rigaku SmartLab diffractometer (Cu Kα (λ = 1.5418 Å) and 40 kV-30 mA) equipped with a Si strip high-speed detector (D-teX Ultra 250, Rigaku) under a Bragg-Brentano geometry at the scan rate of 0.5 deg min -1 . The Raman spectra were obtained using a DXR3 Smart Raman (Thermo Fisher Scientific) equipped with a 532 nm diode-pumped solid-state laser at the resolution of 2 cm -1 . The particle size measurement and morphology observation were performed by SEM (Hitachi, SU-8020) and the elemental composition was evaluated by EDX (Horiba EMAXEvolution X-max). The XPS analysis of the P/AB pristine powder was carried out using a JEOL JPS-9010 XPS instrument (MgKα (λ = 9.89 Å), 10 kV-10 mA) with Ar etching at the ion energy of 400 eV for 5 and 10 s. The obtained spectra were analyzed using analytical software (SpecSurf, ver. 1.8.3.7, JEOL, Ltd).
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