X ray diffractometer

UV–visible spectroscopy (UV–vis) spectra of the prepared Ag-NPs and Ag-NC were measured on V-630 UV–vis spectrophotometer (Jasco, Japan) in the range of 300–700 nm. The Ag-NC and its component were characterized using FT-IR spectrometer (Nicolet Impact-400 FT-IR spectrophotometer) in the range of 400–4000 cm⁻¹ using KBr method (0.002 g sample was grinded with 0.98 g KBr) using Spectrum Two IR Spectrometer – Perk in Elmer, Inc., Shelton, USA. The X-Ray diffraction (XRD) of Ag-NC and its component were investigated on a Diano X-ray diffractometer using Cu-Kα radiation source energized at 45 kV and a Philips X-ray diffractometer (PW 1930 generator, PW 1820 goniometer) with Cu-Kα radiation source (λ = 0.15418 nm) XRD Model diffractometer, Shimadzu 7000, Japan. The topographical study was carried out using scanning electron microscopy (SEM) with energy dispersive electron spectroscopy (EDX) Model FEI IN SPECTS Company, Philips, Holland, environmental scanning without coating. The surface morphology of Ag-NPs and Ag-NC was carried out using JEOL 1010 transmission electron microscopy (TEM), Model JEM2010, Japan. The samples were processed according to (Shehabeldine et al. 2021a (link); Elbahnasawy et al. 2021a ).