Invia laser raman microscope

Typical X-ray diffraction patterns of rGO, Mn₃O₄ and Mn₃O₄@rGO composites are analyzed using an X-ray diffractometer (Bruker D8) with Cu Kα radiation (λ = 1.5406 Å) between 10 and 80° at a scan rate of 5° min⁻¹. Resonant Raman scattering spectra are recorded using a Renishaw inVia laser Raman microscope with an excitation wavelength (λ) of 633 nm (He–Ne laser). Scanning electron microscopy (VEGA3 SB, TESCAN Instruments) and transmission electron microscopy (HRTEM, JEOLJEM 2100) are used to investigate the morphology and microstructure of the synthesized materials. The chemical states of the synthesized nanocomposite are investigated using X-ray photoelectron spectroscopy (Thermo Fisher Scientific Instruments UK) with a monochromatic Al Kα source (1486.6 eV), and the obtained results are calibrated by reference with C 1s at 284.6 eV. The surface areas of the synthesized materials are investigated using nitrogen adsorption–desorption isotherms which are recorded at 77 K on a Micromeritics ASAP 2020.

The graphene sample and carbon dots were analyzed with UV-Vis spectrophotometer (V-770), Fourier Transform Infra-red spectroscopy (FTIR) (Jasco 4700), and Raman spectroscopy having a laser excitation energy of 532 nm in Renishaw In Via Laser Raman Microscope. Size and crystallinity of the carbon dots were observed using TEM (JEOL 2100F). Hall effect measurements were performed using Lakeshore 8400 Series (Toyo Corporation, Japan) with the van der Pauw technique. Morphological survey of graphene before and after doping was done by JSM-7001F – A field emission scanning electron microscope (FE-SEM) irradiates the surface of a sample with an electron beam, detects the bounced electrons, and observes the sample.