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Leica em scd500

Manufactured by Leica Microsystems
Sourced in Germany

The Leica EM SCD500 is a state-of-the-art sputter coater designed for high-quality specimen preparation in electron microscopy. It provides a reliable and efficient method for depositing thin conductive coatings on samples, enabling enhanced image resolution and analysis.

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15 protocols using leica em scd500

1

Morphological Characterization of Hydrogels

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The morphology of the hydrogels was pictured using scanning electron microscopy (SEM). Freeze-dried samples of both the nonporous and the porous hydrogel were put on adhesive carbon foils. Then, 3 nm of platinum were sputtered on the surface of the samples using a Leica EM SCD500 sputtering system (Leica Microsystems GmbH, Wetzlar, Germany). A Neon 40EsB scanning electron microscope from Carl Zeiss Microscopy GmbH (Jena, Germany) with a Schottky field-emission electron source and an extra high tension (EHT) voltage level of the electron beam of 3 kV was used to determine the SEM pictures. Images were received from signals of a secondary electron (SE2) detector and an In-Lens detector located in the scanning electron microscope in standard setup. Only fracture surfaces were recorded in order to ensure the imaging of the inside of the hydrogel samples. Pore diameters were measured using the “particle analyze” tool of the ImageJ software package [29 ].
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2

Feather Microstructure Analysis via SEM and μCT

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An SEM Hitachi S-4800 (Hitachi High-Technology, Tokyo, Japan) was used at an acceleration voltage of 3 kV to study the feather microstructure at different levels of the shaft. Dry samples were attached to aluminum stubs using adhesive tape and then sputter-coated with 8-nm gold–palladium using a Leica EM SCD 500 (Leica Microsystems, Mannheim, Germany).
Skyscan 1172 µCT (Bruker microCT, Kontich, Belgium) was used for three-dimensional scanning of shaft specimens (1 primary feather, 8 segments). The X-ray voltage and current were set to 40 kV and 250 μA, respectively. The NRecon software (SkyScan, Kontich, Belgium) was used to reconstruct structures from the 3D data of µCT scans. The segmentation was performed using the image analysis software Amira (FEI Visualization Sciences Group, Bordeaux, France).
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3

Scanning Electron Microscopy of Foraminifers

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Individual foraminifers were dehydrated in a graded ethanol series (70%, 80%, 90%, 96%, and two times 100%; 15 min each), air-dried at 20 °C for 12 h in a desiccator and mounted on aluminum stubs (PLANO GmbH) with conductive and adhesive carbon pads (PLANO GmbH). Subsequently, the preparations were sputter-coated with a 10-nm-thick gold-palladium (80/20) layer with a high-vacuum sputter coater (Leica EM SCD500, Leica Microsystems GmbH) and visualized with a Hitachi S-4800 field emission scanning electron microscope (Hitachi High-Technologies Corporation) at an acceleration voltage of 3 kV and an emission current of 10 mA applying a combination of the upper detector and the lower detector. The B. costata specimen was taken from previous samplings by the General Direction of Research in Oceanography and Climate Change IMARPE (71 ). The corresponding sample was air-dried at 35–38 °C, sputter-coated with gold, and visualized with an FEI Inspect S50 scanning electron microscope (Thermo Fisher Scientific Inc.) at an acceleration voltage of 3 kV.
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4

Nanostructure Morphology Preservation in Two-Step Replica Molding

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To inspect if the nanostructures’ morphology is preserved during the two-step replica molding transfer into OrmoStamp and PDMS, scanning electron microscopy (SEM) images were taken. To reduce charging effects during SEM imaging, a 15 nm chromium metal layer was sputtered on the OrmoStamp and the PDMS replica mold (Leica EM SCD 500, Leica Microsystems, 35578 Wetzlar, Germany, sputtering rate 0.1 nm s−1). The conductive silicon master was not specially pretreated. The wafers were imaged by a Zeiss Supra 55 VP SEM (Carl Zeiss AG, Jena, Germany) using the following imaging parameters: silicon master, EHT 10 kV, InLens, WD 6 mm; OrmoStamp master, EHT 1 kV, InLens, WD 5 mm; PDMS, EHT 3 kV, SE2, WD 16 mm.
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5

Cryofracture and SEM Imaging of PLA Nanocomposites

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Neat PLA and nanocomposite films were cryo-fractured, glued on an aluminum sample holder with conductive carbon tape (Leit-C, Neubauer Chemikalien, Berlin, Germany), and sputter-coated with ~10 nm Tungsten (Leica EM SCD500, Leica Microsystems, Amsterdam, The Netherlands). The surfaces were observed with FESEM (FEI Magellan 400, FEI Electron Optics B.V., Eindhoven, The Netherlands) at room temperature at working distance of 4 mm, with SE detection at 2 kV and 13 pA.
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6

Scanning Electron Microscopy of Leg Bones

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Hind legs from ethanol-preserved specimens were removed from the body, dissected with a razor blade in sagittal plane, air dried at a room temperature for at least 24 h. Then dissected samples of femurs and tibiae were glued onto aluminium SEM stubs, coated with gold–palladium using a Leica EM SCD500 sputter coater (Leica Microsystems GmbH, Wetzlar, Germany), and examined with a Hitachi S4800 (Hitachi High-Technologies Corp., Japan) scanning electron microscope at 3 kV.
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7

Biofilm Preparation for SEM Analysis

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Biofilm for scanning electron microscopy (SEM) analysis was performed on 6-well polystyrene plates (PPHU Genos s.c., Strońsko, Poland) following the method described at point 4.4. After 24 h of incubation with phages or antibiotics, the wells were washed with sterile PBS to remove all planktonic cells. After washing, adhering bacterial cells were fixed with 3% buffered glutaraldehyde (Poch S.A., Gliwice, Poland) overnight at 4 °C as described before [36 (link)]. The samples were dehydrated through a graded ethanol (Poch S.A., Gliwice, Poland) series (50%, 70%, 80%, and 90%) for 10 min each and two times with 96% for 30 min at room temperature. The bottom of each well was cut to a length suitable for electron microscopy. After coating with a 10-nm-thick conductive layer of gold deposited by a high-vacuum sputter coater (LEICA EM SCD 500, Leica Microsystems, Wetzlar, Germany), the samples were examined with a scanning electron microscope (QUANTA FEG 250, FEI, Hillsboro, OR, USA) using a secondary electron detector (ETD).
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8

Scanning Electron Microscopy of Methanogenic Archaea

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After growing periods of 48 h (Methanosarcina mazei, Methanosphaera stadtmanae) or 72 h (Methanobrevibacter smithii) cultures were prepared as described above and mica plates were fixed on the aluminum stubs with double-sided carbon conductive tapes (Plano, Wetzlar, Germany). Subsequently, samples were air dried in a desiccator with silica gel (Merck KGaA, Darmstadt, Germany) for a period of 72 h. After coating with a 10 nm thick layer of gold-palladium in a sputter coater (Leica EM SCD500, Leica Microsystems GmbH, Wetzlar, Germany), samples were examined in SEM Hitachi S-4800 (Hitachi High-Technologies Corp., Tokyo, Japan) at an accelerating voltage of 3 kV.
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9

Nanoparticle Characterization by DLS and SEM

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The mean size and the formation process of nanoparticles were assessed continuously using dynamic light scattering (DLS) (Nanosizer, Malvern, UK), on temperature steps (i.e., 0.5 °C/step, 10 min step duration) ranging from 22 °C to 37 °C. HA-L-PNIPAM 0.5, HA-L-PNIPAM 0.1, and HA-PNIPAM were formulated at three concentrations (0.1%, 0.01%, and 0.1% w/v) in PBS buffer. The morphology of nanoparticles was observed using scanning electron microscopy (SEM) (JEOL microscope, JSM-7001TA, Tokyo, Japan). The samples were prepared by vacuum drying a drop of formulation (0.001% w/v) heated at 37 °C on carbon tape. The SEM samples were sputter-coated with a 20 nm gold layer (Leica EM SCD 500, Leica Microsystems GmbH, Wetzlar, Germany), then observed with a scanning electron microscope at 15 kV.
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10

SEM Imaging of Complex Biomaterials

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SEM was performed on a FEI Magellan 400 (FEI Electron Optics B.V., The Netherlands) using an acceleration voltage of 2.0 kV. Compleximers were mounted on 90° aluminum stubs with double-sided adhesive, conductive carbon tape. Hot-pressed samples were broken in pieces. The fractured surface was oriented upward and sputter-coated with a 10-nm layer of tungsten (Leica EM SCD500, Leica Microsystems, The Netherlands).
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