Quantum 2000 microprobe

Contact angles were measured using a VCA Optima surface analysis/goniometry system. Surface composition was analyzed by X-ray Photoelectron Spectroscopy using using a Physical Electronics Quantum 2000 Microprobe with monochromatic Al X-rays. Films surface structures characterization was carried out using an Olympus optical microscope, DI Dimension-3000 atomic force microscope and JEOL JSM–7001F scanning electron microscope. Film thicknesses were analyzed using a Veeco Dektak Stylus Profilometer.

Digital photos were acquired using a Samsung Galaxy S7 Active camera. To determine the surface chemical composition, high-resolution X-ray photoelectron spectroscopy (XPS, Physical Electronics Quantum 2000 Microprobe, Physical Electronics, Chanhassen, M_n) scans were obtained. A monochromatic Al X-ray instrument at 50 W was used with a spot area of 200, and the takeoff angle was set 45°.⁵¹ Contact angle measurements were acquired using a home-built apparatus equipped with a Nikon D5100 digital camera with a 60 mm lens and 68 mm extension tube (Nikon, Melville, NY).^{52 (link)} Data represent the average of four drops of water (4 μL) measured on eight different sample replicates. Micrographs were acquired using a Magellan 400 scanning electron microscope (SEM, FEI, Hillsboro, OR). A 208 HR sputter coater (Cressington Science Instruments, Watford, England) was used to coat samples with 3 nm of platinum. Average pore diameter distributions were determined by measuring 50 random pores from five micrographs using ImageJ1.47 software (National Institutes of Health, Bethesda, MD).