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Agg3347n

Manufactured by Agar Scientific
Sourced in United Kingdom

The AGG3347N is a laboratory instrument designed for the analysis of particle size and particle size distribution. It uses laser diffraction technology to measure the size and concentration of particles suspended in a liquid or gas medium. The device can accurately determine particle sizes ranging from 0.1 to 3000 microns, making it suitable for a wide range of applications in various industries.

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3 protocols using agg3347n

1

Comprehensive Structural and Optical Characterization of Synthesized Samples

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The structural investigations of the prepared samples were carried using a powder X-ray diffractograms (2θ = 5°–70°, Phillips powder diffractometer operating with copper Kα radiation source/λ = 1.54060 Å). The obtained XRD data were processed with X'Pert HighScore software, where the Miller indices (hkl) and their corresponding interplanar distance (dhkl) were identified.
The presence of the metal-oxide groups was studied using a PerkinElmer Fourier Transform Infrared (FT-IR) Spectrometer in transmission mode, in the range 400–4000 cm−1.
The morphological properties and the surface elemental composition (energy dispersive X-ray spectrum) of the synthesized samples were obtained using a scanning electron microscope (Model JEOL JSM7100F) coupled with EDX spectrometer using double-faced adhesive carbon pads (AGG3347N from Agar Scientific). In order to estimate the average grain size, the Image J software was then used.36 The optical properties were studied in the form of pellets using a UV-vis diffuse reflectance spectrophotometer (Model Perkin- ELMER 365, 300–800 nm). The reflectance spectra were recorded between 300 and 800 nm. The photoluminescence measurements were recorded using a Jobin Yvon HR 250 spectrometer at room temperature with an excitation of 266 nm.
The optical absorption spectra were measured by a Shimadzu UV-1800 UV-visible spectrophotometer.
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2

Elemental Composition Analysis via EDX

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Energy‐dispersive X‐ray spectroscopy (EDX) analyses were performed to confirm the elemental composition of the samples and to check for contamination after blasting. The specimens were mounted on aluminum stubs (12.5 mm ø, AGG301, Agar Scientific, UK) and fixed using carbon adhesive discs (12 mm ø, AGG3347N, Agar Scientific, UK). A narrow line of silver paint (G3691, Agar Scientific, UK) was used to enhance the conductivity of the specimens. The specimens were gold‐coated (approximately 5.0 nm) using the Q150T ES coater (Quorum Technologies, UK). The EDX spectra were generated using a LEO Ultra 55 scanning electron microscope at 10 kV (Carl Zeiss, Germany) equipped with an EDX detector (Inca, Oxford, UK).
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3

Scanning Electron Microscopy of Scaffolds

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TCES and RES scaffolds were coated with a 10 nm gold layer (SC 500A, Emscope, Heathfield, UK) and mounted on aluminum pin stubs (AGG301, agar scientific) with carbon tabs (AGG3347N, Agar Scientific, Stansted, UK). Scaffolds were analyzed by scanning electron microscopy (SEM) FE SEM, JSM-6500F (JEOL, Tokyo, Japan) and FE/VP SEM, TM3030Plus (Hitachi, Tokyo, Japan ). Spot size and voltage were set up at 10 kV and 3.5 nm respectively for all samples. ImageJ software v. 1.48 from the National Institutes of Health (NIH, Bethesda, MD, USA) [42 (link)] was used to measure fiber diameter on the SEM micrographs. Three independent tests were performed for each material with 15 fibers measured for each micrograph (N = 3, n = 15).
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