The specimens with La0.8Sr0.2MnO3 content of 2, 6 and 10 wt. % were frozen in liquid nitrogen, and sliced. The cross-section micromorphology of them were observed by SEM (FEI/Nova Nano SEM 450, FEI Company, Hillsboro, OR, USA). While the SEM was used, an elemental energy spectrum analysis can be performed, and an elemental Energy Dispersive Spectrum (EDS, FEI/Nova Nano SEM 450, FEI Company, Hillsboro, OR, USA) analysis can be performed on the same specimen. The cross-section micromorphology analysis is a common method for rubber-plastic composites.
Fei nova nanosem 450
The FEI Nova NanoSEM 450 is a high-performance scanning electron microscope (SEM) designed for advanced nanoscale imaging and analysis. It features a field emission electron source, delivering high-resolution imaging capabilities. The instrument is equipped with advanced detectors and analytical tools to enable detailed characterization of a wide range of materials and samples.
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Structural and Microstructural Analysis of La0.8Sr0.2MnO3
The specimens with La0.8Sr0.2MnO3 content of 2, 6 and 10 wt. % were frozen in liquid nitrogen, and sliced. The cross-section micromorphology of them were observed by SEM (FEI/Nova Nano SEM 450, FEI Company, Hillsboro, OR, USA). While the SEM was used, an elemental energy spectrum analysis can be performed, and an elemental Energy Dispersive Spectrum (EDS, FEI/Nova Nano SEM 450, FEI Company, Hillsboro, OR, USA) analysis can be performed on the same specimen. The cross-section micromorphology analysis is a common method for rubber-plastic composites.
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