The structure and phase of the synthesised materials were examined by PXRD (Ultima III, Rigaku, Japan) and Raman spectroscopy (Bruker FT Raman Spectrometer with a laser wavelength of 532 nm). The morphology of the films was characterised using transmission electron microscopy (TEM; JEOL 3011, Japan), scanning transmission electron microscopy (STEM; Hitachi HD-2300A, Japan), and high-resolution TEM (HRTEM; Hitachi HD-3010A, Japan). Elemental compositions were determined using energy-dispersive X-ray spectroscopy (EDS; Oxford Instruments, UK) and inductively coupled plasma mass spectrometry (ICP-MS; Thermo Scientific XSeries 2 ICPMS, USA). The catalyst surface area was determined using Brunauer–Emmet–Teller (BET) analysis, using a BELSORP-mini II (BEL. Japan Inc.) under a flow of N2 gas.
Ft raman spectrometer
Manufactured by Bruker
Sourced in Japan, Germany
The FT Raman Spectrometer is a laboratory instrument that uses Fourier Transform Raman spectroscopy to analyze the molecular composition of samples. It provides high-resolution, real-time analysis of a wide range of materials.
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4 protocols using ft raman spectrometer
1
Multimodal Characterization of Synthesized Materials
2
Raman and DUV-RR Spectroscopy of Samples
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Non-resonant near infrared (λexc = 1064 nm) solid-state FT-Raman spectra were recorded with
a Bruker FT-Raman spectrometer with a spectral resolution of 4 cm–1. As a Raman excitation source, a Nd:YAG laser with
125 mW power at the sample was used at its fundamental frequency.
The Raman light was collected by a liquid nitrogen-cooled Ge detector.
DUV-RR spectroscopy experiments were performed with the help of a
UV Raman setup (Horiba/Jobin-Yvon) equipped with a liquid N2-cooled CCD detector. The DUV-excitation wavelengths λexc = 257 nm and λexc = 244 nm were derived
from an intracavity frequency doubled argon-ion laser (Coherent Inc.)
and focused on the sample (257 nm: PL =
2.20 mW; 244 nm: PL = 0.22 mW) with an
objective lens, and the spectral resolution was 5 cm–1.
The UV–vis absorption spectra of all the measured
sample solutions were recorded with a Carry 5000 UV–vis–NIR
spectrometer (Varian).
a Bruker FT-Raman spectrometer with a spectral resolution of 4 cm–1. As a Raman excitation source, a Nd:YAG laser with
125 mW power at the sample was used at its fundamental frequency.
The Raman light was collected by a liquid nitrogen-cooled Ge detector.
DUV-RR spectroscopy experiments were performed with the help of a
UV Raman setup (Horiba/Jobin-Yvon) equipped with a liquid N2-cooled CCD detector. The DUV-excitation wavelengths λexc = 257 nm and λexc = 244 nm were derived
from an intracavity frequency doubled argon-ion laser (Coherent Inc.)
and focused on the sample (257 nm: PL =
2.20 mW; 244 nm: PL = 0.22 mW) with an
objective lens, and the spectral resolution was 5 cm–1.
The UV–vis absorption spectra of all the measured
sample solutions were recorded with a Carry 5000 UV–vis–NIR
spectrometer (Varian).
3
FT-Raman Spectroscopy of Oil Samples
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The Raman spectra of the oil samples were measured in triplicate using a MultiRAM Fourier transform (FT) Raman spectrometer (Bruker Optics, Ettlingen, Germany) equipped with a liquid nitrogen-cooled Ge detector (D418T), a Nd:YAG continuous wave laser emitting at 1064 nm, and were controlled using OPUS 7.5 software. The Raman spectra of the oil samples were measured while being contained in glass vials with a 180° backscattering arrangement. The spectra were obtained over the 4000–200 cm−1 spectral window with a defocused objective (laser spot size ~2 mm diameter), 300 mW laser power, 4 cm−1 resolution, and 128 co-added scans per spectrum. These parameters were selected based on the methods described in earlier works [2 (link),14 (link),26 (link)].
4
Characterization of Graphene-Polymer Devices
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The stability of the graphene patterns on the polymer devices was tested through multiple washing, bending and peeling-off cycles. The conductivity of the devices was determined by building up a circuit and measuring resistance. The microstructure of graphene patterns and devices were characterized through scanning electron microscopy (SEM) (FEI Quanta 250 FE-SEM), x-ray photoelectron spectroscopy (XPS) (Amicus XPS) and Raman spectroscopy (Bruker FT-Raman Spectrometer) analysis. SEM samples were sputter coated with 2 nm iridium before the analysis and images were taken using secondary electron mode. Monochromatic Al Kα X-ray source (1486.6 eV) was used in XPS analysis with an electron take-off angle 45° from a normal sampling surface. Survey scans were collected from 10 eV to 1100 eV with a pass energy of 187.85 eV. Raman spectra were collected with a backscattering geometry, 1064 nm Nd:YAG laser and a spot size of about 1 mm.
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