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H 9000

Manufactured by Hitachi
Sourced in Japan

The H-9000 is a high-performance laboratory equipment manufactured by Hitachi. It is designed to provide precise and reliable measurements for a variety of scientific applications. The core function of the H-9000 is to serve as an analytical instrument, with the capability to perform various types of analysis and data processing tasks.

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7 protocols using h 9000

1

Characterization of Thin Film Materials

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UV-visible absorption spectra were measured in the range from 200 to 500 nm on a TU-1901 Double beam UV-vis spectrophotometer with slit width of 5.0 nm. The fluorescence spectra were performed on F-4600 Fluorospectrophotometer. The fluorescence decays measurements of OMFs were recorded by using an Edinburgh Instruments' Steady and transient time-resolved fluorescence spectrometer. X-ray diffraction patterns were recorded using a Rigaku 2500 VB2+PC diffractometer under the conditions: 40 kV, 50 mA. The morphology of thin films was investigated by using a scanning electron microscope (SEMHitachi S-3500), and the accelerating voltage applied was 20 kV. The morphology of layered double hydroxides was investigated by using a transmission electron microscope (Hitachi H9000).
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2

Transmission Electron Microscopy of Autophagosomes

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Autophagosomes were observed using TEM. The cells were fixed in 2.5% glutaraldehyde (pH 7.3–7.4) at 4 °C overnight and treated with 1% osmium tetroxide for 2 h. Then, the samples were dehydrated in ethanol (30%, 50%, 70%, 80%, 90%, and 95%) and pure acetone, embedded, cut into 90 nm sections, and stained with 3% uranyl acetate and lead citrate. TEM visualizations were performed using a Hitachi H-9000 transmission electron microscope at 300 kV, and images were captured using a slow-scan CCD camera.
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3

Characterization of PVDF/CNT Composite Fibers

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A digital camera, an optical microscope (SMZ-168), and a scanning electron microscope (SEM; JEOL JSM-6390) were used to observe morphologies of the ES fibers. All samples are coated with an evaporated gold thin film before SEM imaging to ensure higher conductivity. The PVDF/CNT fibers were characterized by a transmission electron microscope (TEM; HITACHI H-9000), and Fourier transform infrared spectroscopy (FTIR) using a Thermo Scientific Nicolet iN10 spectrometer and absorbance data were processed for the wave number range 700–1000 cm−1. A mechanical test system (Agilent T150 UTM) and a set of an electrical measurement system (Keithley 6220 and Vitech triple output DC power supply) were used to measure the mechanical and electrical properties of the fiber bundles and ropes, separately.
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4

Characterization of Electrospun Fibers

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To study the surface morphology and the size of electrospun fibers, a scanning electron microscope (SEM; JEOL JSM-6390, JEOL Ltd., Akishima-shi, Japan) and a transmission electron microscope (TEM; HITACHI H-9000, Hitachi, Ltd., Chiyoda-ku, Japan) were used. The crystalline phase or phases present in the composited fibers were identified by Fourier transform infrared (FTIR) spectroscopy using a Thermo Scientific Nicolet iN10 spectrometer (Thermo Fisher Scientific, Waltham, MA, USA), and absorbance data were processed for the wave number ranging from 600 to 1,600 cm-1. The X-ray diffraction patterns were recorded by a Bruker D8 Advance X-ray diffractometer (XRD; Bruker AXS, Inc., Madison, WI, USA). An electronic tensile testing machine (Jinan Hengrui machine Co. Ltd., Jinan, China) was used for the mechanical characterization of aligned electrospun fibrous membranes, and the electrical properties of the fibers were tested using a Keithley 6485 high-resistance meter system (Keithley Instruments, Inc., Cleveland, OH, USA).
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5

Transmission Electron Microscopy of Larval CNS

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CNS was dissected from a third instar larva in 1xPBS, fixed in 2.5% glutaraldehyde/2% formaldehyde/0.1 M phosphate buffer (pH 7.4) for 2 h at 4 °C, and washed with 0.1 M phosphate buffer for five times of 10 min at 4 °C. Then it was treated with 1% OsO4/0.1 M phosphate buffer for 1 h at 4 °C. The fixed CNSs were dehydrated through a graded ethanol series and embedded in epoxy resin. Ultrathin sections were stained with uranyl acetate and lead citrate. Data acquisition was performed with a transmission electron microscope (H-9000; Hitachi, Tokyo, Japan) at 24 °C.
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6

Ultrastructural Analysis of Brain Tissue

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Electron microscopic observation was performed basically following the method described previously [8 ]. After deparaffinization and rehydration, tissues were washed with PBS three time, fixed in 2.5% glutaraldehyde/0.1 M phosphate buffer (PB) (pH7.4), and treated with 1% OsO4/0.1 M PB for 2 h. Fixed tissues were dehydrated through a graded ethanol series and embedded in epoxyresin. Ultrathin sections were stained with uranyl acetate and lead citrate. Data acquisition was performed with a transmission electron microscope (H-9000, H7600 or H-7100, Hitachi, Tokyo, Japan).
Regarding human brain samples, frontal cortex were fixed in 2.5% glutaraldehyde/0.1 M cacodylate buffer for 2 h and treated with 1% OsO4/0.1 M cacodylate buffer between 90 min and 2 h, within 5 h after death.
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7

Nanomaterial Characterization Methods

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Powder X-ray diffraction (XRD) profiles were obtained using a D/max22500PC of Japanese Science and Technology with Cu Kα (λ = 0.154 nm) radiation as the incident beam. Transmission electron microscopy (TEM) was performed on a Hitachi H-9000 instrument operating at 300 kV. Scanning electron microscopy (SEM) was performed on JEOL JSM-6060S and JSM-6700F instruments. XPS profiles were obtained using Phi-5000 VersaProbe of America.
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