Ssx 550 microscope

On a SHIMADZU SSX-550 microscope (SHIMADZU, Kyoto, Japan), scanning electron microscopy tests were carried out. At 77 K, nitrogen adsorption/desorption isotherms were measured using a Micromeritics ASAP 2020 adsorption analyzer (Micromeritics, Norcross, GA, USA). The specific surface area (SSA) was determined using the Brunauer–Emmett–Teller method [23 (link)]. Non-local density functional theory (NLDFT) was used to determine the pore size distribution [24 (link)]. The KBr tablet approach was used to obtain Fourier transform infrared (FT-IR) patterns with a resolution of 1 cm⁻¹ between 400 and 6000 cm⁻¹ using a Bruker IFS 66V/S spectrometer (Bruker, Hamburg, Germany). A Bruker D8 diffractometer (Bruker), with a Cu-K X-ray source, was used to measure the powder X-ray diffraction (XRD) pattern. An inVia Raman spectrometer (Renishaw 2000, Renishaw, Gloucestershire, UK), with a laser wavelength of 488 nm, was used to analyze the Raman properties of the carbon sample. X-ray photoelectron spectra were measured on a Thermo Escalab 250 electron energy spectrometer (Thermo Fisher, Waltham, MA, USA).

Scanning electron microscopy (SEM) experiments were performed on a SHIMADZU SSX-550 microscope (Shimadzu, Kyoto, Japan). Fourier transform infrared (FT-IR) patterns were obtained using a Bruker IFS 66V/S spectrometer (Bruker, Hamburg, Germany) with the KBr tablet method at a resolution of 1 cm⁻¹ between 400 and 6000 cm⁻¹. XRD pattern was measured using a Bruker D8 (Bruker, Hamburg, Germany) diffractometer with Cu-Kα X-ray source. The specific surface area calculated on the basis of the Brunauer–Emmett–Teller (BET) theory and the pore size distribution analyzed with the non-local density functional theory (NLDFT) were measured using N₂ adsorption–desorption measurements (ASAP 2020, Micromeritics, Norcross, GA, USA). The samples were degassed at 180 °C for 12 h under vacuum before the measurement, and the data were recorded at liquid nitrogen temperature. The surface chemistry was analyzed by X-ray photoelectron spectroscopy (XPS, Escalab 250, Thermo Fisher, Waltham, MA, USA) equipped with Mg-Kα X-ray source. Raman study of the carbon material was carried out using an inVia Raman spectrometer (Renishaw, Gloucestershire, UK) with the laser wavelength of 488 nm. The concentrations of the dye solutions were determined using an Agilent Cary 300 UV-Vis spectrophotometer (Agilent, Palo Alto, CA, USA).

Product characterization in powder form used: powder X-ray diffraction (XRD) in a Shimadzu XRD-6000 (Kyoto, Japan); scanning electron microscopy (SEM) in a Shimadzu SSX-550 microscope (Kyoto, Japan); and Fourier transform infrared spectroscopy (FT-IR) in a Thermo Scientific Smart OMNI-Sampler Nicolet iS10 FT-IR Spectrometer (Massachusetts, USA). Compounds were also restituted and analyzed by FT-IR, transillumination in Gel logic 200 Kodak (New York, USA) and fluorescence microscopy in a ZEISS Observer Z.1 Apo Tome microscope (Oberkochen, Germany).
The XRD used CuKα with 30 kV voltage and 30 mA current, a Ni filter and data collected in a 2θ range between 3-40 degrees. For SEM, samples were previously coated in gold with a metallizer with a 10 mA current for 5 minutes. FT-IR used attenuated total reflectance (ATR) with a wavenumber range between 4000 and 750 cm^-1. For fluorescence microscopy, samples were fixed in slides using ethanol. Transillumination used a wavelength of 306 nm, and powders were restituted in their respective solvents. Because of the maintenance of powders’ characteristics, fluorescence microscopy analyses and FT-IR of restituted powders SbQ-R was used as a model.