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Quanta feg 250 model

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Quanta FEG 250 is a field emission scanning electron microscope (FESEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a high-brightness Schottky field emission gun, which provides high-resolution imaging capabilities. The microscope is equipped with advanced detectors and analytical tools to enable detailed examination of surface topography, composition, and other material properties.

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10 protocols using quanta feg 250 model

1

Morphological and Thermal Analysis of Functionalized Cellulose

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The surface morphologies of cellulose, GMA-grafted cellulose, and
cellulose-based adsorbent containing NMDG functional groups were analyzed
via SEM (FEI QUANTA 250 FEG model) analysis. To observe the changes
that occurred in the bond structures of raw cellulose, grafted cellulose,
and NMDG functionalized cellulose, we recorded IR spectra in the range
of 4000–400 cm–1 with a PerkinElmer UATR-FT-IR
device at 4 cm–1 resolution and 20 scans per sample.
Thermogravimetric analysis (Shimadzu, TGA-51) was used to determine
the thermal stability of samples by heating them at 5 °C/min
through nitrogen gas between 30 and 1000 °C.
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2

Potentiometric Measurements and Thermal Expansion of Glass-Ceramic Composites

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All potentiometric measurements were performed in stirred solutions at room temperature (25 °C) with an eight-channel electrode-computer interface (Nico2000 Ltd, UK) controlled by Nico-2000 software. A free flow single-junction Ag/AgCl reference electrode purchased from Thermo-Fisher (USA) was used as an external reference electrode. The pH measurements were performed using EDWA (Romania) combined glass electrode. Thermal expansion coefficients were measured using optical dilatometry (Misura® HSM ODHT 1400, Italy). Milling was performed using laboratory fast mill Mod Speedy from Nannetti (Italy). All impedance measurements were performed using an interface-1000 electrochemical workstation from Gamry (USA). The impedance of the porous frits was determined by impedance spectroscopy using two-electrode system measurement using Gamry-1000 potentiostat (USA). Morphological analysis of the prepared glass–ceramic composite-based frits was performed using a field emission scanning electron microscope (FESEM) (FEI Quanta 250 FEG model).
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3

Characterization of rGO/CNF Composite Films

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Functional groups of the rGO/CNF inks were
analyzed using Fourier
transform infrared (FTIR) spectroscopy (IRAffinity-1, Shimadzu, Japan).
The X-ray diffraction (XRD) spectra of the rGO/CNF films were measured
using an X-ray diffractometer (PANalytical- X’Pert3 Powder) with reference target: Cu Kα radiation; voltage, 35
kV; current, 30 mA. Morphological study of the deposited films was
conducted by using both optical and field emission scanning electron
microscopy (SEM). Optical images were taken with a KEYENCE, VHX-7000,
and ZEISS OLYMPUS BX53M. SEM images were taken using FEI Quanta 250
FEG model working in the secondary electron mode at an accelerating
voltage of 20 kV. Hydrophilicity of the films was analyzed by water
contact angle using the sessile drop method (Kruss-DSA25).
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4

Surface Roughness Effect on Corrosion Resistance

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All the samples used in the following tests were cut from the workpiece bar and treated by ultrasonic cleaning in acetone. According to the requirement of each test, the rough grinding, fine grinding, and polishing treatments were chosen for the corresponding surfaces of samples.
The microhardness value was the mean of three measurements under a load of 100 g for 10 s using a digital microhardness tester (Model HV-1000, Precision Meter (Dongguan) Co., Ltd., Dongguan, China). To visually demonstrate the effect of surface roughness on the corrosion resistance of 42CrMo4 steel, the surface topographies of samples obtained in Experiments #5 and #6 were observed with a 3D surface profiler (Model MicroXAM, KLA Corporation, Milpitas, CA, USA). The microstructures were investigated by a metallurgical microscope (Model DMI8C, Leica Microsystems Inc., Buffalo Grove, IL, USA) and a scanning electron microscope (SEM) (Model Quanta 250 FEG, FEI Company, Hillsboro, OR, USA), respectively.
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5

Surface Morphology Characterization by SEM

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The morphology of the surfaces was examined using non-destructive environmental scanning electron microscopy (Model Quanta 250 FEG, FEI company, Eindhoven, The Netherlands) with 200× magnification [39 (link),40 (link)]. Disc specimens were obtained from a stainless-steel mold (10 mm diameter × 2 mm height) [41 (link)]. The same specimens were then used for the surface roughness test using the SEM micrograph [42 (link),43 (link),44 (link)]. SEM images were converted into 3rd dimension images by imaging analysis system Scandium Solution Height (Olympus soft imaging solutions, GMBH, Muenster, Germany). The average surface roughness values of each specimen (Ra) were recorded.
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6

Morphological Analysis of Novel Lipid Formulations

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The external morphological structure for pure LMG, Aeroperl® 300, their PM, and the optimized S-SNEDDS was done using SEM (SEM, Model Quanta 250 FEG, FEI Company, Eindhoven, Netherlands) attached with EDX unit (Energy Dispersive X-ray Analyses), with accelerating voltage 30 kV.49 (link)
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7

Multimodal Characterization of Lindgrenite Nanocrystals

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The X-ray diffraction pattern of the sample was carried out by a Bruker diffractometer, D2Phaser model, using the copper anode as a source of radiation [λ(CuKα = 0.154184 nm] in the range 2θ from 5° to 100° with step size, current, and tension of 0.020°, 30 mA, and 40 kV, respectively.
We collected the Vibrational Raman spectrum of the sample using a Bruker confocal Raman spectrometer, SENTERRA model, in the range between 85 and 1100 cm−1, exciting the sample using a red laser (λ = 785 nm) with output power, resolution, and integration time of 0.5 mW, 4 cm−1, and 10 s−1, respectively. We could observe the active vibrational modes in the infrared region (IR).
The lindgrenite nanocrystals' morphology was examinated by Field Emission Electron Microscopy (FE-SEM) operating an FEI Company microscope, Quanta FEG 250 model at different magnifications. Initially, 10 mg of sample was added into the Eppendorf (2 mL capacity) together with 1.5 mL of acetone and dispersed by ultrasonic radiation for 3 min. The suspension obtained was placed drop-by-drop onto the aluminium stub substrates and dried at 303 K for 30 min.
The nitrogen adsorption/desorption isotherms was performed using a Quantachrome device (Autosorb iQ Station 1) at 77.35 K, using 0.0195 g of sample, and initial treatment using final Outgas at 453 K for 6 h.
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8

Lyophilized Gel Imaging Using SEM

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The micrographs of lyophilized gels were performed on the field emission scanning electron microscope (SEM) with field emission gun, FEI brand, Quanta FEG 250 model, with acceleration voltage from 1 to 30 kV, equipped with Ametek SDD (Silicon drift detectors) EDS, model HX-1001, Apollo X-SDD detector (FEI Company, Eindhoven, The Netherlands). Samples were fixed on double-sided carbon tape, grounded with silver adhesive paint and covered with Quorum model Q150R Aunametalizer (Laughton, East Sussex, UK) for 30 s at 20 mA by plasma generated in argon atmosphere.
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9

Morphological Characterization of NFs and CNFs

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The morphologies of MoSe2, MoSe2/PPy, Co/MoSe2, and Co/MoSe2/PPy NFs and their CNFs were investigated by scanning electron microscopy (SEM) with a FEI Quanta FEG 250 Model (USA) and high-resolution transmission electron microscopy (HRTEM) with a JEOL-2100 operated at 200 kV. To determine the valence state of the elements of the NFs and CNFs, X-ray photoelectron spectroscopy (XPS) measurements were implemented by NEXSA-G2, monochromated high-performance XPS spectrometer (Thermo Fisher Scientific, UK) with a monochromatic Al Kα (1486.68 eV) X-ray source.
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10

Analytical Characterization of Mushroom Samples

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All chemicals which were analytical grade provided from Sigma‐Aldrich Co. LLC. In each stage, deionized purity water was used. Absorbents were measured using a SHIMADZU the UVM‐1240 UV–Visible spectrophotometer (Shimadzu Corp., Kyoto, Japan manufactures) with a pair of identical quartz cuvette of 1 cm thickness at 517 nm. FEI brand, Quanta FEG 250 model scanning electron microscope (SEM) was used for morphology studies of mushroom specimens.
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