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Jem 2100 analytical electron microscope

Manufactured by JEOL
Sourced in Japan, France

The JEM-2100 is an analytical electron microscope (AEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analytical capabilities for the study of materials at the nanoscale. The JEM-2100 utilizes an electron beam to generate images and perform elemental analysis of specimens, enabling users to investigate the structure and composition of a wide range of materials.

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2 protocols using jem 2100 analytical electron microscope

1

Comprehensive Characterization of Graphene Nanoribbons

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The morphology of the as-prepared pGNR@MSN was characterized employing high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and high-resolution transmission electron microscopy (HRTEM) using a JEM-2100 analytical electron microscope (JEOL Ltd., Tokyo, Japan). The crystal structure of the GNRs was measured using X-ray diffraction (XRD; X'Pert PRO MPD, Hol-land Panalytical) with a monochromatic X-ray beam and nickel-filtered Cu Ka radiation and the Fourier transform infrared (FT-IR) spectra of the pGNR@MSN were recorded using a FT-IR spectrometer (Nicolet IS50-Continuum; Thermo Fisher Scientific, Waltham, MA, USA). In addition, the N2 adsorption–desorption isothermal curve was recorded using the TriStar II 3020 system (Micromeritics, USA), and the zeta potential and particle size of the nanoparticles were determined using a Zetasizer Nano ZS90 analyzer (Malvern Panalytical, Malvern, Netherland).
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2

Electrochemical Detection of Sulfadiazine

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The samples were characterized by Fourier transform infrared spectroscopy (FT-IR) using a Perkin Elmer 1600 FTIR spectrometer (Perkin Elmer Waltham, MA, USA) and scanned over the wave number range between 400 and 4000 cm−1.
The surface morphology of the modified electrodes was characterized by the use of a ZEISS EVO MA 25 (Carl Zeiss S.A.S. Rueil-Malmaison, France) scanning electron microscope (SEM). HR-TEM images were obtained using a JEM-2100 analytical electron microscope (JEOL Europe S.A.S., Croissy-sur-Seine, France) operating at an accelerating voltage of 200 kV. For HR-TEM images, the CuNPs/MIP-OPPy composite was transferred from the electrode surface to the TEM grid.
Electrochemical measurements were carried out using an Autolab electrochemical analyzer, model PGSTAT 302N (Eco Chemie, Utrecht, The Netherlands). A three-electrode system was employed, consisting of a glassy carbon working electrode (GCE, diameter 3 mm), an Ag/AgCl/KCl(3M) electrode used as a reference electrode, and a platinum electrode used as a counter electrode. Electrochemical experiments were controlled by using Nova version 1.5 software. Cyclic voltammetry was carried out at a scan rate of 100 mV/s. For the detection of SDZ in 0.1 M H2SO4 solution, the parameters for DPV (differential pulse voltammetry) were: increment—5 mV; amplitude—50 mV; sample period—100 ms; pulse time—10 ms.
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