Jem 2100 analytical electron microscope
The JEM-2100 is an analytical electron microscope (AEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analytical capabilities for the study of materials at the nanoscale. The JEM-2100 utilizes an electron beam to generate images and perform elemental analysis of specimens, enabling users to investigate the structure and composition of a wide range of materials.
2 protocols using jem 2100 analytical electron microscope
Comprehensive Characterization of Graphene Nanoribbons
Electrochemical Detection of Sulfadiazine
The surface morphology of the modified electrodes was characterized by the use of a ZEISS EVO MA 25 (Carl Zeiss S.A.S. Rueil-Malmaison, France) scanning electron microscope (SEM). HR-TEM images were obtained using a JEM-2100 analytical electron microscope (JEOL Europe S.A.S., Croissy-sur-Seine, France) operating at an accelerating voltage of 200 kV. For HR-TEM images, the CuNPs/MIP-OPPy composite was transferred from the electrode surface to the TEM grid.
Electrochemical measurements were carried out using an Autolab electrochemical analyzer, model PGSTAT 302N (Eco Chemie, Utrecht, The Netherlands). A three-electrode system was employed, consisting of a glassy carbon working electrode (GCE, diameter 3 mm), an Ag/AgCl/KCl(3M) electrode used as a reference electrode, and a platinum electrode used as a counter electrode. Electrochemical experiments were controlled by using Nova version 1.5 software. Cyclic voltammetry was carried out at a scan rate of 100 mV/s. For the detection of SDZ in 0.1 M H2SO4 solution, the parameters for DPV (differential pulse voltammetry) were: increment—5 mV; amplitude—50 mV; sample period—100 ms; pulse time—10 ms.
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