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Nanowizard 4a

Manufactured by Bruker
Sourced in United States

The Nanowizard 4a is an atomic force microscope (AFM) system designed for high-resolution imaging and characterization of nanoscale surfaces and structures. It provides precise control and measurement capabilities for a variety of applications in material science, life science, and nanotechnology.

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Lab products found in correlation

2 protocols using nanowizard 4a

1

Elastic Modulus Determination of MeHA Hydrogels

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To determine the elastic modulus of MeHA gels, mechanical measurements of hydrogels were performed using atomic force microscopy (AFM). Uncoated MeHA gels were fabricated by exposure to UV light as indicated and incubated in PBS for several hours before performing the AFM measurements. Mechanical measurements were performed on a JPK Nanowizard 4a AFM with a colloidal probe (sphere Ø = 3.5 μm) (CP-qp-CONT-SiO-B, NanoAndMore Corp., USA), a highly sensitive cantilever k = 0.1 N/m, and sample Poisson’s ratio of 0.5 at the UCLA Nano and Pico Characterization facility. During the measurement, hydrogels were incubated on a glass-bottom dish with prewarmed PBS and set on a temperature-controlled stage at 37°C. The force-distance curves were recorded, and the elastic modulus of hydrogels was calculated by NanoScope Analysis using the Hertz model.
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2

Measuring Fibrin Gel Compressive Modulus

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To analyze compressive modulus at a micro scale, 30 uL fibrin gels were fabricated as drops in 35-mm dishes and submerged in PBS. AFM indentation experiments were performed with a NanoWizard 4a (JPK Instruments) using a cantilever with a nominal spring constant of 0.03 N/m and a pyramidal tip (MLCT-D, Bruker AFM Probes). The dishes were maintained at 37°C during force measurements. Force curves were recorded from three separate regions on the surface of each hydrogel. At each region, 36 force curves were measured across a 100um2 area for a total of 108 measurements per gel. The data was analyzed using JPK image processing software. Young’s modulus was calculated using the Hertz model of fit on the extend curve, and data is represented as mean +/- standard deviation.
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