Powder X-ray diffraction (PXRD) patterns were collected on Rigaku SmartLab SE (Rigaku Corporation, Wilmington, MA, USA) (3 kW sealed X-ray tube; D/teX Ultra 250 silicon strip detector; vertical type θ-θ geometry; HyPix-400 (2D HPAD) detector in the 2θ range between 3° and 110° with a step interval of 0.02°). The LeBail decomposition was applied using the JANA2006 software [22 (link)]. The crystal structure was successfully refined by the Rietveld method using JANA2006 software [22 (link)]. Illustrations were created with DIAMOND [23 ] software.
Smartlab se
Manufactured by Rigaku
Sourced in Japan, United States
The SmartLab SE is a fully automated X-ray diffractometer designed for advanced materials analysis. It features a high-precision goniometer and a wide range of accessories to support various X-ray diffraction techniques. The core function of the SmartLab SE is to provide accurate and reliable data for the characterization of crystalline materials.
Automatically generated - may contain errors
Lab products found in correlation
S 4800, by Hitachi (5 mentions)
Jem 2100, by JEOL (4 mentions)
Su8100, by Hitachi (3 mentions)
Escalab 250xi, by Thermo Fisher Scientific (3 mentions)
Talos f200x, by Thermo Fisher Scientific (3 mentions)
Nicolet is50, by Thermo Fisher Scientific (3 mentions)
Asap 2460, by Micromeritics (3 mentions)
Cary 5000, by Agilent Technologies (2 mentions)
Smartlab studio 2, by Rigaku (2 mentions)
Zev3600, by Malvern Panalytical (2 mentions)
K alpha, by Thermo Fisher Scientific (2 mentions)
Nano zs90, by Malvern Panalytical (2 mentions)
Mira lms, by TESCAN (2 mentions)
Hypix 400 2d hpad detector, by Rigaku (2 mentions)
Labram hr800, by Horiba (2 mentions)
Titan g2 60 300, by Thermo Fisher Scientific (2 mentions)
Jsm 7900f, by JEOL (2 mentions)
X pert pro, by Malvern Panalytical (2 mentions)
Gemini 300, by Zeiss (2 mentions)
Nicolet is10, by Thermo Fisher Scientific (2 mentions)
96 protocols using smartlab se
1
Powder X-ray Diffraction Analysis
2
Rietveld Refinement of Ti(Si2O5(OH))(OH)
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For the Rietveld refinement, PXRD patterns were collected on Rigaku SmartLab SE (Rigaku Corporation, Tokyo, Japan) 3 kW sealed X-ray tube, D/teX Ultra 250 silicon strip detector, vertical type θ-θ geometry, HyPix-400 (2D HPAD) detector. PXRD data were collected at room temperature in the 2θ range between 3° and 120° with a step interval of 0.02°. Rietveld refinement was performed on the powder diffraction patterns. The structure models of Ti(Si2O5(OH))(OH) were used as starting models, obtained from SCXRD (without H atoms), in the refinement utilizing RietveldToTensor software (v1.1) [1 ].
3
Characterizing Dual-Mode Thermal Device
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The reflective spectra of the dual-mode device in heating and cooling modes were measured by using an ultraviolet-visible near-infrared spectrophotometer (Cary 5000, Agilent) with a calibrated integrating sphere and a Fourier transform infrared spectrometer (Frontier Optica, Perkin Elmer) with an integrating sphere (MCT Mid-IR Integrated Sphere, Pike). The absorptivity/emissivity (α/ε) was calculated using 100% reflectivity (0% transmissivity determined by Al foil). Temperature-dependent XRD data were measured by X-ray powder diffraction instrument (Smart Lab SE, Rigaku) with a homemade proportional-integral-derivative (PID) temperature control setup. Optical and infrared images were captured by an optical camera (FDR-AXP55, Sony) and an infrared camera, respectively.
4
Phase Composition of Immobilized Catalysts
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The phase composition of immobilized catalysts before and after use was studied by XRD analysis using a Rigaku SmartLab SE X-ray powder diffractometer with Cu Kα radiation (λ = 0.154 nm) for phase identification. Full pattern identification was carried out by a SmartLab Studio II software package, version 4.2.44.0 by Rigaku Corporation (Tokyo, Japan). Materials identification and analysis were performed by the ICDD base PDF-2 Release 2019 (Powder Diffraction File, ver. 2.1901). XRD patterns were obtained using 40 kV, 30mA by Θ/2Θ (Bragg-Brentano geometry) in the 2Θ range of 10–90° (step size 0.03° and speed 4°/min). The XRD measurements were performed for both freshly synthesized and used matrices, when the latter were separated from the reaction mixture and dried.
5
Electrochemical Characterization of Synthesized Compound
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All electrochemical experiments were performed on an electrochemical
workstation (CHI 6095E Instruments Austin, TX) with a conventional
three-electrode system, in which the paraffin-impregnated graphite
electrode (PIGE) was used as the working electrode, a platinum electrode
was employed as the counter electrode, and a saturated calomel electrode
(SCE) was used as the reference electrode. For the impedance study,
the applied potential was 0.3 V and was recorded with an amplitude
of 5 mV over the frequency range of 0.1 Hz to 100 kHz. All electrochemical
studies were carried out at room temperature (25 °C). The synthesized
compound was characterized by SEM, UV–vis, FT-IR, TGA and DTA,
XRD, and XPS techniques. SEM was recorded with a Quattro S Instrument,
ThermoFisher Scientific; FT-IR spectra were recorded with an AGILENT
Instrument; UV–vis spectra were recorded with a JAZ, Ocean
optics; TGA–DTA curves were recorded with a FTA2500 Instrument,
Netzsch; XRD spectra were recorded with a SmartLab SE X-Ray Instruments,
Rigaku; and XPS spectra were recorded with a ULVAC-PHI Versaprobe-II.
The details of the antibacterial studies are given below.
workstation (CHI 6095E Instruments Austin, TX) with a conventional
three-electrode system, in which the paraffin-impregnated graphite
electrode (PIGE) was used as the working electrode, a platinum electrode
was employed as the counter electrode, and a saturated calomel electrode
(SCE) was used as the reference electrode. For the impedance study,
the applied potential was 0.3 V and was recorded with an amplitude
of 5 mV over the frequency range of 0.1 Hz to 100 kHz. All electrochemical
studies were carried out at room temperature (25 °C). The synthesized
compound was characterized by SEM, UV–vis, FT-IR, TGA and DTA,
XRD, and XPS techniques. SEM was recorded with a Quattro S Instrument,
ThermoFisher Scientific; FT-IR spectra were recorded with an AGILENT
Instrument; UV–vis spectra were recorded with a JAZ, Ocean
optics; TGA–DTA curves were recorded with a FTA2500 Instrument,
Netzsch; XRD spectra were recorded with a SmartLab SE X-Ray Instruments,
Rigaku; and XPS spectra were recorded with a ULVAC-PHI Versaprobe-II.
The details of the antibacterial studies are given below.
6
Characterization of Co-sputtered ScSZ Thin Films
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The structural characteristics of the co-sputtered ScSZ films were determined with an X-ray powder diffractometer (SmartLab SE, Rigaku, Tokyo, Japan) with Cu-Kα radiation (λ = 1.5460 Å). The XRD patterns were registered in 2θ geometry (angle of incidence 3°) in the range of 20–80° with a step of 0.03° and a rate of 0.5°/min. The phase analysis was performed using SmartLab Studio II ver. 4.2.44.0, using the Rietveld Refinement method in the 20–70° range. The crystallite size and lattice parameter were calculated using the Comprehensive Analysis module and the Halder–Wagner modeling method. The films’ thickness, surface morphology, and chemical composition were revealed with scanning electron microscopy (SEM) MAIA3 (TESCAN, Brno, Czech Republic) equipped with an X-ray energy dispersive spectrometer (EDS) X-MaxN (Oxford Instruments, Abingdon, UK). Auger Electron Spectroscopy (AES) EG3000, CMA2000 (LK Technologies, Maple Heights, OH, USA) was applied in conjunction with argon remote plasma treatment to estimate the surface stoichiometry of the ScSZ films. The specific masses of the deposited films were evaluated via the gravimetric method [46 ] with the analytical balance BM-5 (A&D Company Limited, Tokyo, Japan).
7
Characterization of Cu-based Nanostructures
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The morphology of Cu-based NMs was assessed by scanning electron microscope (SEM; Hitachi SU8100, Shenzhen, China) and transmission electron microscopy (TEM; JEM2001f, Zhangzhou, China ). The Malvern ZEV3600 (Chongqing, China) was used to measure the size distribution and Zeta potential of Cu2O NPs, Cu NRs and Cu NWs. Pwder X-ray diffraction (XRD) patterns (Cu Kα) were recorded by Rigaku Smartlab SE (Shenzhen, China) and scanned at a step of 1° (2θ) in a range from 20° to 80°. X-Ray photoelectron spectroscopy (XPS) measurements were conducted by an Thermo Fisher Scientific K-Alpha (Shenzhen, China) instrument with Al Kα radiation.
8
Characterization of Sonicated ZnO Nanoparticles
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ZnO NPs were dissolved in ultrapure water at a concentration of 1 mg/ml, and treated under 200 W ultrasonic treatment for different times (2, 5, 10 min). The obtained solutions were captured and dispersions of ZnO NPs were observed under scanning electron microscope (SEM) and evaluated with Zetasizer nano ZS. Transmission electron microscope (TEM) was also performed to further confirm the ZnO NPs morphology. The X-ray diffraction (XRD) pattern of ZnO NPs was further analyzed by X-ray powder diffractometer (Rigaku SmartLab SE), scanning from 5° to 90° at a scan rate of 2°/min.
9
Comprehensive Structural Characterization of Samples
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The crystalline phase of the samples was determined by X-ray diffraction (XRD, Rigaku/SmartLab SE), which was referred to International Centre for Diffraction Data (ICDD).
The morphology was detected by scanning electron microscopy (SEM, ThermoFisher/Apreo S HiVac). The specific surface area, pore volume and pore diameter distribution were measured by N2 adsorption-desorption isotherms at -196 °C using Micromeritics Tristar 3020. The specific surface area was calculated by using BET method according to nitrogen adsorption data in the relative pressure (P/P0) range of 0.05-0.30. Sulfur, carbon and oxygen species in the samples were determined by X-ray photoelectron spectroscopy (XPS, AXIS SUPRA+) and Fourier transform infrared (FT-IR) spectra on a Bruker Tensor II spectrometer.
The morphology was detected by scanning electron microscopy (SEM, ThermoFisher/Apreo S HiVac). The specific surface area, pore volume and pore diameter distribution were measured by N2 adsorption-desorption isotherms at -196 °C using Micromeritics Tristar 3020. The specific surface area was calculated by using BET method according to nitrogen adsorption data in the relative pressure (P/P0) range of 0.05-0.30. Sulfur, carbon and oxygen species in the samples were determined by X-ray photoelectron spectroscopy (XPS, AXIS SUPRA+) and Fourier transform infrared (FT-IR) spectra on a Bruker Tensor II spectrometer.
10
Synthesized Silver Nanoparticles Characterization
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In the present study, the synthesized silver nanoparticles from aqueous leaf extract of R. apiculata were subjected to XRD analysis (Smart Lab SE, Rigaku, Tokyo, Japan) to determine the nature and average size of the nanoparticles [23 (link)].
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