Crossbeam 340
The Crossbeam 340 is a versatile scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a field emission gun source, advanced detectors, and a high-precision sample stage for superior image quality and analytical capabilities. The Crossbeam 340 is suitable for various applications, including materials science, nanotechnology, and industrial research.
Lab products found in correlation
57 protocols using crossbeam 340
Comprehensive Membrane Characterization
Structural and Chemical Analysis of Enamel
Fabrication and Characterization of BETA Scaffold
Hydrogel Micromorphology Analysis
Confocal and Electron Microscopy of Cell-Scaffold Interactions
For scanning electron microscopy, a Zeiss Crossbeam 340 scanning electron microscope (Carl Zeiss Microscopy GmbH, Oberkochen, Germany) was used. Aligned microfibers were washed with PBS and incubated in 6% glutaraldehyde (Sigma-Aldrich, Schnelldorf, Germany) for 15 min. After a washing step in ice-cold PBS, the samples were dehydrated by increasing concentrations of ethanol from 50 to 100%. The samples were incubated in hexamethyldisilazane (Sigma-Aldrich, Schnelldorf, Germany) for 15 min and dried overnight. All samples were sputter-coated with a 4 nm layer of platinum with a Leica EM ACE600 (Leica Microsystems, Wetzlar, Germany) before imaging.
Quantitative Bone Mineral Density Imaging
Scanning Electron Microscopy of Cells
One-piece zirconia implant evaluation
Characterization of Laser-Induced Spalling in Metallic Glasses
Characterization of TPU and TPU/NS Membranes
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